74F40

74F40 PHILIPS | Alldatasheet

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Philips Semiconductors FAST Products Product specification 74F40Dual 4-input NAND buffer 1April 11, 1989 853–0053 96314 TYPE TYPICAL PROPAGATION DELAY TYPICAL SUPPLY CURRENT (TOTAL) 74F40 3.5ns 6mA

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DESCRIPTION COMMERCIAL RANGE VCC = 5V ±10%, Tamb = 0°C to +70°C 14-pin plastic DIP N74F40N 14-pin plastic SO N74F40D PIN CONFIGURATION GND VCC D1b D1a Q 1 NC D1d D1c D0a D0b Q 0 NC D0c D0d SF00065 INPUT AND OUTPUT LOADING AND FAN OUT TABLE PINS DESCRIPTION 74F (U.L.) HIGH/LOW LOAD VALUE HIGH/LOW Dna, Dnb, Dnc, Dnd Data inputs 1.0/2.0 20µA/1.2mA Q 0, Q1 Data outputs 750/106.7 15mA/64mA NOTE: One (1.0) FAST unit load is defined as: 20µA in the High state and 0.6mA in the Low state. LOGIC DIAGRAM VCC = Pin 14 GND = Pin 7 NC = Pin 3, 11 SF00081 Q 0 D0a D0b D0c D0d Q 1 D1a D1b D1c D1d FUNCTION TABLE INPUTS OUTPUT Dna Dnb Dnc Dnd Q n L X X X H X L X X H X X L X H X X X X H H H H H L NOTES: 1. H = High voltage level 2. L = Low voltage level 3. X = Don’t care LOGIC SYMBOL D1a D1bD0a D0b D0c D1c D1dD0d Q0 Q1 6 8 1 2 4 5 9 10 12 13 VCC = Pin 14 GND = Pin 7 NC = Pin 3, 11 SF00082 IEC/IEEE SYMBOL SF00083

Philips Semiconductors FAST Products Product specification 74F40Dual 4-input NAND buffer April 11, 1989 2 ABSOLUTE MAXIMUM RATINGS (Operation beyond the limits set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the operating free-air temperature range.) SYMBOL PARAMETER RATING UNIT VCC Supply voltage –0.5 to +7.0 V VIN Input voltage –0.5 to +7.0 V IIN Input current –30 to +5 mA VOUT Voltage applied to output in High output state –0.5 to VCC V IOUT Current applied to output in Low output state 128 mA Tamb Operating free-air temperature range 0 to +70 °C Tstg Storage temperature range –65 to +150 °C RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER LIMITS UNITSYMBOL PARAMETER MIN NOM MAX UNIT VCC Supply voltage 4.5 5.0 5.5 V VIH High-level input voltage 2.0 V VIL Low-level input voltage 0.8 V IIK Input clamp current –18 mA IOH High-level output current –15 mA IOL Low-level output current 64 mA Tamb Operating free-air temperature range 0 +70 °C DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS 1 LIMITS UNITSYMBOL PARAMETER TEST CONDITIONS 1 MIN TYP 2 MAX UNIT VOH High-level output voltage VCC = MIN, VIL = MAX, VIH = MIN IOH = –1mA ±10%V CC 2.5 V VOH High-level output voltage VCC = MIN, VIL = MAX, VIH = MIN IOH = –1mA ±5%V CC 2.7 3.4 V VOH High-level output voltage VIL = MAX, VIH = MIN IOH = –15mA ±10%V CC 2.0 VVIH = MIN IOH = –15mA ±5%V CC 2.0 V VOL Low-level output voltage VCC = MIN, VIL = MAX, VIH = MIN IOL = MAX ±10%V CC 0.55 VVOL Low-level output voltage VIL = MAX, VIH = MIN IOL = MAX ±5%V CC 0.42 0.55 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltageVCC = MAX, VI = 7.0V 100 µA IIH High-level input current VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current VCC = MAX, VI = 0.5V –0.6 mA IOS Short-circuit output current3 VCC = MAX –100 –225 mA ICC Supply current (total) ICCH VCC = MAX VIN = GND 1.75 4.0 mAICC Supply current (total) ICCL VCC = MAX VIN = 4.5V 11 17 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS , the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last.

Philips Semiconductors FAST Products Product specification 74F40Dual 4-input NAND buffer April 11, 1989 3 AC ELECTRICAL CHARACTERISTICS SYMBOL PARAMETER TEST CONDITION LIMITS UNITSYMBOL PARAMETER TEST CONDITION VCC = +5.0V VCC = +5.0V ± 10% UNITSYMBOL PARAMETER TEST CONDITION Tamb = +25°C Tamb = 0°C to +70°C UNITCONDITION C L = 50pF, RL = 500Ω C L = 50pF, RL = 500Ω MIN TYP MAX MIN MAX tPLH tPHL Propagation delay Dna, Dnb, Dnc, Dnd to Qn Waveform 1 2.0 1.5 4.0 3.0 6.0 5.0 1.5 1.0 7.0 5.5 ns AC WAVEFORMS VMVM VMVM Q n Dna, Dnb, Dnc, Dnd tPHL tPLH SF00069 Waveform 1. Propagation Delay for Inverting Outputs NOTE: For all waveforms, VM = 1.5V. TEST CIRCUIT AND WAVEFORMS tw 90% VM 10% 90% VM 10% 90% VM 10% 90% VM 10% NEGATIVE PULSE POSITIVE PULSE tw AMP (V) tTHL (tf ) INPUT PULSE REQUIREMENTS rep. rate tw tTLH tTHL 1MHz 500ns 2.5ns 2.5ns Input Pulse Definition VCC family 74F D.U.T.PULSE GENERATOR R LC LR T VIN VOUT Test Circuit for Totem-Pole Outputs DEFINITIONS: R L = Load resistor; see AC electrical characteristics for value. C L = Load capacitance includes jig and probe capacitance; see AC electrical characteristics for value. R T = T ermination resistance should be equal to ZOUT of pulse generators. tTHL (tf ) tTLH (tr ) tTLH (tr ) AMP (V) amplitude 3.0V 1.5V VM SF00006