74F373 FAIRCHILD | Alldatasheet

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I Eight latches in a single package I 3-STATE outputs for bus interfacing I Guaranteed 4000V minimum ESD protection Ordering Code: Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Logic Symbols IEEE/IEC Connection Diagram Order Number Package Number Package Description 74F373SC M20B 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide 74F373SJ M20D 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74F373MSA MSA20 20-Lead Shrink Small Outline Package (SSOP), EIAJ TYPE II, 5.3mm Wide 74F373PC N20A 20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide

www.fairchildsemi.com 2 74F373 Unit Loading/Fan Out Functional Description The 74F373 contains eight D-type latches with 3-STATE output buffers. When the Latch Enable (LE) input is HIGH, data on the D n inputs enters the latches. In this condition the latches are transparent, i.e., a latch output will change state each time its D input changes. When LE is LOW, the latches store the information that was present on the D inputs a setup time preceding the HIGH-to-LOW transition of LE. The 3-STATE buffers are controlled by the Output Enable (OE ) input. When OE is LOW, the buffers are in the bi-state mode. When OE is HIGH the buffers are in the high impedance mode but this does not interfere with entering new data into the latches. Truth Table H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial Z = High Impedance State Logic Diagram Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays. Pin Names Description U.L. Input IIH/IIL HIGH/LOW Output IOH /IOL D 0–D 7 Data Inputs 1.0/1.0 20 µA/−0.6 mA LE Latch Enable Input (Active HIGH) 1.0/1.0 20 µA/−0.6 mA OE Output Enable Input (Active LOW) 1.0/1.0 20 µA/−0.6 mA O 0–O 7 3-STATE Latch Outputs 150/40 (33.3) −3 mA/24 mA (20 mA) Inputs Output LE OE D n O n HLH H HLL L LLX O n (no change) XHX Z

3 www.fairchildsemi.com 74F373 Absolute Maximum Ratings(Note 1) Recommended Operating Conditions Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs. Storage Temperature −65°C to +150°C Ambient Temperature under Bias −55°C to +125°C Junction Temperature under Bias −55°C to +150°C VCC Pin Potential to Ground Pin −0.5V to +7.0V Input Voltage (Note 2) −0.5V to +7.0V Input Current (Note 2) −30 mA to +5.0 mA Voltage Applied to Output in HIGH State (with VCC = 0V) Standard Output −0.5V to VCC 3-STATE Output −0.5V to +5.5V Current Applied to Output in LOW State (Max) twice the rated I OL (mA) ESD Last Passing Voltage (Min) 4000V Free Air Ambient Temperature 0 °C to +70°C Supply Voltage +4.5V to +5.5V Symbol Parameter Min Typ Max Units VCC Conditions VIH Input HIGH Voltage 2.0 V Recognized as a HIGH Signal VIL Input LOW Voltage 0.8 V Recognized as a LOW Signal VCD Input Clamp Diode Voltage −1.2 V Min I IN = −18 mA VOH Output HIGH 10% V CC 2.5 VM i n IOH = −1 mA Voltage 10% V CC 2.4 I OH = −3 mA 5% VCC 2.7 I OH = −1 mA 5% V CC 2.7 I OH = −3 mA VOL Output LOW Voltage 10% V CC 0.5 V Min I OL = 24 mA IIH Input HIGH 5.0 µAM a x V IN = 2.7V Current IBVI Input HIGH Current 7.0 µAM a x V IN = 7.0V Breakdown Test ICEX Output HIGH 50 µAM a x V OUT = VCCLeakage Current VID Input Leakage 4.75 V 0.0 IID = 1.9 µA Test All Other Pins Grounded IOD Output Leakage 3.75 µA0 . 0 VIOD = 150 mV Circuit Current All Other Pins Grounded IIL Input LOW Current −0.6 mA Max V IN = 0.5V IOZH Output Leakage Current 50 µAM a x V OUT = 2.7V IOZL Output Leakage Current −50 µAM a x V OUT = 0.5V IOS Output Short-Circuit Current −60 −150 mA Max V OUT = 0V IZZ Bus Drainage Test 500 µA0 . 0 V V OUT = 5.25V ICCZ Power Supply Current 38 55 mA Max V O = HIGH Z

www.fairchildsemi.com 4 74F373 AC Operating Requirements Symbol Parameter TA = +25°CT A = −55°C to +125°CT A = 0°C to +70°C Units VCC = +5.0V V CC = +5.0V V CC = +5.0V C L = 50 pF C L = 50 pF C L = 50 pF Min Typ Max Min Max Min Max ns ns ns ns Symbol Parameter TA = +25°CT A = −55°C to +125°CT A = 0°C to +70°C UnitsVCC = +5.0V V CC = +5.0V V CC = +5.0V Min Max Min Max Min Max tS(H) Setup Time, HIGH or LOW 2.0 2.0 2.0 ns tS(L) D n to LE 2.0 2.0 2.0 tH (H) Hold Time, HIGH or LOW 3.0 3.0 3.0 tH (L) D n to LE 3.0 4.0 3.0 tW (H) LE Pulse Width, HIGH 6.0 6.0 6.0 ns

5 www.fairchildsemi.com 74F373 Physical Dimensions inches (millimeters) unless otherwise noted 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide Package Number M20B

www.fairchildsemi.com 6 74F373 Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Package Number M20D

7 www.fairchildsemi.com 74F373 Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 20-Lead Shrink Small Outline Package (SSOP), EIAJ TYPE II, 5.3mm Wide

www.fairchildsemi.com 8 74F373 Octal Transparent Latch with 3-STATE Outputs Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N20A Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD ’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea- sonably expected to result in a significant injury to the user. 2. A critical component in any component of a life support device or system whose failure to perform can be rea- sonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com