74F253 FAIRCHILD | Alldatasheet

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■ Multifunction capability ■ Non-inverting 3-STATE outputs Ordering Code: Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Logic Symbols IEEE/IEC Connection Diagram Order Number Package Number Package Description 74F253SC M16A 16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow 74F253SJ M16D 16-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74F253PC N16E 16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide

www.fairchildsemi.com 2 74F253 Unit Loading/Fan Out Functional Description This device contains two identical 4-input multiplexers with 3-STATE outputs. They select two bits from four sources selected by common Select inputs (S 0, S1). The 4-input multiplexers have individual Output Enable (OEa, OEb) inputs which, when HIGH, force the outputs to a high impedance (High Z) state. This device is the logic imple- mentation of a 2-pole, 4-position switch, where the position of the switch is determined by the logic levels supplied to the two select inputs. The logic equations for the outputs are shown below: Z a = OEa • (I0a • S1 • S0 + I1a • S1 • S0 + I2a • S1 • S0 + I3a • S1 • S0) Zb = OEb • (I0b • S1 • S0 + I1b • S1 • S0 + I2b • S1 • S0 + I3b • S1 • S0) If the outputs of 3-STATE devices are tied together, all but one device must be in the high impedance state to avoid high currents that would exceed the maximum ratings. Designers should ensure that Output Enable signals to 3- STATE devices whose outputs are tied together are designed so that there is no overlap. Truth Table Address inputs S0 and S1 are common to both sections. H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial Z = High Impedance Logic Diagram Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays. Pin Names Description U.L. Input IIH/IIL HIGH/LOW Output IOH /IOL I0a–I3a Side A Data Inputs 1.0/1.0 20 µA/−0.6 mA I0b–I3b Side B Data Inputs 1.0/1.0 20 µA/−0.6 mA S0–S1 Common Select Inputs 1.0/1.0 20 µA/−0.6 mA OE a Side A Output Enable Input (Active LOW) 1.0/1.0 20 µA/−0.6 mA OE b Side B Output Enable Input (Active LOW) 1.0/1.0 20 µA/−0.6 mA Za, Zb 3-STATE Outputs 150/40(33.3) −3 mA/24 mA (20 mA) Select Data Inputs Output Output Inputs Enable S0 S1 I0 I1 I2 I3 OE Z XXXXXX H Z LLLXXX L L LLHXXX L H HLXLXX L L HLXHXX L H LHXXLX L L LHXXHX L H HHXXXL L L HHXXXH L H

3 www.fairchildsemi.com 74F253 Absolute Maximum Ratings(Note 1) Recommended Operating Conditions Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs. Storage Temperature −65°C to +150°C Ambient Temperature under Bias −55°C to +125°C Junction Temperature under Bias −55°C to +150°C VCC Pin Potential to Ground Pin −0.5V to +7.0V Input Voltage (Note 2) −0.5V to +7.0V Input Current (Note 2) −30 mA to +5.0 mA Voltage Applied to Output in HIGH State (with VCC = 0V) Standard Output −0.5V to VCC 3-STATE Output −0.5V to +5.5V Current Applied to Output in LOW State (Max) twice the rated I OL (mA) ESD Last Passing Voltage (Min) 4000V Free Air Ambient Temperature 0 °C to +70°C Supply Voltage +4.5V to +5.5V Symbol Parameter Min Typ Max Units VCC Conditions VIH Input HIGH Voltage 2.0 V Recognized as a HIGH Signal VIL Input LOW Voltage 0.8 V Recognized as a LOW Signal VCD Input Clamp Diode Voltage −1.2 V Min I IN = −18 mA VOH Output HIGH 10% V CC 2.5 VM i n IOH = −1 mA Voltage 10% V CC 2.4 I OH = −3 mA 5% VCC 2.7 I OH = −1 mA 5% V CC 2.7 I OH = −3 mA VOL Output LOW 10% V CC 0.5 V Min I OL = 24 mA Voltage IIH Input HIGH 5.0 µAM a x V IN = 2.7V Current IBVI Input HIGH Current 7.0 µAM a x V IN = 7.0V Breakdown Test ICEX Output HIGH 50 µAM a x V OUT = VCCLeakage Current VID Input Leakage 4.75 V 0.0 IID = 1.9 µA Test All Other Pins Grounded IOD Output Leakage 3.75 µA0 . 0 VIOD = 150 mV Circuit Current All Other Pins Grounded IIL Input LOW Current −0.6 mA Max V IN = 0.5V IOZH Output Leakage Current 50 µAM a x V OUT = 2.7V IOZL Output Leakage Current −50 µAM a x V OUT = 0.5V IOS Output Short-Circuit Current −60 −150 mA Max V OUT = 0V −100 −225 V OUT = 0V IZZ Bus Drainage Test 500 µA0 . 0 V V OUT = VCC ICCH Power Supply Current 11.5 16 mA Max V O = HIGH ICCL Power Supply Current 16 23 mA Max V O = LOW ICCZ Power Supply Current 16 23 mA Max V O = HIGH Z

www.fairchildsemi.com 4 74F253 Symbol Parameter TA = +25°CT A = −55°C to +125°CT A = 0°C to +70°C Units VCC = 5.0V V CC = 5.0V V CC = 5.0V C L = 50 pF C L = 50 pF C L = 50 pF Min Typ Max Min Max Min Max ns ns ns

5 www.fairchildsemi.com 74F253 Physical Dimensions inches (millimeters) unless otherwise noted 16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow Package Number M16A 16-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Package Number M16D

www.fairchildsemi.com 6 74F253 Dual 4-Input Multiplexer with 3-STATE Outputs Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N16E Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea- sonably expected to result in a significant injury to the user. 2. A critical component in any component of a life support device or system whose failure to perform can be rea- sonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com