74F133

74F133 PHILIPS | Alldatasheet

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Philips Semiconductors Products Product specification FAST 74F13313–input NAND Gate 1July 2, 1993 853-10219 FAST Products PRODUCT SPECIFICATION TYPE TYPICAL PROPAGATION DELAY TYPICAL SUPPLY CURRENT (TOTAL) 74F133 4.0ns 2.0 mA

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COMMERCIAL RANGE INDUSTRIAL RANGE DESCRIPTION VCC = 5V ±10%, VCC = 5V ±10%, Tamb = 0°C to +70°C Tamb = –40°C to +85°C 16–pin plastic DIP N74F133N I74F133N 16–pin plastic SO N74F133D I74F133D INPUT AND OUTPUT LOADNG AND FAN OUT TABLE PINS DESCRIPTION 74F (U.L.) HIGH/LOW LOAD VALUE HIGH/LOW D O - D12 Data inputs 1.0/1.0 20µA/0.6mA Q Data output 50/33 1.0mA/20mA Note to input and output loading and fan out table 1. One (1.0) FAST unit load is defined as: 20µA in the high state and 0.6mA in the low state. PIN CONFIGURA TION LOGIC SYMBOL LOGIC SYMBOL (IEEE/IEC) 8 9 VCC = Pin 16 GND = Pin 8 VCC D 12 D 11 D 10 D 9 D 8 D 7 Q D 0 D 1 D 2 D 3 D 4 D 5 D 6 GND

Philips Semiconductors Products Product specification FAST 74F13313–input NAND Gate July 2, 1993 2 LOGIC DIAGRAM VCC = Pin 16 GND = Pin 8 D 0 D 1 D 2 D 3 D 4 D 5 D 6 D 7 D 8 D 9 D 10 D 11 D 12 Q 1 2 3 4 5 6 7 10 11 12 13 14 15 FUNCTION TABLE INPUTS OUTPUT DO D1 D2 D3 D4 D5 D6 D7 D8 D9 D10 D11 D12 Q H H H H H H H H H H H H H L Any one input = L H

Philips Semiconductors Products Product specification FAST 74F13313–input NAND Gate July 2, 1993 3 ABSOLUTE MAXIMUM RATINGS (Operation beyond the limit set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the operating free air temperature range.) SYMBOL PARAMETER RATING UNIT VCC Supply voltage –0.5 to +7.0 V VIN Input voltage –0.5 to +7.0 V IIN Input current –30 to +5 mA VOUT Voltage applied to output in high output state –0.5 to VCC V IOUT Current applied to output in low output state 40 mA Tamb Operating free air temperature range Commercial range 0 to +70 °C Industrial range –40 to +85 °C Tstg Storage temperature range –65 to +150 °C RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER LIMITS UNIT MIN NOM MAX VCC Supply voltage 4.5 5.0 5.5 V VIH High–level input voltage 2.0 V VIL Low–level input voltage 0.8 V IIk Input clamp current –18 mA IOH High–level output current –1 mA IOL Low–level output current 20 mA Tamb Operating free air temperature range Commercial range 0 +70 °C Industrial range –40 +85 °C DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS 1 LIMITS UNIT MIN TYP 2 MAX VOH High-level output voltage VCC = MIN, VIL = MAX ±10%V CC 2.5 V VIH = MIN, IOH = MAX ±5%V CC 2.7 3.4 V VOL Low-level output voltage VCC = MIN, VIL = MAX ±10%V CC 0.35 0.50 V VIH = MIN, IOl = MAX ±5%V CC 0.35 0.50 V VIK Input clamp voltage VCC = MIN, II = IIK -0.73 -1.2 V II Input current at maximum input voltageVCC = MAX, VI = 7.0V 100 µA IIH High–level input current VCC = MAX, VI = 2.7V 20 µA IIL Low–level input current VCC = MAX, VI = 0.5V -0.6 mA IOS Short-circuit output current3 VCC = MAX -60 -150 mA ICC Supply current (total) ICCH VCC = MAX 1.0 2.0 mA ICCL VCC = MAX 2.5 4.0 mA NOTES: 1..For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3..Not more than one output should be shorted at a time. For testing IOS , the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last.

Philips Semiconductors Products Product specification FAST 74F13313–input NAND Gate July 2, 1993 4 AC ELECTRICAL CHARACTERISTICS LIMITS Tamb = +25°C Tamb = 0°C to +70°C Tamb = –40°C to +85°C SYMBOL PARAMETER TEST VCC = +5.0V VCC = +5.0V ± 10% VCC = +5.0V ± 10% UNIT CONDITION C L = 50pF, R L = 500Ω C L = 50pF, R L = 500Ω C L = 50pF, R L = 500Ω MIN TYP MAX MIN MAX MIN MAX tPLH tPHL Propagation delay Dn to Qn Waveform 1 2.0 2.5 4.0 4.5 7.0 7.5 1.5 2.0 7.5 8.0 1.5 2.0 7.5 8.0 ns AC WAVEFORMS VMVM VMVM Waveform 1. Propagation delay for data to output Q Dn tPHL tPLH Note to AC Waveforms 1. For all waveforms, VM = 1.5V. TEST CIRCUIT AND WAVEFORMS tw 90% VM 10% 90% VM 10% 90% VM 10% 90% VM 10% NEGATIVE PULSE POSITIVE PULSE tw AMP (V) tTHL (tf ) INPUT PULSE REQUIREMENTS rep. rate tw tTLH tTHL 1MHz 500ns 2.5ns 2.5ns Input pulse definition VCC family 74F D.U.T.PULSE GENERATOR R LC LR T VIN VOUT Test circuit for totem-pole outputs DEFINITIONS: R L = Load resistor; see AC electrical characteristics for value. C L = Load capacitance includes jig and probe capacitance; see AC electrical characteristics for value. R T = T ermination resistance should be equal to ZOUT of pulse generators. tTHL (tf ) tTLH (tr ) tTLH (tr ) AMP (V) amplitude 3.0V 1.5V vM