74F114

74F114 FAIRCHILD | Alldatasheet

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© 1999 Fairchild Semiconductor Corporation DS009474 www.fairchildsemi.com April 1988 Revised August 1999 74F114 Dual JK Negative Edge-Triggered Flip-Flop 74F114 Dual JK Negative Edge-Triggered Flip-Flop with Common Clocks and Clears General Description The 74F114 contains two high-speed JK flip-flops with common Clock and Clear inputs. Synchronous state changes are initiated by the falling edge of the clock. Trig- gering occurs at a voltage level of the clock and is not directly related to the transition time. The J and K inputs can change when the clock is in either state without affect- ing the flip-flop, provided that they are in the desired state during the recommended setup and hold times relative to the falling edge of the clock. A LOW signal on S D or CD prevents clocking and forces Q or Q HIGH, respectively. Simultaneous LOW signals on SD and CD force both Q and Q HIGH. Asynchronous Inputs: LOW input to SD sets Q to HIGH level LOW input to CD sets Q to LOW level Clear and Set are independent of Clock Simultaneous LOW on CD and SD makes both Q and Q HIGH Ordering Code: Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Logic Symbols IEEE/IEC Connection Diagram Order Number Package Number Package Description 74F114SC M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow 74F114PC N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide

www.fairchildsemi.com 2 74F114 Unit Loading/Fan Out Truth Table H (h) = HIGH Voltage Level L (h) = LOW Voltage Level X = Immaterial /c16 = HIGH-to-LOW Clock Transition Q 0 (Q0) = Before HIGH-to-LOW Transition of Clock Lower case letters indicate the state of the referenced input or output one setup time prior to the HIGH-to-LOW clock transition. Logic Diagram (one half shown) Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays. Pin Names Description U.L. Input I IH/IIL HIGH/LOW Output I OH /IOL J1, J2, K1, K2 Data Inputs 1.0/1.0 20 µA/−0.6 mA CP Clock Pulse Input (Active Falling Edge) 1.0/8.0 20 µA/−4.8 mA C D Direct Clear Input (Active LOW) 1.0/10.0 20 µA/−6.0 mA SD1 , SD2 Direct Set Inputs (Active LOW) 1.0/5.0 20 µA/−3.0 mA Q 1, Q2, Q1, Q2 Outputs 50/33.3 −1 mA/20 mA Inputs Outputs SD C D CP JKQ Q LHXXXHL HLXXXLH LLXXXHH HH /c16 hh Q 0 Q 0 HH /c16 lh L H HH /c16 hlH L HH /c16 ll Q 0 Q 0

3 www.fairchildsemi.com 74F114 Absolute Maximum Ratings(Note 1) Recommended Operating Conditions Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs. Storage Temperature −65°C to +150°C Ambient Temperature under Bias −55°C to +125°C Junction Temperature under Bias −55°C to +150°C VCC Pin Potential to Ground Pin −0.5V to +7.0V Input Voltage (Note 2) −0.5V to +7.0V Input Current (Note 2) −30 mA to +5.0 mA Voltage Applied to Output in HIGH State (with VCC = 0V) Standard Output −0.5V to VCC 3-STATE Output −0.5V to +5.5V Current Applied to Output in LOW State (Max) twice the rated I OL (mA) Free Air Ambient Temperature 0 °C to +70°C Supply Voltage +4.5V to +5.5V Symbol Parameter Min Typ Max Units VCC Conditions VIH Input HIGH Voltage 2.0 V Recognized as a HIGH Signal VIL Input LOW Voltage 0.8 V Recognized as a LOW Signal VCD Input Clamp Diode Voltage −1.2 V Min I IN = −18 mA VOH Output HIGH 10% V CC 2.5 V Min I OH = −1 mA Voltage 5% V CC 2.7 I OH = −1 mA VOL Output LOW 10% V CC 0.5 V Min I OL = 20 mA Voltage IIH Input HIGH 5.0 µAM a x V IN = 2.7V Current IBVI Input HIGH Current 7.0 µAM a x V IN = 7.0V Breakdown Test ICEX Output High 50 µAM a x V OUT = VCCLeakage Current VID Input Leakage 4.75 V 0.0 IID = 1.9 µA Test All Other Pins Grounded IOD Output Leakage 3.75 µA0 . 0 VIOD = 150 mV Circuit Current All Other Pins Grounded IIL Input LOW Current −0.6 mA Max VIN = 0.5V (Jn, Kn) −3.0 VIN = 0.5V (SDn ) −4.8 VIN = 0.5V (CP) −6.0 VIN = 0.5V (CDn ) IOS Output Short-Circuit Current −60 −150 mA Max V OUT = 0V ICCH Power Supply Current 12.0 19.0 mA Max V O = HIGH ICCL Power Supply Current 12.0 19.0 mA Max V O = LOW

www.fairchildsemi.com 4 74F114 AC Operating Requirements Symbol Parameter TA = +25°CT A = 0°C to +70°C Units VCC = +5.0V V CC = +5.0V C L = 50 pF C L = 50 pF Min Typ Max Min Max fMAX Maximum Clock Frequency 75 95 70 MHz Symbol Parameter TA = +25°CT A = 0°C to +70°C UnitsVCC = +5.0V V CC = +5.0V Min Max Min Max tS(H) Setup Time, HIGH or LOW 4.0 5.0 ns tS(L) Jn or Kn to CP 3.0 3.5 tH (H) Hold Time, HIGH or LOW 0 0 tH (L) Jn or Kn to CP 00 tW (H) CP Pulse Width 4.5 5.0 ns tW (L) HIGH or LOW 4.5 5.0 tW (L) C Dn or SDn Pulse Width, 4.5 5.0 ns LOW tREC Recovery Time 4.0 5.0 ns SDn , CDn , to CP

5 www.fairchildsemi.com 74F114 Physical Dimensions inches (millimeters) unless otherwise noted 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow Package Number M14A

www.fairchildsemi.com 6 74F114 Dual JK Negative Edge-Triggered Flip-Flop Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N14A Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea- sonably expected to result in a significant injury to the user. 2. A critical component in any component of a life support device or system whose failure to perform can be rea- sonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com