74F113 FAIRCHILD | Alldatasheet
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© 1999 Fairchild Semiconductor Corporation DS009473 www.fairchildsemi.com April 1988 Revised July 1999 74F113 Dual JK Negative Edge-Triggered Flip-Flop 74F113 Dual JK Negative Edge-Triggered Flip-Flop General Description The 74F113 offers individual J, K, Set and Clock inputs. When the clock goes HIGH the inputs are enabled and data may be entered. The logic level of the J and K inputs may be changed when the clock pulse is HIGH and the flip- flop will perform according to the Truth Table as long as minimum setup and hold times are observed. Input data is transferred to the outputs on the falling edge of the clock pulse. Asynchronous input: LOW input to S D sets Q to HIGH level Set is independent of clock Ordering Code: Devices also available in T ape and Reel. Specify by appending the suffix letter “X” to the ordering code. Logic Symbols IEEE/IEC Connection Diagram Order Number Package Number Package Description 74F113SC M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow 74F113SJ M14D 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74F113PC N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
www.fairchildsemi.com 2 74F113 Unit Loading/Fan Out Truth Table H (h) = HIGH Voltage Level L (l) = LOW Voltage level ]/c16 = HIGH-to-LOW Clock Transition X = Immaterial Q 0 (Q0) = Before HIGH-to-LOW Transition of Clock Lower case letters indicate the state of the referenced input or output prior to the HIGH-to-LOW clock transition. Logic Diagram (One Half Shown) Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays. Pin Names Description U.L. Input IIH/IIL HIGH/LOW Output IOH /IOL J1, J2, K1, K2 Data Inputs 1.0/1.0 20 µA/−0.6 mA CP 1, CP2 Clock Pulse Inputs (Active Falling Edge) 1.0/4.0 20 µA/−2.4 mA SD1 , SD2 Direct Set Inputs (Active LOW) 1.0/5.0 20 µA/−3.0 mA Q 1, Q2, Q1, Q2 Outputs 50/33.3 −1 mA/20 mA Inputs Outputs SD CP JK Q Q LX X X HL H /c16 hhQ 0 Q 0 H /c16 lh L H H /c16 hl H L H /c16 ll Q 0 Q 0
3 www.fairchildsemi.com 74F113 Absolute Maximum Ratings(Note 1) Recommended Operating Conditions Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs. Storage Temperature −65°C to +150°C Ambient Temperature under Bias −55°C to +125°C Junction Temperature under Bias −55°C to +150°C VCC Pin Potential to Ground Pin −0.5V to +7.0V Input Voltage (Note 2) −0.5V to +7.0V Input Current (Note 2) −30 mA to +5.0 mA Voltage Applied to Output in HIGH State (with VCC = 0V) Standard Output −0.5V to VCC 3-STATE Output −0.5V to +5.5V Current Applied to Output in LOW State (Max) twice the rated I OL (mA) Free Air Ambient Temperature 0 °C to +70°C Supply Voltage +4.5V to +5.5V Symbol Parameter Min Typ Max Units VCC Conditions VIH Input HIGH Voltage 2.0 V Recognized as a HIGH Signal VIL Input LOW Voltage 0.8 V Recognized as a LOW Signal VCD Input Clamp Diode Voltage −1.2 V Min I IN = −18 mA VOH Output HIGH 10% V CC 2.5 V Min I OH = −1 mA Voltage 5% V CC 2.7 I OH = −1 mA VOL Output LOW 10% V CC 0.5 V Min I OL = 20 mA Voltage IIH Input HIGH 5.0 µAM a x V IN = 2.7V Current IBVI Input HIGH Current 7.0 µAM a x V IN = 7.0V Breakdown T est ICEX Output HIGH 50 µAM a x VOUT = VCC Leakage Current VID Input Leakage 4.75 V 0.0 IID = 1.9 µA Test All Other Pins Grounded IOD Output Leakage 3.75 µA0 . 0 VIOD = 150 mV Circuit Current All Other Pins Grounded IIL Input LOW Current −0.6 V IN = 0.5V (Jn, Kn) −2.4 mA Max V IN = 0.5V (CPn) −3.0 V IN = 0.5V (SDn) IOZH Output Leakage Current 50 µAM a x V OUT = 2.7V IOZL Output Leakage Current −50 µAM a x V OUT = 0.5V IOS Output Short-Circuit Current −60 −150 mA Max V OUT = 0V ICC Power Supply Current 12 19 mA Max
www.fairchildsemi.com 4 74F113 AC Operating Requirements Symbol Parameter TA = +25°CT A = 0°C to +70°C Units VCC = +5.0V V CC = +5.0V C L = 50 pF C L = 50 pF Min Typ Max Min Max fMAX Maximum Clock Frequency 85 105 80 MHz Symbol Parameter TA = +25°CT A = 0°C to +70°C UnitsVCC = +5.0V V CC = +5.0V Min Max Min Max tS(H) Setup Time, HIGH or LOW 4.0 5.0 ns tS(L) Jn or Kn to CPn 3.0 3.5 tH (H) Hold Time, HIGH or LOW 0 0 tH (L) Jn or Kn to CPn 00 tW (H) CP n Pulse Width 4.5 5.0 ns tW (L) HIGH or LOW 4.5 5.0 tW (L) SDn Pulse Width, LOW 4.5 5.0 ns tREC SDn to CPn 4.0 5.0 ns Recovery Time
5 www.fairchildsemi.com 74F113 Physical Dimensions inches (millimeters) unless otherwise noted 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow Package Number M14A 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Package Number M14D
www.fairchildsemi.com 6 74F113 Dual JK Negative Edge-Triggered Flip-Flop Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N14A Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea- sonably expected to result in a significant injury to the user. 2. A critical component in any component of a life support device or system whose failure to perform can be rea- sonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com