SN54ALS09 TI | Alldatasheet
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SN54ALS09, SN74ALS09 QUADRUPLE 2-INPUT POSITIVE-AND GATES WITH OPEN-COLLECTOR OUTPUTS SDAS084B – APRIL 1982 – REVISED DECEMBER 1994 Copyright 1994, Texas Instruments Incorporated 1POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
- Package Options Include Plastic Small-Outline (D) Packages, Ceramic Chip Carriers (FK), and Standard Plastic (N) and Ceramic (J) 300-mil DIPs
description
These devices contain four independent 2-input positive-AND gates. They perform the Boolean functions Y = A • B or Y = A + B in positive logic. The open-collector outputs require pullup resistors to perform correctly. These outputs may be connected to other open-collector outputs to implement active-low wired-OR or active-high wired-AND functions. Open-collector devices are often used to generate higher V OH levels. The SN54ALS09 is characterized for operation over the full military temperature range of –55°C to 125°C. The SN74ALS09 is characterized for operation from 0°C to 70°C. FUNCTION TABLE (each gate) INPUTS OUTPUT A B Y H H H L XL X L L logic symbol† logic diagram (positive logic) † This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. Pin numbers shown are for the D, J, and N packages. SN54ALS09 ...J PACKAGE SN74ALS09 ...D O R N PACKAGE (TOP VIEW) GND V CC SN54ALS09 . . . FK PACKAGE (TOP VIEW) 3 2 1 20 19 9 10 11 12 13 NC NC NC NC NC V NC CC NC – No internal connection GND PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
SN54ALS09, SN74ALS09 QUADRUPLE 2-INPUT POSITIVE-AND GATES WITH OPEN-COLLECTOR OUTPUTS SDAS084B – APRIL 1982 – REVISED DECEMBER 1994
2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)† † Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. recommended operating conditions SN54ALS09 SN74ALS09 UNIT MIN NOM MAX MIN NOM MAX UNIT VCC Supply voltage 4.5 5 5.5 4.5 5 5.5 V VIH High-level input voltage 2 2 V VIL Low-level input voltage 0.7 0.8 V VOH High-level output voltage 5.5 5.5 V IOL Low-level output current 4 8 mA TA Operating free-air temperature –55 125 0 70 °C electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS SN54ALS09 SN74ALS09 UNITPARAMETER TEST CONDITIONS MIN TYP ‡ MAX MIN TYP ‡ MAX UNIT VIK VCC = 4.5 V, II = –18 mA –1.5 –1.5 V VOL VCC =45V IOL = 4 mA 0.25 0.4 0.25 0.4 VVOL VCC = 4.5 V IOL = 8 mA 0.35 0.5 V II VCC = 5.5 V, VI = 7 V 0.1 0.1 mA IIH VCC = 5.5 V, VI = 2.7 V 20 20 µA IIL VCC = 5.5 V, VI = 0.4 V –0.1 –0.1 mA IOH VCC = 4.5 V, VOH = 5.5 V 0.1 0.1 mA ICCL VCC = 5.5 V, VI = 0 2.2 4 2.2 4 mA ‡ All typical values are at VCC = 5 V, TA = 25°C. switching characteristics (see Figure 1) PARAMETER FROM (INPUT ) TO (OUTPUT ) VCC = 4.5 V to 5.5 V, C L = 50 pF, R L = 2 kΩ , TA = MIN to MAX§ UNIT(INPUT) (OUTPUT) SN54ALS09 SN74ALS09 MIN MAX MIN MAX tPLH Ao rB Y 20 69 23 54 ns tPHL A or B Y 5 23 5 15 ns § For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
NOTES: A. C L includes probe and jig capacitance. B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control. Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control. C. When measuring propagation delay items of 3-state outputs, switch S1 is open. D. All input pulses have the following characteristics: PRR ≤ 1 MHz, tr = tf = 2 ns, duty cycle = 50%. E. The outputs are measured one at a time with one transition per measurement. Figure 1. Load Circuits and Voltage Waveforms
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