74ABT162244 FAIRCHILD | Alldatasheet

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I Separate control logic for each nibble I 16-bit version of the ABT2244 I Guaranteed latchup protection I High impedance glitch free bus loading during entire power up and power down cycle I Non-destructive hot insertion capability Ordering Code: Logic Symbol Pin Descriptions Connection Diagram Order Number Package Number Package Description 74ABT162244CSSC MS48A 48-Lead Small Shrink Outline Package (SSOP), JEDEC MO-118, 0.300" Wide [RAIL] 74ABT162244CSSX MS48A 48-Lead Small Shrink Outline Package (SSOP), JEDEC MO-118, 0.300" Wide [TAPE and REEL] 74ABT162244CMTD MTD48 48-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 6.1mm Wide [RAIL] 74ABT162244MTDX MTD48 48-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 6.1mm Wide [TAPE and REEL] Pin Names Description OE n Output Enable Input (Active LOW) I0–I15 Inputs O 0–O 15 Outputs

www.fairchildsemi.com 2 74ABT162244 Truth Tables H /c32 HIGH Voltage Level L /c32 LOW Voltage Level X /c32 Immaterial Z /c32 High Impedance Functional Description The ABT162244 contains sixteen non-inverting buffers with 3-STATE outputs. The device is nibble (4 bits) controlled with each nibble functioning identically, but independent of the other. The control pins can be shorted together to obtain full 16-bit operation. Logic Diagram Schematic of each Output Inputs Outputs OE 1 I0–I3 O 0–O 3 LL L LH H HX Z Inputs Outputs OE 3 I8–I11 O 8–O 11 LL L LH H HX Z Inputs Outputs OE 2 I4–I7 O 4–O 7 LL L LH H HX Z Inputs Outputs OE 4 I12–I15 O 12–O 15 LL L LH H HX Z

3 www.fairchildsemi.com 74ABT162244 Absolute Maximum Ratings(Note 1) Recommended Operating Conditions Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs. Note 3: Guaranteed, but not tested. Storage Temperature /c16 65/c113 C to /c14 150/c113 C Ambient Temperature under Bias /c16 55/c113 C to /c14 125/c113 C Junction Temperature under Bias /c16 55/c113 C to /c14 150/c113 C VCC Pin Potential to Ground Pin /c16 0.5V to /c14 7.0V Input Voltage (Note 2) /c16 0.5V to /c14 7.0V Input Current (Note 2) /c16 30 mA to /c14 5.0 mA Voltage Applied to Any Output in the Disabled or Power-Off State /c16 0.5V to 5.5V in the HIGH State /c16 0.5V to VCC Current Applied to Output in LOW State (Max) twice the rated I OL (mA) DC Latchup Source Current /c16 500 mA Over Voltage Latchup (I/O) 10V Free Air Ambient Temperature /c16 40/c113 C to /c14 85/c113 C Supply Voltage /c14 4.5V to /c14 5.5V Minimum Input Edge Rate (/c39 V//c39 t) Data Input 50 mV/ns Enable Input 20 mV/ns Symbol Parameter Min Typ Max Units VCC Conditions VIH Input HIGH Voltage 2.0 V Recognized HIGH Signal VIL Input LOW Voltage 0.8 V Recognized LOW Signal VCD Input Clamp Diode Voltage /c16 1.2 V Min I IN /c32 /c16 18 mA VOH Output HIGH Voltage 2.5 V Min I OH /c32 /c16 3 mA

2.0 V Min I OH /c32 /c16 32 mA

VOL Output LOW Voltage 0.8 V Min I OL /c32 12 mA IIH Input HIGH Current 1 /c80 AM a x VIN /c32 2.7V (Note 3) 1V IN /c32 VCC IBVI Input HIGH Current Breakdown Test 7 /c80 AM a x V IN /c32 7.0V IIL Input LOW Current /c16 1 /c80 AM a x VIN /c32 0.5V (Note 3) /c16 1V IN /c32 0.0V VID Input Leakage Test 4.75 V 0.0 I ID /c32 1.9 /c80 A All Other Pins Grounded IOZH Output Leakage Current 10 /c80 A0 /c16 5.5V VOUT /c32 2.7V; OEn /c32 2.0V IOZL Output Leakage Current /c16 10 /c80 A0 /c16 5.5V VOUT /c32 0.5V; OEn /c32 2.0V IOS Output Short-Circuit Current /c16 100 /c16 275 mA Max V OUT /c32 0.0V ICEX Output High Leakage Current 50 /c80 AM a x V OUT /c32 VCC IZZ Bus Drainage Test 100 /c80 A0 . 0 V OUT /c32 5.5V; All Others GND ICCH Power Supply Current 2.0 mA Max All Outputs HIGH ICCL Power Supply Current 60 mA Max All Outputs LOW ICCZ Power Supply Current 2.0 mA Max OE n /c32 VCC All Others at VCC or GND ICCT Additional ICC /Input Outputs Enabled 3.0 mA V I /c32 VCC /c16 2.1V Outputs 3-STATE 3.0 mA Max Enable Input V I /c32 VCC /c16 2.1V Outputs 3-STATE 50 /c80 A Data Input V I /c32 VCC /c16 2.1V All Others at VCC or GND ICCD Dynamic ICC No Load mA/ Max Outputs OPEN (Note 3) 0.1 MHz OE n /c32 GND One Bit Toggling, 50% Duty Cycle

www.fairchildsemi.com 4 74ABT162244 Capacitance Note 4: C OUT is measured at frequency f /c32 1 MHz per MIL-STD-883, Method 3012. Symbol Parameter TA /c32 /c14 25/c113 CT A /c32 /c16 40/c113 C to /c14 85/c113 C Units VCC /c32 /c14 5V V CC /c32 4.5V–5.5V C L /c32 50 pF C L /c32 50 pF Min Typ Max Min Max ns ns ns Symbol Parameter Typ Units Conditions TA /c32 25/c113 C C IN Input Capacitance 5.0 pF V CC /c32 0.0V C OUT (Note 4) Output Capacitance 9.0 pF V CC /c32 5.0V

www.fairchildsemi.com 6 74ABT162244 Physical Dimensions inches (millimeters) unless otherwise noted 48-Lead Small Shrink Outline Package (SSOP), JEDEC MO-118, 0.300" Wide

7 www.fairchildsemi.com 74ABT162244 16-Bit Buffer/Line Driver with 25/G58 Series Resistors in the Outputs Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 48-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 6.1mm Wide Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD ’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea- sonably expected to result in a significant injury to the user. 2. A critical component in any component of a life support device or system whose failure to perform can be rea- sonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com