IDT29FCT520AT IDT | Alldatasheet
Document overview
- Manufacturer or author: Provided By ALLDATASHEET.COM(FREE DATASHEET DOWNLOAD SITE)
- PDF pages: 7
Technical content
Integrated Device Technology, Inc. The IDT logo is a registered trademark of Integrated Device Technology, Inc. DESCRIPTION: The IDT29FCT520AT/BT/CT/DT and IDT29FCT521AT/ BT/CT/DT each contain four 8-bit positive edge-triggered registers. These may be operated as a dual 2-level or as a single 4-level pipeline. A single 8-bit input is provided and any of the four registers is available at the 8-bit, 3-state output. These devices differ only in the way data is loaded into and between the registers in 2-level operation. The difference is illustrated in Figure 1. In the IDT29FCT520AT/BT/CT/DT when data is entered into the first level (I = 2 or I = 1), the existing data in the first level is moved to the second level. In the IDT29FCT521AT/BT/CT/DT, these instructions simply cause the data in the first level to be overwritten. Transfer of data to the second level is achieved using the 4-level shift instruction (I = 0). This transfer also causes the first level to change. In either part I=3 is for hold. FUNCTIONAL BLOCK DIAGRAM 2619 drw 01 REGISTER CONTROL I ,I10 CLK OCTAL REG. A1 OCTAL REG. A2 OCTAL REG. B1 OCTAL REG. B2 MUX MUX 2S ,S10 Y -Y70 OE D -D70 MULTILEVEL PIPELINE REGISTERS IDT29FCT520AT/BT/CT/DT IDT29FCT521AT/BT/CT/DT MILITARY AND COMMERCIAL TEMPERATURE RANGES APRIL 1994 1994 Integrated Device Technology, Inc. DSC-4215/4 FEATURES:
- A, B, C and D speed grades
- Low input and output leakage ≤1µA (max.)
- CMOS power levels
- True TTL input and output compatibility – V OH = 3.3V (typ.) – VOL = 0.3V (typ.)
- High drive outputs (-15mA IOH , 48mA IOL )
- Meets or exceeds JEDEC standard 18 specifications
- Product available in Radiation Tolerant and Radiation Enhanced versions
- Military product compliant to MIL-STD-883, Class B and DESC listed (dual marked)
- Available in DIP, SOIC, SSOP, QSOP, CERPACK and LCC packages 6.2
Figure 1. Data Loading in 2-Level Operation B1 or B2 data to be available at the output port. OE Output enable for 3-state output port.
IDT29FCT520AT/BT/CT/DT, 521AT/BT/CT/DT MULTILEVEL PIPELINE REGISTERS MILITARY AND COMMERCIAL TEMPERATURE RANGES 6.2 3 CAPACITANCE (TA = +25°C, f = 1.0MHz)ABSOLUTE MAXIMUM RATINGS (1) Symbol Rating Commercial Military Unit VTERM (2) Terminal Voltage with Respect to GND VTERM (3) Terminal Voltage with Respect to GND –0.5 to V CC +0.5 –0.5 to VCC +0.5 V TA Operating Temperature 0 to +70 –55 to +125 °C TBIAS Temperature Under Bias –55 to +125 –65 to +135 °C TSTG Storage Temperature –55 to +125 –65 to +150 °C PT Power Dissipation 0.5 0.5 W IOUT DC Output Current –60 to +120 –60 to +120 mA NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT- INGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed VCC by +0.5V unless otherwise noted. 2. Input and VCC terminals only. 3. Outputs and I/O terminals only. DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE Following Conditions Apply Unless Otherwise Specified: Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10% Symbol Parameter Test Conditions (1) Min. Typ. (2) Max. Unit VIH Input HIGH Level Guaranteed Logic HIGH Level 2.0 — — V VIL Input LOW Level Guaranteed Logic LOW Level — — 0.8 V IIH Input HIGH Current(4) VCC = Max. V I = 2.7V — — ±1 µA IIL Input LOW Current(4) VCC = Max. V I = 0.5V — — ±1 µA IOZH High Impedance(4) VCC = Max. V O = 2.7V — — ±1 µA IOZL Output Current V O = 0.5V — — ±1 II Input HIGH Current(4) VCC = Max., VI = VCC (Max.) — — ±1 µA VIK Clamp Diode Voltage V CC = Min., IN = –18mA — –0.7 –1.2 V IOS Short Circuit Current V CC = Max.(3), VO = GND –60 –120 –225 mA VOH Output HIGH Voltage V CC = Min. I OH = –6mA MIL. 2.4 3.3 — V VIN = VIH or VIL IOH = –8mA COM’L. IOH = –12mA MIL. 2.0 3.0 — IOH = –15mA COM’L. VOL Output LOW Voltage V CC = Min. I OL = 32mA MIL. — 0.3 0.5 V VIN = VIH or VIL IOL = 48mA COM’L. VH Input Hysteresis — — 200 — mV ICC Quiescent Power V CC = Max. — 0.01 1 mA Supply Current V IN = GND or VCC NOTES: 2619 tbl 05 1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25°C ambient. 3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second. 4. The test limit for this parameter is ±5µA at T A = -55°C. Symbol Parameter (1) Conditions Typ. Max. Unit CIN Input Capacitance VIN = 0V 6 10 pF COUT Output Capacitance VOUT = 0V 8 12 pF 2619 lnk 04 2619 lnk 03 NOTE: 1. This parameter is measured at characterization but not tested.
6.2 4 IDT29FCT520AT/BT/CT/DT, 521AT/BT/CT/DT MULTILEVEL PIPELINE REGISTERS MILITARY AND COMMERCIAL TEMPERATURE RANGES POWER SUPPLY CHARACTERISTICS Symbol Parameter Test Conditions (1) Min. Typ. (2) Max. Unit ΔICC Quiescent Power Supply V CC = Max. — 0.5 2.0 mA Current, TTL Inputs HIGH V IN = 3.4V(3) ICCD Dynamic Power Supply Current(4) VCC = Max., Outputs Open VIN = VCC — 0.15 0.25 mA/ OE = GND V IN = GND MHz One Input Toggling 50% Duty Cycle I C Total Power Supply Current(6) VCC = Max., Outputs Open VIN = VCC — 1.5 3.5 mA fCP = 10MHz V IN = GND 50% Duty Cycle OE = GND One Bit Toggling V at fi = 5MHz V IN = GND 50% Duty Cycle VCC = Max., Outputs Open VIN = VCC — 3.8 7.3 (5) fCP = 10MHz V IN = GND 50% Duty Cycle OE = GND Eight Bits Toggling V at fi = 2.5MHz V IN = GND 50% Duty Cycle NOTES: 2619 tbl 06 1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25°C ambient. 3. Per TTL driven input (VIN = 3.4V); all other inputs at VCC or GND. 4. This parameter is not directly testable, but is derived for use in Total Power Supply calculations. 5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested. 6. IC = IQUIESCENT +IINPUTS + IDYNAMIC IC = ICC + ΔICC D H N T + ICCD (fCP /2 + fiN i) ICC = Quiescent Current ΔICC = Power Supply Current for a TTL HIgh Input (VIN = 3.4V) D H = Duty Cycle for TTL Inputs High N T = Number of TTL inputs at DH ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL) fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices) fi = Input Frequency N i = Number of Inputs at fi All currents are in milliamps and all frequencies are in megahertz.
IDT29FCT520AT/BT/CT/DT, 521AT/BT/CT/DT MULTILEVEL PIPELINE REGISTERS MILITARY AND COMMERCIAL TEMPERATURE RANGES 6.2 5 SWITCHING CHARACTERISTICS OVER OPERATING RANGE FCT520AT/521AT FCT520BT/521BT Com'l. Mil. Com'l. Mil. tPHL tPLH Propagation Delay CLK to Yn C L = 50pF tPHL tPLH Propagation Delay tSU Set-up Time, HIGH or LOW Dn to CLK 5.0 — 6.0 — 2.5 — 2.8 — ns tH Hold Time, HIGH or LOW Dn to CLK 2.0 — 2.0 — 2.0 — 2.0 — ns tSU Set-up Time, HIGH or LOW I0 or I1 to CLK 5.0 — 6.0 — 4.0 — 4.5 — ns tH Hold Time, HIGH or LOW I0 or I1 to CLK 2.0 — 2.0 — 2.0 — 2.0 — ns tPHZ tPLZ tPZH tPZL tW Clock Pulse Width HIGH or LOW 7.0 — 8.0 — 5.5 — 6.0 — ns NOTES: 2619 tbl 08 1. See test circuit and waveforms. 2. Minimum units are guaranteed but not tested on Propagation Delays. 2619 tbl 07 FCT520CT/521CT FCT520DT/521DT Com'l. Mil. Com'l. Mil. tPHL tPLH Propagation Delay CLK to Yn C L = 50pF tPHL tPLH Propagation Delay tSU Set-up Time, HIGH or LOW Dn to CLK 2.5 — 2.8 — 1.5 — — — ns tH Hold Time, HIGH or LOW Dn to CLK 2.0 — 2.0 — 1.0 — — — ns tSU Set-up Time, HIGH or LOW I0 or I1 to CLK 4.0 — 4.5 — 2.0 — — — ns tH Hold Time, HIGH or LOW I0 or I1 to CLK 2.0 — 2.0 — 1.0 — — — ns tPHZ tPLZ tPZH tPZL tW Clock Pulse Width HIGH or LOW(3) 5.5 — 6.0 — 3.0 — — — ns
6.2 6 IDT29FCT520AT/BT/CT/DT, 521AT/BT/CT/DT MULTILEVEL PIPELINE REGISTERS MILITARY AND COMMERCIAL TEMPERATURE RANGES TEST CIRCUITS AND WAVEFORMS TEST CIRCUITS FOR ALL OUTPUTS SET-UP, HOLD AND RELEASE TIMES PULSE WIDTH SWITCH POSITION ENABLE AND DISABLE TIMESPROPAGATION DELAY Pulse Generator R T D.U.T. V CC VIN C L V OUT 50pF 500Ω 500Ω 7.0V 1.5V 1.5V 1.5V 1.5V DATA INPUT TIMING INPUT ASYNCHRONOUS CONTROL PRESET CLEAR ETC. SYNCHRONOUS CONTROL tSU tH tREM tSU tH HIGH-LOW-HIGH PULSE LOW-HIGH-LOW PULSE tW 1.5V 1.5V SAME PHASE INPUT TRANSITION 1.5V 1.5V VOH tPLH OUTPUT OPPOSITE PHASE INPUT TRANSITION 1.5V tPLH tPHL tPHL VOL CONTROL INPUT 1.5V 3.5V OUTPUT NORMALLY LOW OUTPUT NORMALLY HIGH SWITCH CLOSED SWITCH OPEN VOL 0.3V 0.3V tPLZtPZL tPZH tPHZ 3.5V 1.5V 1.5V ENABLE DISABLE VOH PRESET CLEAR CLOCK ENABLE ETC. NOTES: 1. Diagram shown for input Control Enable-LOW and input Control Disable- HIGH 2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns Test Switch Disable Low Enable Low Closed All Other Tests Open Open Drain DEFINITIONS: C L= Load capacitance: includes jig and probe capacitance. R T = Termination resistance: should be equal to ZOUT of the Pulse Generator. 2619 drw 05 2619 drw 06 2619 drw 07 2619 drw 08 2619 drw 09 2619 lnk 09
IDT29FCT520AT/BT/CT/DT, 521AT/BT/CT/DT MULTILEVEL PIPELINE REGISTERS MILITARY AND COMMERCIAL TEMPERATURE RANGES 6.2 7
ORDERING INFORMATION
B MIL-STD-883, Class B P D L SO PY E Q Plastic DIP CERDIP Leadless Chip Carrier Small Outline IC Shrink Small Outline Package CERPACK Quarter-size Small Outline Package 520AT 521AT 520BT 521BT 520CT 521CT 520DT 521DT Multilevel Pipeline Register Multilevel Pipeline Register XX Device Type X Package X29FCT ProcessTemperature Range Family X Blank High Drive Balanced Drive -55°C to +125°C 0°C to +70°C XX