IDT70T3509M_18 IDT | Alldatasheet
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©2018 Integrated Device Technology, Inc. FEBRUARY 2018 DSC 5682/10 Functional Block Diagram HIGH-SPEED 2.5V 1024K x 36 SYNCHRONOUS DUAL-PORT STATIC RAM WITH 3.3V OR 2.5V INTERFACE IDT70T3509M REPEATR A 0R CNTENR ADSR Dout0-8_R Dout9-17_R I/O0R - I/O35RDin_R ADDR_R OER BE3R BE2R BE1R BE0R R/WR CE0R CE 1R1 FT/PIPER1a 0a1b 0b1c 0c1d 0d dcba CLK R Counter/ Address Reg. dcba 0d 1d0c 1c0b 1b0a 1a B W R B W R B W R FT/PIPER Counter/ Address Reg. CNTENL ADSL REPEATL Dout0-8_L Dout9-17_L Dout18-26_L Dout27-35_L Dout18-26_R Dout27-35_R B W L B W L B W L B W L I/O0L - I/O35L A19L A 0L Din_L ADDR_L OEL 5682 drw 01 BE3L BE2L BE1L BE0L R/WL CE0L CE 1L 1024K x 36 MEMORY ARRAY CLK L abcd FT/PIPEL 0/1 1d 0d 1c 0c 1b 0b 1a 0a B W R JTAG TCK TRST TMS TDO TDI 0d 1d0c 1c0b 1b0a 1a ab cd FT/PIPEL 1/01/0 INTERRUPT LOGIC R/WL CE 0 L CE1 L R/WR CE0 R CE1 R INTL INTR ZZ CONTROL LOGIC ZZL(1) ZZR (1) A 19R (2)(2) Features: ◆ True Dual-Port memory cells which allow simultaneous access of the same memory location ◆ High-speed data access – Commercial: 4.2ns (133MHz)(max.) – Industrial: 4.2ns (133MHz)(max.) ◆ Selectable Pipelined or Flow-Through output mode ◆ Counter enable and repeat features ◆ Interrupt Flags ◆ Full synchronous operation on both ports – 7.5ns cycle time, 133MHz operation (9.5Gbps bandwidth) – 1.5ns setup to clock and 0.5ns hold on all control, data, and address inputs @ 133MHz – Fast 4.2ns clock to data out NOTES: 1. The sleep mode pin shuts off all dynamic inputs, except JTAG inputs, when asserted. All static inputs, i.e., PL/ FTx and OPTx and the sleep mode pins themselves (ZZx) are not affected during sleep mode. 2. See Truth Table I for Functionality. – Data input, address, byte enable and control registers – Self-timed write allows fast cycle time ◆ Separate byte controls for multiplexed bus and bus matching compatibility ◆ Dual Cycle Deselect (DCD) for Pipelined Output Mode ◆ 2.5V (±100mV) power supply for core ◆ LVTTL compatible, selectable 3.3V (±150mV) or 2.5V (±100mV) power supply for I/Os and control signals on each port ◆ Includes JTAG functionality ◆ Available in a 256-pin Ball Grid Array (BGA) ◆ Common BGA footprint provides design flexibility over seven density generations (512K to 36M-bit) ◆ Green parts available, see ordering information LEAD FINISH (SnPb) ARE IN EOL PROCESS - LAST TIME BUY EXPIRES JUNE 15, 2018
6.42 IDT70T3509M High-Speed 2.5V 1024K x 36 Dual-Port Synchronous Static RAM Commercial Temperature Range Description: The IDT70T3509M is a high-speed 1024K x 36 bit synchronous Dual-Port RAM. The memory array utilizes Dual-Port memory cells to allow simultaneous access of any address from both ports. Registers on control, data, and address inputs provide minimal setup and hold times. The timing latitude provided by this approach allows systems to be designed with very short cycle times. With an input data register, the IDT70T3509M has been optimized for applications having unidirectional or bidirectional data flow in bursts. An automatic power down feature, controlled by CE0 and CE1, permits the on-chip circuitry of each port to enter a very low standby power mode. The 70T3509M can support an operating voltage of either 3.3V or 2.5V on one or both ports, controllable by the OPT pins. The power supply for the core of the device (VDD) is at 2.5V.
6.42 IDT70T3509M High-Speed 2.5V 1024K x 36 Dual-Port Synchronous Static RAM Commercial Temperature Range Pin Configuration (1,2,3,4) NOTES: 1. All V DD pins must be connected to 2.5V power supply. 2. All V DDQ pins must be connected to appropriate power supply: 3.3V if OPT pin for that port is set to V DD (2.5V), and 2.5V if OPT pin for that port is set to V SS (0V). 3. All V SS pins must be connected to ground supply. 4. Package body is approximately 17mm x 17mm x 1.76mm, with 1.0mm ball-pitch. 5. This package code is used to reference the package diagram. 6. This text does not indicate orientation of the actual part-marking. 70T3509M BP BP-256(5,7) 256-Pin BGA Top View(6) E16 I/O14R D16 I/O16R C16 I/O16L B16 NC A16 NC A15 NC B15 I/O17L C15 I/O17R D15 I/O15L E15 I/O14L E14 I/O13L D14 I/O15R D13 VDD C12 A6L C14 OPT L B14 VDD A14 A0L A12 A5L B12 A4L C11 ADSL D12 VDDQR D11 VDDQR C10 CLK L B11 REPEATL A11 CNTENL VDDQR BE1L CE 1L VDDQL BE0L CE0L D10 VDDQL A7L BE3L BE2L B13 A1L A13 A2L A10 OEL V DDQR A 9L A 8L A12L A10L VDDQL A 14L A15L A13L VDDQL A 18L PIPE/FTL A19L TDO V SS I/O20L I/O19R I/O19L NC TDI NC I/O18L I/O18R I/O20R I/O21R I/O21L I/O22L VDDQL I/O23L I/O22R I/O23R VDDQL I/O24R I/O24L I/O25L VDDQR I/O26L I/O25R I/O26R VDDQR I/O27L I/O28R I/O27R VDDQL I/O29R I/O29L I/O28L V DDQL I/O30L I/O31R I/O30R VDDQR I/O32R I/O32L I/O31L VDDQR I/O33L I/O34R I/O33R I/O35R I/O34L TMS I/O35L NC TRST A18R NC TCK A19R A13R A15R P12 A6R BE1R BE0R BE3R BE2R P10 CLK R T11 CNTENR P11 ADSR R12 A4R T12 A 5R P13 A3R A7R R13 A1R T13 A2R A 12R A14R T14 A 0R R14 OPT R P14 I/O0L P15 I/O0R R15 NC T15 NC T16 NC R16 NC P16 I/O1L N16 I/O2R N15 I/O1R N14 I/O2L M16 I/O4L M15 I/O3L M14 I/O3R L16 I/O5R L15 I/O4R L14 I/O5L K16 I/O7L K15 I/O6L K14 I/O6R J16 I/O8L J15 I/O7R J14 I/O8R H16 I/O10R H15 IO9L H14 I/O9R G16 I/O11R G15 I/O11L G14 I/O10L F16 I/O12L F14 I/O12R F15 I/O13R CE0R R11 REPEAT R A11R CE 1R A 11L B10 R/WL C13 A3L A10R R10 R/WR A9R T10 OER A8R VDD VDD INTL VSS V SS E10 VSS E11 VDD E12 VDD E13 V DDQR VDD NC VSS V SS F10 VSS F12 VDD F13 V DDQR V SS VSS VSS VSS V SS G10 VSS G11 VSS G12 VSS G13 VDDQL VSS V SS VSS VSS VSS H10 V SS H11 VSS H12 VSS H13 VDDQL ZZ R VSS VSS VSS V SS J10 VSS J11 VSS J12 ZZL J13 V DDQR V SS VSS VSS VSS VDD NC NC VSS VDD V DD INTR VSS V DDQR VDDQR VDDQL VDDQL V SS K10 VSS K11 VSS K12 VSS V SS L10 V SS L11 VSS L12 VDD V SS M10 VSS M11 VDD M12 VDD V DDQR N10 V DDQR N11 VDDQL N12 VDDQL K13 V DDQR L13 V DDQL M13 V DDQL N13 VDD NC F11 VSS 5682 drw 02d 08/03/04 A 17R A 17L A16L A 16R PI PE/ FTR
6.42 IDT70T3509M High-Speed 2.5V 1024K x 36 Dual-Port Synchronous Static RAM Commercial Temperature Range Pin Names Left Port Right Port Names CE0L, CE1L CE0R, CE1R Chip Enables (Input) (5) R/WL R/WR Read/Write Enable (Input) OEL OER Output Enable (Input) A0L - A 19L A0R - A 19R Address (Input) I/O0L - I/O35L I/O0R - I/O35R Data Input/Output CLKL CLKR Clock (Input) PL/FTL PL/FTR Pipeline/Flow-Through (Input) ADSL ADSR Address Strobe Enable (Input) CNTENL CNTENR Counter Enable (Input) REPEATL REPEATR Counter Repeat(3) (Input) BE0L - BE3L BE0R - BE3R Byte Enables (9-bit bytes) (Input) (5) VDDQL VDDQR Power (I/O Bus) (3.3V or 2.5V) (1) (Input) OPTL OPTR Option for selecting V DDQX(1,2) (Input) ZZL ZZR Sleep Mode pin (4) (Input) VDD Power (2.5V)(1) (Input) VSS Ground (0V) (Input) TDI Test Data Input TDO Test Data Output TCK T est Logic Clock (10MHz) (Input) TMS T est Mode Select (Input) TRST Reset (Initialize T AP Controller) (Input) INTL INTR Interrupt Flag (Output) 5682 tbl 01 NOTES: 1. V DD, OPT X, and V DDQX must be set to appropriate operating levels prior to applying inputs on the I/Os and controls for that port. 2. OPT X selects the operating voltage levels for the I/Os and controls on that port. If OPTX is set to VDD (2.5V), then that port's I/Os and controls will operate at 3.3V levels and VDDQX must be supplied at 3.3V. If OPT X is set to V SS (0V), then that port's I/Os and address controls will operate at 2.5V levels and V DDQX must be supplied at 2.5V. The OPT pins are independent of one another—both ports can operate at 3.3V levels, both can operate at 2.5V levels, or either can operate at 3.3V with the other at 2.5V. 3. When REPEATX is asserted, the counter will reset to the last valid address loaded via ADSX. 4. The sleep mode pin shuts off all dynamic inputs, except JTAG inputs, when asserted. All static inputs, i.e., PL/ FTx and OPTx and the sleep mode pins themselves (ZZx) are not affected during sleep mode. It is recommended that boundary scan not be operated during sleep mode. 5. Chip Enables and Byte Enables are double buffered when PL/ FT = VIH, i.e., the signals take two cycles to deselect.
6.42 IDT70T3509M High-Speed 2.5V 1024K x 36 Dual-Port Synchronous Static RAM Commercial Temperature Range NOTES: 1. "H" = V IH, "L" = V IL, "X" = Don't Care. 2. ADS, CNTEN, REPEAT = X. 3. OE and ZZ are asynchronous input signals. 4. It is possible to read or write any combination of bytes during a given access. A few representative samples have been illustrated here. Truth Table I—Read/Write and Enable Control (1,2,3,4) OE CLK CE0 CE1 BE3 BE2 BE1 BE0 R/W ZZ Byte 3 I/O27-35 Byte 2 I/O18-26 Byte 1 I/O9-17 Byte 0 I/O0-8 MODE X ↑ HLXXXXX LH igh-ZH igh-ZH igh-ZH igh-Z D eselected– Power Down X ↑ LLXXXXXXA ctiveA ctiveA ctiveA ctive N ot Allowed X ↑ HHXXXXXXA ctiveA ctiveA ctiveA ctive N ot Allowed X ↑ LHHHHHX LH igh-ZH igh-ZH igh-ZH igh-Z A ll Bytes Deselected X ↑ LHHHHL L LH igh-ZH igh-ZH igh-Z D IN Write to Byte 0 Only X ↑ L H H H L H L L High-Z High-Z D IN High-Z Write to Byte 1 Only X ↑ LHHLHHL LH igh-Z D IN High-Z High-Z Write to Byte 2 Only X ↑ LHLHHHL L D IN High-Z High-Z High-Z Write to Byte 3 Only X ↑ L H H H L L L L High-Z High-Z D IN DIN Write to Lower 2 Bytes Only X ↑ LHLLHHL L D IN DIN High-Z High-Z Write to Upper 2 bytes Only X ↑ LHLLLLLL D IN DIN DIN DIN Write to All Bytes L ↑ LHHHHL H LH igh-ZH igh-ZH igh-Z D OUT Read Byte 0 Only L ↑ L H H H L H H L High-Z High-Z D OUT High-Z Read Byte 1 Only L ↑ LHHLHHHLH igh-Z D OUT High-Z High-Z Read Byte 2 Only L ↑ LHLHHHHL D OUT High-Z High-Z High-Z Read Byte 3 Only L ↑ L H H H L L H L High-Z High-Z D OUT DOUT Read Lower 2 Bytes Only L ↑ LHLLHHHL D OUT DOUT High-Z High-Z Read Upper 2 Bytes Only L ↑ LHLLLLHL D OUT DOUT DOUT DOUT Read All Bytes H ↑ XXXXXXX LH igh-ZH igh-ZH igh-ZH igh-Z O utputs Disabled XXXXXXXXX HH igh-ZH igh-ZH igh-ZH igh-Z S leep Mode 5682 tbl 02 Truth Table II—Address Counter Control (1,2) NOTES: 1. "H" = V IH, "L" = V IL, "X" = Don't Care. 2. Read and write operations are controlled by the appropriate setting of R/ W, CE0, CE 1, BEn and OE. 3. Outputs configured in flow-through output mode: if outputs are in pipelined mode the data out will be delayed by one cycle. 4. ADS and REPEAT are independent of all other memory control signals including CE0, CE 1 and BEn 5. The address counter advances if CNTEN = V IL on the rising edge of CLK, regardless of all other memory control signals including CE0, CE 1, BEn. 6. When REPEAT is asserted, the counter will reset to the last valid address loaded via ADS. This value is not set at power-up: a known location should be loaded via ADS during initialization if desired. Any subsequent ADS access during operations will update the REPEAT address location. 7. Address A 19 must be managed as part of a full depth counter implementation using the IDT70T3509M. For physical addresses 00000 H through 7FFFF H the value of a A 19 is 0, while for physical addresses 80000 H through FFFFF H the value of A 19 is 1. The user needs to keep track of the device counter and make sure that A19 is actively driven from 0-to-1 or 1-to-0 and held as needed at the appropriate address boundaries for full depth counter operation and that A 19 is in the appropriate state when using the REPEAT function. Address Previous Internal Address Internal Address Used CLK ADS CNTEN REPEAT (6) I/O(3) MODE An X An ↑ L (4) XH D I/O (n) External Address Used XA n A n + 1 ↑ H L (5) HD I/O(n+1) Counter Enabled—Internal Address generation (7) X An + 1 An + 1 ↑ HH H D I/O(n+1) External Address Blocked—Counter disabled (An + 1 reused) XX A n ↑ XX L (4) DI/O(n) Counter Set to last valid ADS load 5682 tbl 03
6.42 IDT70T3509M High-Speed 2.5V 1024K x 36 Dual-Port Synchronous Static RAM Commercial Temperature Range Recommended Operating Temperature and Supply Voltage (1) NOTES: 1. This is the parameter TA. This is the "instant on" case temperature. Grade Ambient Temperature GND V DD Commercial 0 OC to +70OC0 V 2 .5V + 100mV Industrial -40 OC to +85OC0 V 2 .5V + 100mV 5682 tbl 04 Recommended DC Operating Conditions w ith VDDQ at 3.3V NOTES: 1. V IL (min.) = -1.0V for pulse width less than t CYC/2, or 5ns, whichever is less. 2. V IH (max.) = V DDQ + 1.0V for pulse width less than t CYC/2 or 5ns, whichever is less. 3. To select operation at 3.3V levels on the I/Os and controls of a given port, the OPT pin for that port must be set to VDD (2.5V), and VDDQX for that port must be supplied as indicated above. Symbol Parameter Min. Typ. Max. Unit VDD Core Supply Voltage 2.4 2.5 2.6 V VDDQ I/O Supply Voltage (3) 3.15 3.3 3.45 V VSS Ground 0 0 0 V VIH Input High Voltage (Address, Control &Data I/O Inputs) (3) 2.0 ____ VDDQ + 150mV(2) V VIH Input High Voltage _ JT AG 1.7 ____ VDD + 100mV(2) V VIH Input High Voltage - ZZ, OPT , PIPE/FT VDD - 0.2V ____ VDD + 100mV(2) V VIL Input Low Voltage -0.3 (1) ____ 0.8 V VIL Input Low Voltage - ZZ, OPT , PIPE/FT -0.3(1) ____ 0.2 V 5682 tbl 05b Recommended DC Operating Conditions w ith VDDQ at 2.5V NOTES: 1. V IL (min.) = -1.0V for pulse width less than t CYC/2 or 5ns, whichever is less. 2. V IH (max.) = V DDQ + 1.0V for pulse width less than t CYC/2 or 5ns, whichever is less. 3. To select operation at 2.5V levels on the I/Os and controls of a given port, the OPT pin for that port must be set to Vss(0V), and VDDQX for that port must be supplied as indicated above. Symbol Parameter Min. Typ. Max. Unit VDD Core Supply Voltage 2.4 2.5 2.6 V VDDQ I/O Supply Voltage (3) 2.4 2.5 2.6 V VSS Ground 0 0 0 V VIH Input High Volltage (Address, Control & Data I/O Inputs) (3) 1.7 ____ VDDQ + 100mV(2) V VIH Input High Voltage _ JT AG 1.7 ____ VDD + 100mV(2) V VIH Input High Voltage - ZZ, OPT, PIPE/FT VDD - 0.2V ____ VDD + 100mV(2) V VIL Input Low Voltage -0.3 (1) ____ 0.7 V VIL Input Low Voltage - ZZ, OPT, PIPE/FT -0.3(1) ____ 0.2 V 5682 tbl 05a
6.42 IDT70T3509M High-Speed 2.5V 1024K x 36 Dual-Port Synchronous Static RAM Commercial Temperature Range Absolute Maximum Ratings (1) Symbol Rating Com'l & Ind Unit VTERM (VDD) VDD T erminal Voltage with Respect to GND -0.5 to 3.6 V VTERM(2) (VDDQ) VDDQ Te r m i na l Vo l tag e with Respect to GND -0.3 t o VDDQ + 0.3 V VTERM(2) (INPUTS and I/O's) Input and I/O Terminal Voltage with Respect to GND -0.3 t o VDDQ + 0.3 V TBIAS(3) Temperature Under Bias -55 to +125 oC TSTG Storage Temperature -65 to +150 oC TJN Junction Temperature +150 oC IOUT(For VDDQ = 3.3V) DC Output Current 50 mA IOUT(For VDDQ = 2.5V) DC Output Current 40 mA 5682 tbl 06 NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. This is a steady-state DC parameter that applies after the power supply has reached its nominal operating value. Power sequencing is not necessary; however, the voltage on any Input or I/O pin cannot exceed V DDQ during power supply ramp up. 3. Ambient Temperature under DC Bias. No AC Conditions. Chip Deselected. NOTES: 1. These parameters are determined by device characterization, but are not production tested. 2. C OUT also references C I/O. Capacitance (1) (TA = +25°C, F = 1.0MHZ ) BGA ONLY Symbol Parameter Conditions Max. Unit CIN Input Capacitance V IN = 0V 35 pF COUT(2) Output Capacitance V OUT = 0V 35 pF 5682 tbl 07 Temperature and Supply Volta ge Range (VDD = 2.5V ± 100mV) Symbol Parameter Test Conditions 70T3509MS UnitMin. Max. |ILI| Input Leakage Current (1) VDDQ = Max., V IN = 0V t o VDDQ ___ 20 µA |ILI| JTAG & ZZ Input Leakage Current (1,2) VDD = Max., VIN = 0V to V DD ___ 60 µA |ILO| Output Leakage Current (1,3) CE0 = V IH and CE 1 = V IL, VOUT = 0V t o VDDQ ___ 20 µA VOL (3.3V) Output Low Voltage (1) IOL = +4mA, V DDQ = Min. ___ 0.4 V VOH (3.3V) Output High Voltage (1) IOH = -4mA, V DDQ = Min. 2.4 ___ V VOL (2.5V) Output Low Voltage (1) IOL = +2mA, V DDQ = Min. ___ 0.4 V VOH (2.5V) Output High Voltage (1) IOH = -2mA, V DDQ = Min. 2.0 ___ V 5682 tbl 08 NOTES: 2. Applicable only for TMS, TDI and TRST inputs. 3. Outputs tested in tri-state mode.
6.42 IDT70T3509M High-Speed 2.5V 1024K x 36 Dual-Port Synchronous Static RAM Commercial Temperature Range Temperature and Supply Voltage Range (3) (VDD = 2.5V ± 100mV) NOTES: 1. At f = f MAX, address and control lines (except Output Enable) are cycling at the maximum frequency clock cycle of 1/t CYC, using "AC TEST CONDITIONS". 2. f = 0 means no address, clock, or control lines change. Applies only to input at CMOS level standby. 3. Port "A" may be either left or right port. Port "B" is the opposite from port "A". 4. V DD = 2.5V, T A = 25°C for Typ, and are not production tested. I DD DC (f=0) = 30mA (Typ). 5. CEX = V IL means CE0X = V IL and CE 1X = V IH (enabled) CEX = V IH means CE0X = V IH and CE 1X = V IL (disabled) CEX < 0.2V means CE0X < 0.2V and CE 1X > VDDQ - 0.2V (enabled - CMOS levels) CEX > VDDQ - 0.2V means CE0X > VDDQ - 0.2V and CE 1X < 0.2V (disabled - CMOS levels) "X" represents "L" for left port or "R" for right port. 6. I SB1, ISB2 and ISB4 will all reach full standby levels (ISB3) on the appropriate port(s) if ZZ L and/or ZZ R = V IH. 70T3509MS133 Com'l & Ind Symbol Parameter Test Condition Version Typ. (4) Max. Unit IDD Dynamic Operating Current (Both Ports Active) CE L and CER= VIL, Outputs Disabled, f = fMAX(1) COM'L S 800 1120 mA IND S 800 1370 ISB1(6) Standby Current (Both Ports - TTL Level Inputs) CE L = CER = V IH f = fMAX(1) COM'L S 560 760 mA IND S 560 940 ISB2(6) Standby Current (One Port - TTL Level Inputs) CE "A" = V IL and CE"B" = V IH(5) Active Port Outputs Disabled, f=f MAX(1) COM'L S 680 880 mA IND S 680 1090 ISB3 Full Standby Current (Both Ports - CMOS Level Inputs) Both Ports CE 0L = CE0R > VDDQ - 0.2V and CE1L = CE1R < 0.2V, VIN > VDDQ - 0.2V or V IN < 0.2V, f = 0 (2) COM'L S 20 60 mA IND S 20 80 ISB4(6) Full Standby Current (One Port - CMOS Level Inputs) CE "A" < 0.2V and CE"B" > VDDQ - 0.2V (5) VIN > VDDQ - 0.2V or V IN < 0.2V Active Port, Outputs Disabled, f = f MAX(1) COM'L S 680 880 mA IND S 680 1090 Izz Sleep Mode Current (Both Ports - TTL Level Inputs) ZZ L = ZZR = VIH f=fMAX(1) COM'L S 20 60 mA IND S 20 80 5682 tbl 09
6.42 IDT70T3509M High-Speed 2.5V 1024K x 36 Dual-Port Synchronous Static RAM Commercial Temperature Range (Read and Write Cycle Timing) (2,3) (VDD = 2.5V ± 100mV, TA = 0°C to +70°C) NOTES: 1. The Pipelined output parameters (t CYC2, t CD2) apply to either or both left and right ports when FT/PIPEX = V DD (2.5V). Flow-through parameters (t CYC1, t CD1) apply when FT/PIPE = V ss (0V) for that port. 2. All input signals are synchronous with respect to the clock except for the asynchronous Output Enable ( OE), FT/PIPE and OPT. FT/PIPE and OPT should be treated as DC signals, i.e. steady state during operation. 4. Guaranteed by design (not production tested). 70T3509MS133 Com'l & Ind Symbol Parameter Min. Max. Unit tCYC1 Clock Cycle Time (Flow-Through) (1) 25 ____ ns tCYC2 Clock Cycle Time (Pipelined) (1) 7.5 ____ ns tCH1 Clock High Time (Flow-Through) (1) 10 ____ ns tCL1 Clock Low Time (Flow-Through) (1) 10 ____ ns tCH2 Clock High T ime (Pipelined) (2) 3 ____ ns tCL2 Clock Low Time (Pipelined) (1) 3 ____ ns tSA Address Setup T ime 1.8 ____ ns tHA Address Hold Time 0.5 ____ ns tSC Chip Enable Setup Time 1.8 ____ ns tHC Chip Enable Hold Time 0.5 ____ ns tSB Byte Enable Setup Time 1.8 ____ ns tHB Byt e Enable H old T ime 0.5 ____ ns tSW R/W Setup Time 1.8 ____ ns tHW R/W Hold Time 0.5 ____ ns tSD Input Data Setup Time 1.8 ____ ns tHD Input Data Hold Time 0.5 ____ ns tSAD ADS Setup Time 1.8 ____ ns tHAD ADS Hold Time 0.5 ____ ns tSCN CNTEN Setup Time 1.8 ____ ns tHCN CNTEN Hold Time 0.5 ____ ns tSRPT REPEAT Setup Time 1.8 ____ ns tHRPT REPEAT Hold Time 0.5 ____ ns tOE Output Enable to Data Valid ____ 4.6 ns tOLZ(4) Output Enable to Output Low-Z 1 ____ ns tOHZ(4) Output Enable to Output High-Z 1 4.2 ns tCD1 Clock to Data Valid (Flow-Through) (1) ____ 15 ns tCD2 Clock to Data Valid (Pipelined) (1) ____ 4.2 ns tDC Data Output Hold After Clock High 1 ____ ns tCKHZ(4) Clock High to Output High-Z 1 4.2 ns tCKLZ(4) Clock High to Output Low-Z 1 ____ ns tINS Interrupt Flag Set Time ____ 7n s tINR Interrupt Flag Reset Time ____ 7n s tCOLS Collision Flag Set Time ____ 4.2 ns tCOLR Collision Flag Reset Time ____ 4.2 ns tZZSC Sleep Mode Set Cycles 2 ____ cycles tZZRC Sleep Mode Recovery Cycles 3 ____ cycles Port-to-Port Delay tCO Clock-to-Clock Offset 6 ____ ns 5682 tbl 11
6.42 IDT70T3509M High-Speed 2.5V 1024K x 36 Dual-Port Synchronous Static RAM Commercial Temperature Range An An + 1 An + 2 An + 3 tCYC2 tCH2 tCL2 R/W ADDRESS CE0 CLK CE 1 BEn (3) DATA OUT OE tCD2 tCKLZ Q n Q n+1 Q n+2 tOHZ tOLZ tOE 5682 drw 05 (1) (1) tSC tHC tSB tHB tSW tHW tSA tHA tDC tSC tHC tSB tHB (4) (1 Latency) (5) (5) Timing Waveform of Read Cycle for Pipelined Operation (FT/PIPE'X' = VIH)(1,2) NOTES: 1. OE is asynchronously controlled; all other inputs depicted in the above waveforms are synchronous to the rising clock edge. 2. ADS = V IL, CNTEN and REPEAT = V IH. 3. The output is disabled (High-Impedance state) by CE0 = V IH, CE 1 = V IL, BEn = V IH following the next rising edge of the clock. Refer to Truth Table 1. 4. Addresses do not have to be accessed sequentially since ADS = V IL constantly loads the address on the rising edge of the CLK; numbers are for reference use only. 5. If BEn was HIGH, then the appropriate Byte of DATA OUT for Qn + 2 would be disabled (High-Impedance state). 6. "x" denotes Left or Right port. The diagram is with respect to that port. Timing Waveform of Read Cycle for Flow -T hrough Output (FT/PIPE"X" = VIL)(1,2,6) An An + 1 An + 2 An + 3 tCYC1 tCH1 tCL1 R/W ADDRESS DATA OUT CE0 CLK OE tSC tHC tCD1 tCKLZ Qn Qn + 1 Qn + 2 tOHZ tOLZ tOE tCKHZ 5682 drw 06 (5) (1) CE 1 BEn (3) tSB tHB tSW tHW tSA tHA tDC tDC (4) tSC tHC tSB tHB
6.42 IDT70T3509M High-Speed 2.5V 1024K x 36 Dual-Port Synchronous Static RAM Commercial Temperature Range CLK "A" R/W"A ADDRESS "A" DATA IN"A" CLK "B" R/W"B" ADDRESS "B" DATA OUT"B" tSW tHW tSA tHA tSD tHD tSW tHW tSA tHA tCO (3) tCD2 NO MATCH VALID NO MATCHMATCH MATCH VALID 5682 drw 09tDC Timing Waveform of Left Port Write to Pipelined Right Port Read(1,2,4) NOTES: 1. CE0, BEn, and ADS = V IL; CE 1, CNTEN, and REPEAT = V IH. 2. OE = V IL for Port "B", which is being read from. OE = V IH for Port "A", which is being written to. 3. If t CO < minimum specified, then data from Port "B" read is not valid until following Port "B" clock cycle (ie, time from write to valid read on opposite port will be tCO + 2 t CYC2 + t CD2). If t CO > minimum, then data from Port "B" read is available on first Port "B" clock cycle (ie, time from write to valid read on opposite port will be t CO + t CYC2 + t CD2). 4. All timing is the same for Left and Right ports. Port "A" may be either Left or Right port. Port "B" is the opposite of Port "A" Timing Waveform w ith Port-to-Port Flow -T hrough Read(1,2,4) DATA IN "A" CLK "B" R/W "B" ADDRESS "A" R/W "A" CLK "A" ADDRESS "B" NO MATCHMATCH NO MATCHMATCH VALID tCD1 tDC DATA OUT "B" 5682 drw 10 VALID VALID tSW tHW tSA tHA tSD tHD tHW tCD1 tCO tDC tSA tSW tHA (3) NOTES: 1. CE0, BEn, and ADS = V IL; CE1, CNTEN, and REPEAT = V IH. 2. OE = V IL for the Right Port, which is being read from. OE = V IH for the Left Port, which is being written to. 3. If t CO < minimum specified, then data from Port "B" read is not valid until following Port "B" clock cycle (i.e., time from write to v alid read on opposite port will be tCO + t CYC + t CD1). If t CO > minimum, then data from Port "B" read is available on first Port "B" clock cycle (i.e., time from write to valid read on opposite port will be tCO + t CD1). 4. All timing is the same for both left and right ports. Port "A" may be either left or right port. Port "B" is the opposite of Port "A".
6.42 IDT70T3509M High-Speed 2.5V 1024K x 36 Dual-Port Synchronous Static RAM Commercial Temperature Range R/W ADDRESS An An +1 An + 2 An + 2 An + 3 An + 4 DATA IN Dn + 2 CE0 CLK 5682 drw 11 Qn Qn + 3DATA OUT CE 1 BEn tCD2 tCKHZ tCKLZ tCD2 tSC tHC tSB tHB tSW tHW tSA tHA tCH2 tCL2 tCYC2 READ NOP READ tSD tHD (3) (1) tSW tHW WRITE (4) Timing Waveform of Pipelined Read-to-Write-to-Read (OE = VIL)(2) NOTES: 1. Output state (High, Low, or High-impedance) is determined by the previous cycle control signals. 2. CE0, BEn, and ADS = V IL; CE 1, CNTEN, and REPEAT = V IH. "NOP" is "No Operation". 3. Addresses do not have to be accessed sequentially since ADS = V IL constantly loads the address on the rising edge of the CLK; numbers are for reference use only. 4. "NOP" is "No Operation." Data in memory at the selected address may be corrupted and should be re-written to guarantee data integrity. R/W ADDRESS An An +1 An + 2 An + 3 An + 4 An + 5 DATA IN Dn + 3Dn + 2 CE0 CLK 5682 drw 12 DATA OUT Qn Qn + 4 CE 1 BEn OE tCH2 tCL2 tCYC2 tCKLZ tCD2 tOHZ tCD2 tSD tHD READ WRITE READ tSC tHC tSB tHB tSW tHW tSA tHA (3) (1) tSW tHW (4) Timing Waveform of Pipelined Read-to-Write-to-Read ( OE Controlled)(2) NOTES: 1. Output state (High, Low, or High-impedance) is determined by the previous cycle control signals. 2. CE0, BEn, and ADS = V IL; CE 1, CNTEN, and REPEAT = V IH. 3. Addresses do not have to be accessed sequentially since ADS = V IL constantly loads the address on the rising edge of the CLK; numbers are for reference use only. 4. This timing does not meet requirements for fastest speed grade. This waveform indicates how logically it could be done if timing so allows.
6.42 IDT70T3509M High-Speed 2.5V 1024K x 36 Dual-Port Synchronous Static RAM Commercial Temperature Range Timing Waveform of Flow -T hrough Read-to-Write-to-Read (OE = VIL)(2) Timing Waveform of Flow -T hrough Read-to-Write-to-Read (OE Controlled)(2) NOTES: 1. Output state (High, Low, or High-impedance) is determined by the previous cycle control signals. 2. CE0, BEn, and ADS = V IL; CE 1, CNTEN, and REPEAT = V IH. 3. Addresses do not have to be accessed sequentially since ADS = V IL constantly loads the address on the rising edge of the CLK; numbers are for reference use only. 4. "NOP" is "No Operation." Data in memory at the selected address may be corrupted and should be re-written to guarantee data i ntegrity. R/W ADDRESS An An +1 An + 2 An + 2 An + 3 An + 4 DATA IN Dn + 2 CE0 CLK 5682 drw 13 QnDATA OUT CE 1 BEn tCD1 Qn + 1 tCH1 tCL1 tCYC1 tSD tHD tCD1 tCD1 tDC tCKHZ Qn + 3 tCD1 tDC tSC tHC tSB tHB tSW tHW tSA tHA READ NOP READ tCKLZ (3) (1) tSW tHW WRITE(5) , R/W ADDRESS An An +1 An + 2 An + 3 An + 4 An + 5(3) DATA IN Dn + 2 CE0 CLK 5682 drw 14 QnDATA OUT CE 1 BEn tCD1 tCH1 tCL1 tCYC1 tSD tHD tCD1 tDC Qn + 4 tCD1 tDC tSC tHC tSB tHB tSW tHW tSA tHA READ WRITE READ tCKLZ (1) Dn + 3 tOHZ tSW tHW OE tOE
6.42 IDT70T3509M High-Speed 2.5V 1024K x 36 Dual-Port Synchronous Static RAM Commercial Temperature Range A0- A18 An CLK DATA OUT Qx - 1(2) Qx Qn Qn + 2(2) Qn + 3 ADS CNTEN tCYC2 tCH2 tCL2 5682 drw 15a tSA tHA tSAD tHAD tCD2 tDC READ EXTERNAL ADDRESS READ WITH COUNTER COUNTER HOLD tSAD tHAD tSCN tHCN READ WITH COUNTER Qn + 1 (3) A19(3) tSA Timing Waveform of Pipelined Read w ith Address Coun ter Advance (1) NOTES: 1. CE0, OE, BEn = V IL; CE 1, R/ W, and REPEAT = V IH. 2. If there is no address change via ADS = V IL (loading a new address) or CNTEN = V IL (advancing the address), i.e. ADS = V IH and CNTEN = V IH, then the data remains constant for subsequent clocks. 3. Address A 19 must be managed as part of a full depth counter implementation using the IDT70T3509M. For physical addresses 00000 H through 7FFFF H the value of a A 19 is 0, while for physical addresses 80000 H through FFFFF H the value of A 19 is 1. The user needs to keep track of the device counter and make sure that A 19 is actively driven from 0-to-1 or 1-to-0 and held as needed at the appropriate address boundaries for full depth counter operation. As shown this transition reflects An = 7FFFF H or FFFFF H. Timing Waveform of Flow -T hrough Read w ith Address Counter Advance (1) An CLK DATA OUT Qx (2) Qn Qn + 1 Qn + 2 Qn + 3(2) Qn + 4 ADS CNTEN tCYC1 tCH1 tCL1 5682 drw 16a tSA tHA tSAD tHAD READ EXTERNAL ADDRESS READ WITH COUNTER COUNTER HOLD tCD1 tDC tSAD tHAD tSCN tHCN READ WITH COUNTER (3) A19(3) tSA A0- A18
6.42 IDT70T3509M High-Speed 2.5V 1024K x 36 Dual-Port Synchronous Static RAM Commercial Temperature Range An tCYC2 CLK DATA IN R/W REPEAT 5682 drw 18a INTERNAL (3) ADDRESS ADS CNTEN WRITE TO ADS ADDRESS An ADVANCE COUNTER WRITE TO An+1 ADVANCE COUNTER WRITE TO An+2 HOLD COUNTER WRITE TO An+2 REPEAT READ LAST ADS ADDRESS An DATA OUT tSA tHA An tSAD tHAD tSW tHW tSCN tHCN tSRPT tHRPT tSD tHD tCD1 An+1 An+2 An+2 An An+1 An+2 An+2 D 0 D 1 D 2 D 3 An An+1 An+2 An+2 ADVANCE COUNTER READ An+1 ADVANCE COUNTER READ An+2 HOLD COUNTER READ An+2 (4) (7) A19(7) tSA A0- A18 Timing Waveform of Write w ith Address Counter Advan ce (Flow -through or Pipelined Inputs)(1) Timing Waveform of Counter Repeat (2,6) An CLK DATA IN Dn Dn + 1 Dn + 1 Dn + 2 ADS CNTEN tCH2 tCL2 tCYC2 5682 drw 17a INTERNAL (3) ADDRESS An An + 1 An + 2 An + 3 An + 4 Dn + 3 Dn + 4 tSA tHA tSAD tHAD WRITE COUNTER HOLD WRITE WITH COUNTERWRITE EXTERNAL ADDRESS WRITE WITH COUNTER tSD tHD tSCN tHCN (7) (5) (5) A19(7) tSA A0- A18 NOTES: 1. CE0, BEn, and R/ W = V IL; CE 1 and REPEAT = V IH. 2. CE0, BEn = V IL; CE 1 = V IH. 3. The "Internal Address" is equal to the "External Address" when ADS = V IL and equals the counter output when ADS = V IH. 4. No dead cycle exists during REPEAT operation. A READ or WRITE cycle may be coincidental with the counter REPEAT cycle: Address loaded by last valid ADS load will be accessed. For more information on REPEAT function refer to Truth Table II. A 19 must be in the appropriate state when using the REPEAT function to guarantee the correct address location is loaded. 5. CNTEN = V IL advances Internal Address from ‘An’ to ‘An +1’. The transition shown indicates the time required for the counter to advance. The ‘An +1’Address is written to during this cycle. 6. For Pipelined Mode user should add 1 cycle latency for outputs as per timing waveform of read cycle for pipelined operations. 7. Address A 19 must be managed as part of a full depth counter implementation using the IDT70T3509M. For physical addresses 00000 H through 7FFFF H the value of a A 19 is 0, while for physical addresses 80000 H through FFFFF H the value of A 19 is 1. The user needs to keep track of the device counter and make sure that A 19 is actively driven from 0-to-1 or 1-to-0 and held as needed at the appropriate address boundaries for full depth counter operation. As shown this transition reflects An = 7FFFF H or FFFFF H.
6.42 IDT70T3509M High-Speed 2.5V 1024K x 36 Dual-Port Synchronous Static RAM Commercial Temperature Range tSW tHW FFFFF CLK R CE R (1) ADDRESS R (3) tSA tHA FFFFF tSC tHC tINR CLK L R/WL ADDRESS L(3) CE L(1) tSA tHA tSC tHC 5682 drw 19 INTR tINS R/WR tSW tHW Waveform of Interrupt Timing (2) Truth Table III - Interrupt Flag(1) Left Port Right Port FunctionCLKL R/WL(2) CEL(2) A19L-A0L INTL CLKR R/WR(2) CER(2) A19R-A0R INTR ↑ L L FFFFF X ↑ X X X L Set Right INTR Flag ↑ X XXX ↑ H L FFFFF H Reset Right INTR Flag ↑ XX X L ↑ L L FFFFE X Set Left INTL Flag ↑ H L FFFFE H ↑ XX X X R eset Left INTL Flag 5682 tbl 12 NOTES: 1. CE0 = V IL and CE 1 = V IH. 2. All timing is the same for Left and Right ports. 3. Address is for internal register, not the external bus, i.e. address needs to be qualified by one of the Address counter control signals. NOTES: 1. INTL and INTR must be initialized at power-up by Resetting the flags. 2. CE0 = V IL and CE 1 = V IH, R/ W and CE are synchronous with respect to the clock and need valid set-up and hold times. 3. Address is for internal register, not the external bus, i.e. address needs to be qualified by one of the Address counter control signals.
6.42 IDT70T3509M High-Speed 2.5V 1024K x 36 Dual-Port Synchronous Static RAM Commercial Temperature Range Timing Waveform - Entering Sleep Mode (1,2) Timing Waveform - Exiting Sleep Mode (1,2) (3) R/W DATA OUT R/W OE (4) Dn Dn+1 An+1An (5) (5) NOTES: 1. CE 1 = VIH. 2. All timing is same for Left and Right ports. 3. CE0 has to be deactivated ( CE0 = V IH) three cycles prior to asserting ZZ (ZZx = V IH) and held for two cycles after asserting ZZ (ZZx = V IH). 4. CE0 has to be deactivated ( CE0 = V IH) one cycle prior to de-asserting ZZ (ZZx = V IL) and held for three cycles after de-asserting ZZ (ZZx = V IL). 5. The device must be in Read Mode (R/ W High) when exiting sleep mode. Outputs are active but data is not valid until the following cycle.
6.42 IDT70T3509M High-Speed 2.5V 1024K x 36 Dual-Port Synchronous Static RAM Commercial Temperature Range Width Expansion The IDT70T3509M can be used in applications requiring expanded width. Through combining the control signals, the devices can be grouped as necessary to accommodate applications needing 72-bits or wider. Functional Description The IDT70T3509M provides a true synchronous Dual-Port Static RAM interface. Registered inputs provide minimal set-up and hold times on address, data, and all critical control inputs. All internal registers are clocked on the rising edge of the clock signal, however, the self-timed internal write pulse width is independent of the cycle time. An asynchronous output enable is provided to ease asyn- chronous bus interfacing. Counter enable inputs are also provided to stall the operation of the address counters for fast interleaved memory applications. The combination of a HIGH on CE0 and a LOW on CE1 for one clock cycle will power down the internal circuitry to reduce static power consumption. Multiple chip enables allow easier banking of multiple IDT70T3509Ms for depth expansion configurations. Two cycles are required with CE0 LOW and CE1 HIGH to re-activate the outputs. Sleep Mode The IDT70T3509M is equipped with an optional sleep or low power mode on both ports. The sleep mode pin on both ports is asynchronous and active high. During normal operation, the ZZ pin is pulled low. When ZZ is pulled high, the port will enter sleep mode where it will meet lowest possible power conditions. The sleep mode timing diagram shows the modes of operation: Normal Operation, No Read/Write Allowed and Sleep Mode. For normal operation all inputs must meet setup and hold times prior to sleep and after recovering from sleep. Clocks must also meet cycle high and low times during these periods. Three cycles prior to asserting ZZ (ZZx = VIH) and three cycles after de-asserting ZZ (ZZx = VIL), the device must be disabled via the chip enable pins. If a write or read operation occurs during these periods, the memory array may be corrupted. Validity of data out from the RAM cannot be guaranteed immediately after ZZ is asserted (prior to being in sleep). When exiting sleep mode, the device must be in Read mode (R/Wx = VIH)when chip enable is asserted, and the chip enable must be valid for one full cycle before a read will result in the output of valid data. During sleep mode the RAM automatically deselects itself. The RAM disconnects its internal clock buffer. The external clock may continue to run without impacting the RAMs sleep current (IZZ). All outputs will remain in high-Z state while in sleep mode. All inputs are allowed to toggle. The RAM will not be selected and will not perform any reads or writes.
Figure 2. JTAG Configuration for IDT70T3509M is available at www.idt.com. and thus cannot be treated as a single JTAG device in the scan chain. commands but must be treated as separate entities in JTAG operations.
- 30pF loading on external output signals.
- Refer to AC Electrical Test Conditions stated earlier in this document.
- JTAG operations occur at one speed (10MHz). The base device may run at
any speed specified in this datasheet. Figure 5. Standard JTAG Timing
- Device inputs = All device inputs except TDI, TMS, and TRST.
- Device outputs = All device outputs except TDO.
6.42 IDT70T3509M High-Speed 2.5V 1024K x 36 Dual-Port Synchronous Static RAM Commercial Temperature Range Identification Register Definitions Instruction Field Array D Value Array D Instruction Field Array C Value Array C Instruction Field Array B Value Array B Instruction Field Array A Value Array A Description Revision Number (31:28) 0x0 Revision Number (63:60) 0x0 Revision Number (95:92) 0x0 Revision Number (127:124) 0x0 Reserved for Version number IDT Device ID (27:12) 0x333 IDT Device ID (59:44) 0x333 IDT Device ID (91:76) 0x333 IDT Device ID (123:108) 0x333 Defines IDT Part numb er IDT JEDEC ID (11:1) 0x33 IDT JEDEC ID (43:33) 0x33 IDT JEDEC ID (75:65) 0x33 IDT J EDEC ID (107:97) 0x33 Allows unique identification of device vendor as IDT ID Register Indicator Bit (Bit 0) 1 ID Register Indicator Bit (Bit 32) 1 ID Register Indicator Bit (Bit 64) 1 ID Register Indicator Bit (B it 96) 1 Indicates the presence of an ID Register 5682 tbl 16 Scan Register Sizes System Interface Parameters NOTES: 1. Device outputs = All device outputs except TDO. 2. Device inputs = All device inputs except TDI, TMS, and TRST. 3. The Boundary Scan Descriptive Language (BSDL) file for this device is available on the IDT website (www.idt.com), or by contacting your local IDT sales representative. Register Name Bit Size Array A Bit Size Array B Bit Size Array C Bit Size Array D Bit Size 70T3509M Instruction (IR) 4 4 4 4 16 Bypass (BYR) 1 1 1 1 4 Identification (IDR) 32 32 32 32 128 Boundary Scan (BSR) Note (3) Note (3) Note (3) Note (3) Note (3) 5682 tbl 17 Instruction Code Description EXTEST 0000000000000000 Forces contents of the boundary scan cells onto the d evice outputs(1). Places the boundary scan register (BSR) between T DI and T DO. BYPASS 1111111111111111 Place s the b yp ass re g iste r (BYR) b e twe e n TDI an d TDO. IDCODE 0010001000100010 Loads the ID register (IDR) with the vendor I D code and places the register between T DI and T DO. HIGHZ 0100010001000100 Places the bypass register (BYR) between T DI and T DO. For ces all device output drivers except INTx to a High-Z state. CLAMP 0011001100110011 Uses BYR. Forces contents of the boundary scan cells onto the device outputs. Places the bypass register (BYR) between TDI and T DO. SAMPLE/PRELOAD 0001000100010001 Places the boundary scan register (BSR) betwee n TDI and TDO. SAMPLE allows data from device inputs (2) to be captured in the boundary scan cells and shifted serially through TDO. PRELOAD allows data to be input serially into the boundary scan cells via the T DI. RESERVED 0101010101010101, 0111011101110111, 1000100010001000, 1001100110011001, 1010101010101010, 1011101110111011, 1100110011001100 Several combinations are reserved. Do not use codes other than those identified above. PRIVATE 0110011001100110,1110111011101110, 1101110111011101 For internal use only. 5682 tbl 18
6.42 IDT70T3509M High-Speed 2.5V 1024K x 36 Dual-Port Synchronous Static RAM Commercial Temperature Range
Ordering Information
Datasheet Document History: 11/09/04: Initial Public Release of Preliminary Datasheet 03/24/05: Page 1 Added I-temp offering to features Page 6 Added I-temp information to the Recommended Operating Temperature and Supply Voltage table Page 8 Added I-temp values to the DC Electrical Characteristics table Page 10 Added I-temp to the heading of the AC Electrical Characteristics table Page 23 Added I-temp to ordering information Page 1 Added green availability to features Page 1 - 23 Removed Preliminary status 06/14/05: Page 1 Added feature to highlight footprint compatibility Page 3 & 23 Added a footnote to highlight package thickness of BP-256 vs. BC-256 08/27/07: Page 1 Functional Block Diagram changed to correct chip enable logic and added footnote 2 referencing Truth Table I 07/28/08: Page 8 Corrected a typo in the DC Chars table 01/19/09: Page 23 Removed "IDT" from orderable part number 07/15/14: Page 23 Added Tape & Reel to Ordering Information Page 23 Ordering Information restored from 70T3719_99 to 70T3509M Product Discontinuation Notice - PDN# SP-17-02 Last time buy expires June 15, 2018 NOTES: 1. Contact your local sales office for Industrial temp range in other speeds, packages and powers. 2. Green parts available. For specific speeds, packages and powers contact your local sales office. LEAD FINISH (SnPb) parts are in EOL process. Product Discontinuation Notice - PDN# SP-17-02 The IDT logo is a registered trademark of Integrated Device Technology, Inc. CORPORATE HEADQUARTERS for SALES: for Tech Support:
6024 Silver Creek Valley Road 800-345-7015 or 408-284-8200 408-284-2794
San Jose, CA 95138 fax: 408-284-2775 DualPortHelp@idt.com www.idt.com A Power 999 Speed A Package A Process/ Temperature Range XXXXX Device Type Blank I(1) BP (3) 133 70T3509M S Commercial (0°C to +70°C) Industrial (-40°C to +85°C) 256-pin BGA (BP-256) 36Mbit (1024K x 36) 2.5V Synchronous Dual-Port RAM Standard Power Speed in MegahertzCommercial and Industrial 5682 drw 26 A G (2) Green Blank Tube or Tray Tape and Reel A 02/14/18: