5962-00515 AD | Alldatasheet

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LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Drawing updated to reflect current requirements. - gt 02-04-24 R. MONNIN B Add radiation hardness assurance requirements. - rrp 02-07-29 R. MONNIN C Five year review requirement. - ro 07-10-02 R. HEBER D Add device type 02 tested at low dose rate. Make change to paragraphs 1.2.2 and 1.5. Make changes to footnotes 1/ and 2/ as specified under 12-05-31 C. SAFFLE E Update drawing to current MIL-PRF-38535 requirements. Remove class M references. -rrp 17-11-13 C. SAFFLE F Drawing updated to reflect current MIL-PRF-38535 requirements. -rrp 24-02-21 J. ESCHMEYER R E V S H E E T R E V S H E E T REV STATUS REV F F F F F F F F F F F F OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY RAJESH PITHADIA DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 https://www.dla.mil/LandandMaritime STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY RAJESH PITHADIA APPROVED BY RAYMOND MONNIN MICROCIRCUIT, LINEAR, SINGLE, ULTRAFAST COMPARATOR, MONOLITHIC SILICON DRAWING APPROVAL DATE 00-04-06 AMSC N/A REVISION LEVEL F SIZE A CAGE CODE 67268 5962-00515 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E200-24 DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited.

A 5962-00515 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance cla ss levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as s hown in the following example:

5962 R 00515 01 V H A

(see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) \\ / (see 1.2.3) Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function

01 AD8561A Ultrafast single supply comparator

02 AD8561A Ultrafast single supply comparator

1.2.3 Device class designator. The device class designato r is a single letter identifying the product assurance level as follows: Device class Device requirements documentation Q or V Certification and qua lification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style H GDFP1-F10 or CDFP2-F10 10 Flat pack P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V.

A 5962-00515 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Thermal resistance, junction-to-ambient ( JA): 1.4 Recommended operating conditions. Ambient operating temperature (T

1.5 Radiation features:

Device type 01: Device type 02: 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Device type 01, may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A. 3/ For device type 02, radiation end poin t limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition D.

A 5962-00515 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Met hod Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https://quicksearch.dla.mil). 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requiremen ts for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 3.2 Design, construction, and physical dimensions. The desig n, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics and postirradiat ion parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requi rements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. 3.5.1 Certification/compliance mark. T he certification mark for device classes Q and V shall be a "QML" or "Q" as required in MIL-PRF-38535.

A 5962-00515 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ unless otherwise specified Group A subgroups Device type Limits Unit Min Max V+ = +5 V, V- = VGND = 0 V section Input offset voltage 3/ VOS 1 All 7 mV 2, 3 8 Input bias current 3/ IB V CM = 0 V 1 All -6 A 2, 3 -7 Input offset current 3/ IOS V CM = 0 V 1, 2, 3 All +4 A Input voltage range 3/ IVR V+ = 5 V, V- = 0 V 1 All 0 +3 V Common mode rejection 3/ ratio CMRR VCM = IVR 1 All 65 dB Logic "1" input voltage 3/ VIH 1 All 2 V Logic "0" input voltage 3/ VIL 1 All 0.8 V Logic "1" current 3/ IIH V IH = 3 V 1 All -1 A Logic "0" input current 3/ IIL V IL = 0.3 V 1 All -4 A Logic "1" output voltage 3/ VOH IOH = -50 A, VIN  250 mV, 1 All 3.5 V IOH = -3.2 mA, VIN  250 mV 1 2.4 Logic "0" output voltage 3/ VOL IOL = 3.2 mA, VIN  250 mV 1 All 0.4 V Power supply rejection 3/ ratio PSRR V+ = 4.5 V to +5.5 V 1, 2, 3 All 50 dB Positive supply current 3/ I+ 1 All 6.0 mA 2, 3 7.5 Ground supply current 3/ IGND VOUT = 0 V, RL =  1 All 3.3 mA 2, 3 3.8 Analog supply current 3/ I- 1 All 4.5 mA 2, 3 5.5 Propagation delay 3/ tP 200 mV step with 100 mV overdrive 9 All 9.8 ns See footnotes at end of table.

A 5962-00515 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics – Continued. Test Symbol Conditions 1/ 2/ unless otherwise specified Group A subgroups Device type Limits Unit Min Max V+ = +5 V, V- = -5 V, VGND = 0 V section Input offset voltage VOS 1 All 7 mV 2, 3 8 M,D,P,L,R 1 01 10 M,D,P,L 1 02 10 Input bias current IB V CM = 0 V 1 All -6 A 2, 3 -7 M,D,P,L,R 1 01 -7 M,D,P,L 1 02 -7 Input offset current IOS V CM = 0 V 1, 2, 3 All +4 A M,D,P,L,R 1 01 +4  M,D,P,L 1 02 +4  Input voltage range 3/ IVR 1 All -5.0 +3.0 V Common mode rejection 3/ ratio CMRR VCM = IVR 1 All 65 dB Logic "1" input voltage 3/ VIH 1 All 2.0 V Logic "0" input voltage 3/ VIL 1 All 0.8 V Logic "1" current 3/ IIH V IH = 3 V 1 All -1 20 A Logic "0" input current 3/ IIL V IL = 0.3 V 1 All -4 20 A Logic "1" output voltage 3/ VOH IOH = -3.2 mA, VIN  250 mV 1 All 2.6 V Logic "0" output voltage 3/ VOL IOL = 3.2 mA, VIN  250 mV 1 All 0.3 V Power supply rejection 3/ ratio PSRR VS = ±4.5 V to ±5.5 V 1 All 55 dB See footnotes at end of table.

A 5962-00515 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics – Continued. Test Symbol Conditions 1/ 2/ unless otherwise specified Group A subgroups Device type Limits Unit Min Max V+ = +5 V, V- = -5 V, VGND = 0 V section – continued. Positive supply current I+ 1 All 6.5 mA 2, 3 7.5 M,D,P,L,R 1 01 7.0 M,D,P,L 1 02 7.0 Ground supply current IGND VOUT = 0 V, RL =  1 All 3.3 mA 2, 3 3.8 M,D,P,L,R 1 01 3.5 M,D,P,L 1 02 3.5 Analog supply current I- 1 All 4.5 mA 2, 3 5.5 M,D,P,L,R 1 01 5.0 M,D,P,L 1 02 5.0 Propagation delay 3/ tP 200 mV step with 100 mV overdrive 9 All 9.8 ns V+ = 3 V, V- = VGND = 0 V section Input offset voltage 3/ VOS 1 All 7 mV Input bias current 3/ IB V CM = 0 V 1 All -6 A 2, 3 -7 Input voltage range 3/ IVR 1 All 0 1.5 V Common mode rejection 3/ ratio CMRR 0.1 V  VCM  1.5 V 1 All 60 dB Logic "1" output 3/ 4/ voltage VOH IOH = -3.2 mA, VIN  250 mV 1 All 1.2 V Logic "0" output voltage 3/ VOL IOL= 3.2 mA, VIN  250 mV 1 All 0.3 V See footnotes at end of table.

A 5962-00515 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics – Continued. Test Symbol Conditions 1/ 2/ unless otherwise specified Group A subgroups Device type Limits Unit Min Max V+ = 3 V, V- = VGND = 0 V section – continued. Positive supply current 3/ I+ 1 All 4.5 mA 2, 3 5.5 Ground supply current 3/ IGND VOUT = 0 V, RL =  1 All 2.5 mA 2, 3 3.0 Analog supply current 3/ I- 1 All 3.3 mA 1/ Device type 01 supplied to this drawing has been charac terized through all levels P, L, and R of irradiation. Device type 02 supplied to this drawing has been characterized at level L of irradiation. However, device type 01 is only tested at the “R” level and device type 02 is only tested at the “L” level. Pre and Post irradiation values are identical unless other wise specified in table I. When performing post irradiation electrical measurement for any RHA level, TA = +25C. 2/ Device type 01 may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted param eters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A for device ty pe 01 and condition D for device type 02. Device type 02 has been tested at low dose rate. 3/ This parameter is not tested post irradiation. 4/ Output high voltage without pull-up resistor. It may be useful to have a pull-up resistor to V+ for 3 V operation. 3.6 Certificate of complianc e. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein. 3.7 Certificate of conf ormance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 shall be provided with each lot of microcircuits delivered to this drawing.

1 NC V+

2 V+ +IN

5 V- LATCH

6 LATCH GND

7 GND OUT

8 OUT OUT

9 OUT ----

10 NC ----

FIGURE 1. Terminal connections.

A 5962-00515 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sa mpling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. For device classes Q and V, screening sha ll be in accordance with MIL-PRF-38535 and shall be conducted on all devices prior to qualification and technology conformance inspection. 4.2.1 Additional criteria for device classes Q and V. a. The burn-in test shall be performed in accordance with me thod 1015 of MIL-STD-883. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. b. Interim and final electrical test parameter s shall be as specified in table IIA herein. c. Additional screening for device class V beyond the requirem ents of device class Q shall be as specified in MIL-PRF- 38535, appendix B. 4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups 4.4 Conformance inspection. Technology conformance in spection for classes Q and V shall be in accordance with MIL-PRF-38535 including groups A, B, C, D, and E inspections, and as specified herein. 4.4.1 Group A inspection. a. Tests shall be as specif ied in table IIA herein. b. Subgroups 4, 5, 6, 7, 8, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.4.2 Group C inspection. The group C in spection end-point electrical parameters shall be as specified in table IIA herein. 4.4.2.1 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. 4.4.3 Group D inspection. The group D in spection end-point electrical parameters shall be as specified in table IIA herein.

A 5962-00515 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET DSCC FORM 2234 APR 97 Test requirements Subgroups (in accordance with MIL-PRF-38535, table III) Device class Q Device class V Interim electrical parameters (see 4.2) 1 1 Final electrical parameters (see 4.2) Group A test requirements (see 4.4) 1,2,3,9 1,2,3,9 Group C end-point electrical parameters (see 4.4) 1 1 2/ Group D end-point electrical parameters (see 4.4) 1 1 Group E end-point electrical parameters (see 4.4) 1 1 1/ PDA applies to subgroup 1. 2/ Delta limits as specified in table IIB shall be required where specified, and delta limits shall be computed with reference to the previous endpoint electrical parameters. TABLE IIB. 240 hour burn-in and group C end-point electrical parameters. Parameter Limit Delta 1/ Unit Min Max Min Max VOS -7 +7 -1 +1 mV IOS -4 +4 -1 +1 A 1/ Delta limits apply to 5 V condition. 4.4.4 Group E inspection. Group E inspection is required onl y for parts intended to be marked as radiation hardness assured (see 3.5 herein). a. End-point electrical parameters shall be as specified in table IIA herein. b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as specified in MIL-PRF-38535 for the RHA level being tested. All device classes must meet the post irradiation end-point electrical parameter limits as defined in table IA at TA = +25C 5C, after exposure, to the subgroups specified in table IIA herein. 4.4.4.1 Total dose irradiation testi ng. Total dose irradiation testing shall be performed in accordance with MIL-STD-883 method 1019, condition A for device type 01, condition D for device type 02, and as specified herein.

A 5962-00515 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET DSCC FORM 2234 APR 97 5. PACKAGING 5.1 Packaging requirements. The requi rements for packaging shall be in accordance with MIL-PRF-38535 for device classes Q and V. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawi ng are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.1.1 Replaceability. Microcircuits covered by this draw ing will replace the same generic device covered by a contractor prepared specification or drawing. 6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal, or email communication. 6.3 Record of users. Military and in dustrial users should inform DLA Land and Maritime when a system application requires configuration control and which SMD's are applicable to that system. DLA Land and Maritime will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962) should contact DLA Land and Maritime-VA, telephone (614) 692-8108. 6.4 Comments. Comments on this drawing should be dire cted to DLA Land and Maritime-VA, Columbus, Ohio 43218-3990, or telephone (614) 692-0591. 6.5 Abbreviations, symbols, and definitions. The abbrevia tions, symbols, and definitions used herein are defined in MIL-PRF-38535 and MIL-HDBK-1331. 6.6 Sources of supply. 6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in MIL-HDBK-103 and QML-38535. The vendors listed in MIL-HDBK-103 and QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DLA Land and Maritime-VA and have agreed to this drawing.

STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 24-02-21 Approved sources of supply for SMD 5962-00515 are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DLA Land and Maritime-VA. This information bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DLA Land and Maritime maintains an online database of all current sources of supply at https://landandmaritimeapps.dla.mil/programs/smcr/. Standard microcircuit drawing PIN 1/ Vendor CAGE number Vendor similar PIN 2/ 5962-0051501VHA 3/ AD8561AL/QMLV 5962-0051501VPA 243 55 AD8561AQ/QMLV 5962R0051501VHA 24355 AD8561AL/QMLR 5962R0051501VPA 243 55 AD8561AQ/QMLR 5962L0051502VHA 24355 AD8561AL/QMLL 1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. If the desired lead finish is not listed contact the vendor to determine its availability. 2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. 3/ Not available from an approved source of supply. Vendor CAGE Vendor name number and address

24355 Analog Devices

P.O. Box 9106 Norwood, MA 02062 Point of contact: 804 Woburn Street Wilmington, MA 01887-3462 The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin.