54FCT244 NSC | Alldatasheet

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Features

n Output sink capability of 48 mA, source capability of 12 mA n TRI-STATE outputs drive lines or buffer memory address registers n TTL input and output level compatible n CMOS power consumption n Standard Microcircuit Drawing (SMD) 5962-8763001 Ordering Code Military Package Package Description Number 54FCT244DMQB J20A 20-Lead Ceramic Dual-In-Line 54FCT244FMQB W20A 20-Lead Cerpack 54FCT244LMQB E20A 20-Lead Ceramic Leadless Chip Carrier, Type C Connection Diagrams Pin Names

Description

OE 1,O E2 Output Enable Input (Active Low) I0–I7 Inputs O 0–O 7 Outputs OE 1 I0–3 O 0–3 OE 2 I4–7 O 4–7 HXZHXZ LH HLH H LL LLL L H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial Z = High Impedance TRI-STATE® is a registered trademark of National Semiconductor Corporation. Pin Assignment for DIP and Flatpak DS100967-1 Pin Assignment for LCC DS100967-2 September 1998 54FCT244 Octal Buffer/Line Driver with TRI-STATE Outputs © 1999 National Semiconductor Corporation DS100967 www.national.com

Absolute Maximum Ratings(Note 1) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Storage Temperature −65˚C to +150˚C Ambient Temperature under Bias −55˚C to +125˚C Junction Temperature under Bias Ceramic −55˚C to +175˚C V CC Pin Potential to Ground Pin −0.5V to +7.0V Input Voltage (Note 2) −0.5V to +7.0V Input Current (Note 2) −30 mA to +5.0 mA Voltage Applied to Any Output in the Disabled or Power-Off State −0.5V to 5.5V in the HIGH State −0.5V to V CC Current Applied to Output in LOW State (Max) twice the rated I OL (mA) DC Latchup Source Current −500 mA Recommended Operating Conditions Free Air Ambient Temperature Military −55˚C to +125˚C Supply Voltage Military +4.5V to +5.5V Minimum Input Edge Rate ( ΔV/Δt) Data Input 50 mV/ns Enable Input 20 mV/ns Symbol Parameter FCT244 Units V CC Conditions Min Max VIH Input HIGH Voltage 2.0 V Recognized HIGH Signal VIL Input LOW Voltage 0.8 V Recognized LOW Signal VCD Input Clamp Diode Voltage −1.2 V Min I IN = −18 mA VOH Output HIGH Voltage 54FCT 4.3 V Min IOH = −300 µA 54FCT 2.4 I OH = −12 mA VOL Output LOW Voltage 54FCT 0.2 V Min I OL = 300 µA 54FCT 0.55 I OL = 48 mA IIH Input HIGH Current 5 µA Max V IN = VCC IIL Input LOW Current −5 µA Max V IN = 0.0V IOZ Maximum TRI-STATE Current HIGH or LOW ±10 µA Max V IN = 0.0V or VIN =V CC IOS Output Short-Circuit Current -60 mA Max V OUT = 0.0V ICCQ Quiescent Power Supply Current 1.5 mA Max V IN < 0.2V or VIN 5.3V, VCC = 5.5V ΔICC Quiescent Power Supply Current 2.0 mA Max V I = 3.4V, VCC = 5.5V ICCD Dynamic ICC 0.4 mA/ MHz Max Outputs Open, V CC = 5.5V, VIN 5.3V or VIN < 0.2V, One Bit Toggling, 50% Duty Cycle, OE= GND, LE = VCC ICCT Total Power Supply Current 6.0 mA Max Outputs Open, f CP = 10 MHz, VCC = 5.5V, VIN 5.3V or VIN < 0.2V, One Bit Toggling, 50% Duty Cycle, OE= GND, LE = VCC Note 1:Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2:Either voltage limit or current limit is sufficient to protect inputs. Note 3:All outputs loaded; thresholds on input associated with output under test. Note 4:Maximum test duration 2.0 ms, one output loaded at a time. 54FCT244 www.national.com 2

Symbol Parameter 54FCT Units Fig. No.TA = −55˚C to +125˚C VCC = 4.5V–5.5V C L = 50 pF Min Max tPLH Propagation Delay 1.5 7.5 ns tPHL Data to Outputs 1.5 7.5 tPZH Output Enable 1.5 10.5 ns tPZL Time 1.5 10.5 tPHZ Output Disable 1.5 8.0 ns tPLZ Time 1.5 8.0 Capacitance Symbol Parameter Max Units Conditions TA = 25˚C C IN Input Capacitance 10.0 pF V CC = 0V C OUT (Note 5) Output Capacitance 12.0 pF V CC = 5.0V Note 5:C OUT is measured at frequency f= 1 MHz, per MIL-STD-883B, Method 3012. 54FCT244 www.national.com3

Physical Dimensionsinches (millimeters) unless otherwise noted 20-Terminal Ceramic Chip Carrier (L) 20-Lead Ceramic Dual-In-Line (D) 54FCT244 www.national.com 4

Physical Dimensionsinches (millimeters) unless otherwise noted (Continued) LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. National Semiconductor Corporation Americas Tel: 1-800-272-9959 Fax: 1-800-737-7018 Email: support@nsc.com National Semiconductor Europe Fax: +49 (0) 1 80-530 85 86 Email: europe.support@nsc.com Deutsch Tel: +49 (0) 1 80-530 85 85 English Tel: +49 (0) 1 80-532 78 32 Français Tel: +49 (0) 1 80-532 93 58 Italiano Tel: +49 (0) 1 80-534 16 80 National Semiconductor Asia Pacific Customer Response Group Tel: 65-2544466 Fax: 65-2504466 Email: sea.support@nsc.com National Semiconductor Japan Ltd. Tel: 81-3-5639-7560 Fax: 81-3-5639-7507 www.national.com 20-Lead Ceramic Flatpak (F) 54FCT244 Octal Buffer/Line Driver with TRI-STATE Outputs National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.