54AC00

54AC00 NSC | Alldatasheet

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n ICC reduced by 50% n Outputs source/sink 24 mA n ’ACT00 has TTL-compatible inputs n Standard Microcircuit Drawing (SMD) — ’AC00: 5962-87549 — ’ACT00: 5962-87699 n 54AC00 now qualified to 300Krad RHA designation, refer to the SMD for more information Logic Symbol IEEE/IEC 10025701 Pin Names Description An,B n Inputs On Outputs Connection Diagrams Pin Assignment for DIP and Flatpak Pin Assignment for LCC 10025703 10025702 FACT® is a registered trademark of Fairchild Semiconductor Corporation. July 2003 54AC00/54ACT00 Quad 2-Input NAND Gate © 2003 National Semiconductor Corporation DS100257 www.national.com

Absolute Maximum Ratings (Note 1) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Supply Voltage (V CC) −0.5V to +7.0V DC Input Diode Current (I IK) VI = −0.5V −20 mA VI =V CC + 0.5V +20 mA DC Input Voltage (VI) −0.5V to V CC + 0.5V DC Output Diode Current (I OK) VO = −0.5V −20 mA VO =V CC + 0.5V +20 mA DC Output Voltage (VO) −0.5V to V CC + 0.5V DC Output Source or Sink Current (I O) ±50 mA DC VCC or Ground Current per Output Pin (I CC or IGND) ±50 mA Storage Temperature (TSTG) −65˚C to +150˚C Junction Temperature (TJ) CDIP 175˚C Recommended Operating Conditions Supply Voltage (VCC) ’AC 2.0V to 6.0V ’ACT 4.5V to 5.5V Input Voltage (V I) 0 Vt oV CC Output Voltage (VO) 0 Vt oV CC Operating Temperature (TA) 54AC/ACT −55˚C to +125˚C Minimum Input Edge Rate ( ∆V/∆t) ’AC Devices V IN from 30% to 70% of V CC VCC @ 3.3V, 4.5V, 5.5V 125 mV/ns Minimum Input Edge Rate ( ∆V/∆t) ’ACT Devices V IN from 0.8V to 2.0V VCC @ 4.5V, 5.5V 125 mV/ns Note 1: Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. National does not recom- mend operation of FACT ® circuits outside databook specifications. DC Characteristics for ’AC Family Devices 54AC Symbol Parameter V CC TA = Units Conditions (V) −55˚C to +125˚C Guaranteed Limits VIH Minimum High Level 3.0 2.1 V OUT = 0.1V Input Voltage 4.5 3.15 V or V CC − 0.1V 5.5 3.85 VIL Maximum Low Level 3.0 0.9 V OUT = 0.1V Input Voltage 4.5 1.35 V or V CC − 0.1V 5.5 1.65 VOH Minimum High Level 3.0 2.9 I OUT = −50 µA Output Voltage 4.5 4.4 V 5.5 5.4 (Note 2) VIN =V IL or VIH 3.0 2.4 I OH = −12 mA 4.5 3.7 V I OH = −24 mA 5.5 4.7 I OH = −24 mA VOL Maximum Low Level 3.0 0.1 I OUT =5 0µ A Output Voltage 4.5 0.1 V 5.5 0.1 (Note 2) VIN =V IL or VIH 3.0 0.5 I OL =1 2m A 4.5 0.5 V I OL =2 4m A 5.5 0.5 I OL =2 4m A IIN Maximum Input 5.5 ±1.0 µA V I =V CC, GND Leakage Current 54AC00/54ACT00 www.national.com 2

DC Characteristics for ’AC Family Devices (Continued) 54AC Symbol Parameter V CC TA = Units Conditions (V) −55˚C to +125˚C Guaranteed Limits IOLD Minimum Dynamic Output Current (Note 4) 5.5 50 mA V OLD = 1.65V Max IOHD 5.5 −50 mA V OHD = 3.85V Min ICC Maximum Quiescent 5.5 40.0 µA V IN =V CC Supply Current or GND Note 2: All outputs loaded; thresholds on input associated with output under test. Note 3: IIN and ICC @ 3.0V are guaranteed to be less than or equal to the respective limit @ 5.5V VCC. ICC for 54AC @ 25˚C is identical to 74AC @ 25˚C. Note 4: Maximum test duration 2.0 ms, one output loaded at a time. Note 5: IIN and ICC @ 3.0V are guaranteed to be less than or equal to the respective limit @ 5.5V VCC. ICC for 54AC @ 25˚C is identical to 74AC @ 25˚C. DC Characteristics for ’ACT Family Devices 54ACT Symbol Parameter V CC TA = Units Conditions (V) −55˚C to +125˚C Guaranteed Limits VIH Minimum High Level 4.5 2.0 V V OUT = 0.1V Input Voltage 5.5 2.0 or V CC − 0.1V VIL Maximum Low Level 4.5 0.8 V V OUT = 0.1V Input Voltage 5.5 0.8 or V CC − 0.1V VOH Minimum High Level 4.5 4.4 V I OUT = −50 µA Output Voltage 5.5 5.4 (Note 6) VIN =V IL or VIH 4.5 3.70 V I OH = −24 mA 5.5 4.70 I OH = −24 mA VOL Maximum Low Level 4.5 0.1 V I OUT =5 0µ A Output Voltage 5.5 0.1 (Note 6) VIN =V IL or VIH 4.5 0.50 V I OL =2 4m A 5.5 0.50 I OL =2 4m A IIN Maximum Input 5.5 ±1.0 µA V I =V CC, GND Leakage Current ICCT Maximum 5.5 1.6 mA V I =V CC − 2.1V ICC/Input IOLD Minimum Dynamic Output Current (Note 7) 5.5 50 mA V OLD = 1.65V Max IOHD 5.5 −50 mA V OHD = 3.85V Min ICC Maximum Quiescent 5.5 40.0 µA V IN =V CC Supply Current or GND Note 6: All outputs loaded; thresholds on input associated with output under test. Note 7: Maximum test duration 2.0 ms, one output loaded at a time. Note 8: ICC for 54ACT @ 25˚C is identical to 74ACT @ 25˚C. 54AC00/54ACT00 www.national.com3

VCC TA = −55˚C Fig. Symbol Parameter (V) to +125˚C Units No. (Note 9) CL =5 0p F Min Max tPLH Propagation Delay 3.3 1.0 11.0 ns 5.0 1.5 8.5 tPHL Propagation Delay 3.3 1.0 9.0 ns 5.0 1.5 7.0 Note 9: Voltage Range 3.3 is 3.3V ±0.3V Voltage Range 5.0 is 5.0V ±0.5V 54ACT VCC TA = −55˚C Fig. Symbol Parameter (V) to +125˚C Units No. (Note 10) CL =5 0p F Min Max tPLH Propagation Delay 5.0 1.5 9.5 ns tPHL Propagation Delay 5.0 1.5 8.0 ns Note 10: Voltage Range 5.0 is 5.0V ±0.5V Capacitance Symbol Parameter Typ Units Conditions CIN Input Capacitance 4.5 pF V CC = Open CPD Power Dissipation 30.0 pF V CC = 5.0V Capacitance 54AC00/54ACT00 www.national.com 4

Physical Dimensions inches (millimeters) unless otherwise noted

20 Terminal Ceramic Leadless Chip Carrier (L)

14 Lead Ceramic Dual-In-Line Package (D)

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Physical Dimensions inches (millimeters) unless otherwise noted (Continued)

14 Lead Ceramic Flatpak (F)

NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. National Semiconductor Americas Customer Support Center Email: new.feedback@nsc.com Tel: 1-800-272-9959 National Semiconductor Europe Customer Support Center Fax: +49 (0) 180-530 85 86 Email: europe.support@nsc.com Deutsch Tel: +49 (0) 69 9508 6208 English Tel: +44 (0) 870 24 0 2171 Français Tel: +33 (0) 1 41 91 8790 National Semiconductor Asia Pacific Customer Support Center Email: ap.support@nsc.com National Semiconductor Japan Customer Support Center Fax: 81-3-5639-7507 Email: jpn.feedback@nsc.com Tel: 81-3-5639-7560 www.national.com 54AC00/54ACT00 Quad 2-Input NAND Gate National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the righ t at any time without notice to change said circuitry and specifications.