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SEIKO NPC CORPORATION —1 0.8V operation Crystal Oscillator Module ICs OVERVIEW The WF5028 series are miniature crystal oscillator module ICs. The devices are fabricated using a proprietary low voltage process, enabling 0.8V operation. The pad layouts are selective from 3 types depending on pack- age structures, mounting methods, which are suitable for miniature crystal oscillators. The WF5028 series can be used to realize ultra miniature, ultra low voltage crystal oscillators.
FEATURES
I Wide range of operating supply voltage: 0.8 to 2.0V I Optimized low crystal drive current oscillation for miniature crystal units I 3 pad layout options for mounting
- WF5028A series: for Flip Chip Bonding
- CF5028B series: for Wire Bonding (type I)
- CF5028C series: for Wire Bonding (type II) I Recommended oscillation frequency range: 20MHz to 50MHz I Multi-stage frequency divider for low-frequency output support: 0.75MHz (min) I Frequency divider built-in
- Selectable by version: f O , f O /2, f O /4, f O /8, f O /16, f O /32, f O /64 I 40 to 85 C operating temperature range I Standby function
- High impedance in standby mode, oscillator stops I CMOS output duty level (1/2VDD) I 50 ± 5% output duty I 15pF output drive capability I Wafer form (WF5028 Chip form (CF5028
APPLICATIONS
I 3.2 2.5, 2.5 2.0, 2.0 1.6 size miniature crystal oscillator modules
ORDERING INFORMATION
–4 Wafer form CF5028 –4 Chip form
SEIKO NPC CORPORATION —2 SERIES CONFIGURATION VERSION NAME Version *1. Chip form devices have designation CF5028 Operating supply voltage range [V] Oscillation mode Recommended oscillation frequency range [MHz] *2. The recommended oscillation frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillation frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting condi- tions, so the oscillation characteristics of components must be carefully evaluated. Output frequency Output drive capability [mA] DD = 1.2V) Standby mode Oscillator stop function Output state WF5028 0.8 to 2.0 Fundamental 20 to 50 f O (oscillation frequency) ± 3 Y es Hi-Z WF5028 O WF5028 O WF5028 O WF5028 O /16 WF5028 O /32 WF5028 O /64 Device Package Version name WF5028 –4 Wafer form CF5028 –4 Chip form WF5028 −4 Frequency divider function Pad layout type Form A: for Flip Chip Bonding B: for Wire Bonding (type I) C: for Wire Bonding (type II) WF: Wafer form CF: Chip (Die) form
SEIKO NPC CORPORATION —3 PAD LAYOUT (Unit: µ PAD DIMENSIONS PIN DESCRIPTION BLOCK DIAGRAM I WF5028A (for Flip Chip Bonding) I CF5028B (for Wire Bonding (type I)) I CF5028C (for Wire Bonding (type II)) Chip size: 0.75 0.69mm Chip thickness: 130 ± 15µm PAD size: 90µm Chip base: V SS level Chip size: 0.75 0.69mm Chip thickness: 130 ± 15µm PAD size: 90µm Chip base: V SS level Chip size: 0.75 0.69mm Chip thickness: 130 ± 15µm PAD size: 90µm Chip base: V SS level Pad No. Pad dimensions [µm] Pad No. Pin Name Description X Y 5028A 5028B 5028C 1 229 114 1 2 1 XT Amplifier input Crystal connection pins. Crystal is connected between XT and XTN.2 520 114 2 1 2 XTN Amplifier output 3 636 304 3 6 5 VDD (+) supply voltage – 4 636 531 4 5 4 Q Output Output frequency determined by internal circuit to one of f O , f O /2, f O /4, f O /8, f O /16, f O /32, f O /64 5 114 531 5 4 3 VSS (–) ground – 6 114 304 6 3 6 INHN Output state control input High impedance when LOW (oscillator stops). Power-saving pull-up resistor built-in. Q VDD XTN VSS (0,0) (750,690) X Y INHN XT VSS INHN XT Q (0,0) (750,690) X Y VDD XTN Q VSS XTN VDD (0,0) (750,690) X Y INHN XT XT INHN XTN QCMOS RD CG VSS VDD CD RF DIVIDER
the trimming of internal trimming fuses. These chips are fabricated using the mask corresponding to the ordered version, and do not require trimming. Mask-fabricated versions are identified externally by the version name marking (1) only. versions is shown in table 2. Table 1. Version and trimming fuses
Table 2. Version identification by version name and chip markings
SEIKO NPC CORPORATION —6 SPECIFICATIONS Absolute Maximum Ratings VSS = 0V Recommended Operating Conditions VSS = 0V Parameter Symbol Condition Rating Unit Supply voltage range VDD Between VDD and VSS −0.5 to +4.0 V Input voltage range VIN Input pins −0.5 to VDD + 0.5 V Output voltage range VOUT Output pins −0.5 to VDD + 0.5 V Storage temperature range T STG Wafer form −65 to +150 °C Output current I OUT Q pin ± 20 mA Parameter Symbol Condition Rating Unit min typ max Operating supply voltage VDD CL ≤ 15pF 0.8 – 2.0 V Input voltage VIN Input pins VSS –V DD V Operating temperature T OPR −40 – +85 °C Oscillation frequency*1 *1. The oscillation frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillation frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. fO 5028×1 to 5028×7 2 0–5 0 M H z Output frequency fOUT 5028×1 to 5028×7, CL ≤ 15pF 0.75 – 50 MHz
SEIKO NPC CORPORATION —7
Electrical Characteristics
VDD = 0.8 to 2.0V , VSS = 0V , Ta = −40 to +85°C unless otherwise noted. Parameter Symbol Condition Rating Unit min typ max HIGH-level output voltage V OH Q: Measurement cct 3 IOH = – 0.7mA, VDD = 0.8V 0.6 – – V IOH = – 3mA, VDD = 1.1V 0.8 – – V IOH = – 5mA, VDD = 1.4V 1.0 – – V LOW-level output voltage V OL Q: Measurement cct 3 IOL = 0.7mA, VDD = 0.8V – – 0.2 V IOL = 3mA, VDD = 1.1V – – 0.3 V IOL = 5mA, VDD = 1.4V – – 0.4 V HIGH-level input voltage V IH INHN, Measurement cct 4 0.7VDD –– V LOW-level input voltage V IL INHN, Measurement cct 4 – – 0.3V DD V Output leakage current I Z Q: Measurement cct 5, INHN = LOW, Ta = 25°C VOH = VDD – – 20 µA VOL = VSS 20 – – µA Current consumption*1 *1. When loading the capacitance to Q pin, the charge and discharge current (ICL) consumed by load capacitance (CL) is given by the following equation. (output frequency: fOUT) ICL = CL × VDD × fOUT IDD 5028×1 (fO), Measurement cct 1, no load, INHN = open, fO = 48MHz, fOUT = 48MHz VDD = 1.5V – 1.7 2.6 mA VDD = 1.2V – 1.3 2.0 mA VDD = 0.9V – 0.9 1.4 mA 5028×2 (fO/2), Measurement cct 1, no load, INHN = open, fO = 48MHz, fOUT = 24MHz VDD = 1.5V – 1.5 2.3 mA VDD = 1.2V – 1.1 1.7 mA VDD = 0.9V – 0.8 1.2 mA 5028×3 (fO/4), Measurement cct 1, no load, INHN = open, fO = 48MHz, fOUT = 12MHz VDD = 1.5V – 1.3 2.0 mA VDD = 1.2V – 1.0 1.5 mA VDD = 0.9V – 0.6 0.9 mA 5028×4 (fO/8), Measurement cct 1, no load, INHN = open, fO = 48MHz, fOUT = 6MHz VDD = 1.5V – 1.2 1.8 mA VDD = 1.2V – 0.9 1.4 mA VDD = 0.9V – 0.55 0.9 mA 5028×5 (fO/16), Measurement cct 1, no load, INHN = open, fO = 48MHz, fOUT = 3MHz VDD = 1.5V – 1.1 1.7 mA VDD = 1.2V – 0.8 1.2 mA VDD = 0.9V – 0.5 0.8 mA 5028×6 (fO/32), Measurement cct 1, no load, INHN = open, fO = 48MHz, fOUT = 1.5MHz VDD = 1.5V – 1.1 1.7 mA VDD = 1.2V – 0.8 1.2 mA VDD = 0.9V – 0.5 0.8 mA 5028×7 (fO/64), Measurement cct 1, no load, INHN = open, fO = 48MHz, fOUT = 0.75MHz VDD = 1.5V – 1.1 1.7 mA VDD = 1.2V – 0.8 1.2 mA VDD = 0.9V – 0.5 0.8 mA Standby current I ST Measurement cct 1, INHN = LOW, Ta = 25°C – – 100 µA INHN pull-up resistance RUP1 Measurement cct 6 0.4 2 10 M Ω RUP2 30 70 150 k Ω Oscillator feedback resistance R f 50 100 200 k Ω Oscillator capacitance CG Design value (a monitor pattern on a wafer is tested), Excluding parasitic capacitance. –2– p F C D –1 2– p F
SEIKO NPC CORPORATION —9 FUNCTIONAL DESCRIPTION Standby Function When INHN goes LOW, the Q output becomes high impedance. Power-saving Pull-up Resistor The INHN pin pull-up resistance RUP1 or RUP2 changes in response to the input level (HIGH or LOW). When INHN is tied LOW level, the pull-up resistance is large (R UP1), reducing the current consumed by the resis- tance. When INHN is left open circuit, the pull-up resistance is small (RUP2), which increases the input suscep- tibility to external noise. However, the pull-up resistance ties the INHN pin HIGH level to prevent external noise from unexpectedly stopping the output. Oscillation Detector Function The WF5028 series also feature an oscillation detector circuit. This circuit functions to disable the outputs until the oscillator circuit starts and oscillation becomes stable. This alleviates the danger of abnormal oscillator out- put at oscillator start-up when power is applied or when INHN is switched. INHN Q Oscillator HIGH (or open) Frequency output Normal operation LOW High impedance Stopped
SEIKO NPC CORPORATION —10 MEASUREMENT CIRCUITS Measurement cct 1 Measurement parameter: IDD, IST, Duty, tr , tf Note: The AC characteristics are observed using an oscilloscope on pin Q. Measurement cct 2 Measurement parameter: tOD XTN input signal: 1Vp-p, sine wave C1: 0.001µFC L: 15pF R1: 50Ω RL: 1kΩ Measurement cct 3 Measurement parameter: VOH, VOL XTN input signal: 1Vp-p, sine wave VDD VSS XT Q X'tal XTN INHN IDD ISTA (Including probe capacitance) CL = 15pF IDD: Open IST: Short 0.1µF IDD: Open VDD VSS Q XTN INHN Signal Generator VDD or VSS RLCL 0.1µF VDD VSS Q XTNSignal Generator 50Ω 0.001µF VOH VOL V 50Ω 0.1µFV S VOH VS VOL VS 0.1µF VS adjusted such that ∆V = 50 × IOH. VS adjusted such that ∆V = 50 × IOL. Measurement cct 4 Measurement parameter: VIH, VIL VIH: Voltage in VSS to VDD transition that changes the output state. VIL: Voltage in VDD to VSS transition that changes the output state. INHN has an oscillation stop function. Measurement cct 5 Measurement parameter: IZ Measurement cct 6 Measurement parameter: RUP1, RUP2 VDD VSS XT QX'tal XTN INHN VIH VIL V 0.1µF VDD VSS Q INHN IZ A VDD or VSS 0.1µF VDD VSSINHN VIN V A IUP VDD IUP (VIN = 0V) RUP2 = IUP VDD 0.7VDD RUP1 = (VIN = 0.7VDD) 0.1µF
SEIKO NPC CORPORATION —11 TYPICAL PERFORMANCE The following characteristics measured using the crystal below. Note that the characteristics will vary with the crystal used. I Crystal used for measurement I Crystal parameters Current Consumption Negative Resistance Frequency Deviation by Supply Voltage Change Drive Level Parameter fO = 48MHz C0 [pF] 1.6 R1 [Ω]1 2 R1C1 5028×1, fOSC = 48MHz, fOUT = 48MHz, Ta = 25°C 0.5 1.0 1.5 2.0 VDD [V] IDD [mA] CL = 15pF No load 5028×1, VDD = 0.9V , Ta = 25°C Characteristics are measured with a capacitance C0, representing the crystal equivalent circuit C0 capacitance, connected between the XT and XTN pins. Measurements are performed with Agilent 4396B using the NPC test jig. Characteristics may vary with measurement jig and measurement conditions. −600 −400 −200 −800 −1000Negative resistance [Ω] 0 2 04 06 08 0 1 0 0 Frequency [MHz] C0 = 0pF C0 = 1pF C0 = 2pF 5028×1, CL = 15pF, 1.2V standard, Ta = 25°C 0.5 1.0 1.5 2.0 VDD [V] f = 48MHz −12Frequency deviation [ppm] 5028×1, fOSC = 48MHz, Ta = 25°C 0.5 1.0 1.5 2.0 VDD [V] f = 48MHz 100 200 150Drive level [µW]
SEIKO NPC CORPORATION —12 Phase Noise Measurement equipment: Agilent E5052 Signal Source Analyzer Output Waveform Measurement equipment: Agilent DSO80604B Oscilloscope 5028×1, fOSC = 48MHz, fOUT = 48MHz, Ta = 25°C 10 100 1,000 10,000 1,000,000 10,000,000100,000 Offset frequency [Hz] −40 −60 −80 −100 −120 −140 −160 −180Phase noise [dBc/Hz] 0.9V 1.2V 1.5V 1.8V 5028×1, VDD = 0.9V , fOUT = 48MHz, CL = 15pF, Ta = RT
SEIKO NPC CORPORATION —13 NC0606AE 2008.01 Please pay your attention to the following points at time of using the products shown in this document. The products shown in this document (hereinafter “Products”) are not intended to be used for the apparatus that exerts harmful influence on human lives due to the defects, failure or malfunction of the Products. Customers are requested to obtain prior written agreement for such use from SEIKO NPC CORPORATION (hereinafter “NPC”). Customers shall be solely responsible for, and indemnify and hold NPC free and harmless from, any and all claims, damages, losses, expenses or lawsuits, due to such use without such agreement. NPC reserves the right to change the specifications of the Products in order to improve the characteristic or reliability thereof. NPC makes no claim or warranty that the contents described in this document dose not infringe any intellectual property right or other similar right owned by third parties. Therefore, NPC shall not be responsible for such problems, even if the use is in accordance with the descriptions provided in this document. Any descriptions including applications, circuits, and the parameters of the Products in this document are for reference to use the Products, and shall not be guaranteed free from defect, inapplicability to the design for the mass-production products without further testing or modification. Customers are requested not to export or re-export, directly or indirectly, the Products to any country or any entity not in compliance with or in violation of the national export administration laws, treaties, orders and regulations. Customers are req uested appropriately take steps to obtain required permissions or approvals from appropriate government agencies. SEIKO NPC CORPORATION 1-9-9, Hatchobori, Chuo-ku, Tokyo 104-0032, Japan Telephone: +81-3-5541-6501 Facsimile: +81-3-5541-6510 http://www.npc.co.jp/ Email: sales @npc.co.jp