4285A HP | Alldatasheet
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The complete Agilent Technologies 4285A specifi- cations are listed below. These specifications are the performance standards or limits against which the instrument is tested. When shipped from the factory, the 4285A meets the specifications listed in this section. The specification test procedures are covered in Agilent 4285A Maintenance Manual (Agilent Part Number 04285-90030). Measurement Functions Measurement parameters |Z| = Absolute value of impedance |Y| = Absolute value of admittance L = Inductance C = Capacitance R = Resistance G = Conductance D = Dissipation factor Q = Quality factor R s = Equivalent series resistance Rp = Parallel resistance X = Reactance B = Suceptance θ = Phase angle Combinations of measurement parameters |Z|, |Y| L, C R G θ (deg), θ (rad) D, Q, R s, Rp, G X B Mathematical functions The deviation and the percent of deviation of measurement values from a programmable refer- ence value. Equivalent measurement circuit Parallel and series Ranging Auto and manual (hold/up/down) Trigger Internal, external, BUS (GPIB), and manual Delay time Programmable delay from the trigger command to the start of the measurement, 0 to 60.000 s in 1 ms steps. Measurement terminals Four-terminal pair Test cable length 0 m, 1 m, and 2 m selectable Integration time Short, medium, and long selectable (refer to Sup- plemental Performance Characteristics, page 14, for the measurement time) Averaging 1 to 256, programmable Agilent 4285A Precision LCR Meter Data Sheet
Then, voltage level monitor accuracy Vma is Display Range Parameter Range |Z|, R, X 0.00001 Ω to 99.9999 MΩ |Y|, G, B 0.00001 µS to 99.9999 S C 0.00001 pF to 999.999 µF L 0.001 nH to 99.9999 H D 0.000001 to 9.99999 Q 0.01 to 99999.9 θ -180.000° to 180.000° Δ -999.999% to 999.999% Measurement Accuracy The measurement accuracy includes stability, tem- perature coefficient, linearity, repeatability, and calibration interpolation error. The measurement accuracy is specified when all of the following con- ditions are satisfied:
- Warm-up time: ≥ 30 minutes
- Test cable length: 0 m, 1 m (Agilent 16048A), or 2 m (Agilent 16048D). For the 1 m or 2 m cable length operation (with Agilent 16048A/D), CABLE CORRECTION has been performed
- OPEN and SHORT corrections have been per- formed.
- The optimum measurement range is selected by matching the DUT’s impedance to the effective measuring range shown in Figure 1-1 and Figure 1-2. (For example, if the DUT’s impedance is 3 kΩ and oscillator level is less than or equal to 1 V, the optimum range is the 500 Ω range.)
- Measurement accuracy is specified at the follow- ing reference planes:
- Test frequency ≤ 1 MHz At the UNKNOWN terminals on the Agilent 4285A front panel or at the end of the stan- dard test leads (Agilent 16048A/D).
- Test frequency ≥ 1.001 MHz At the 1-port terminal of the Agilent 16085B Terminal Adapter, which should be connected to the UNKNOWN terminals of the Agilent 4285A or to the end of the standard test leads (Agilent 16048A/D). ΔVma = 0.024 [V] + + 0.5 /H11003/H11003 1 /H11003 14 + 0.2 /H11003 1 1 /H11003 0.2 0.2 100 100 100 Vma 0.024 0.5 ≈ 4.8 [%] = 0.5 /H11003
Figure 1-1. Effective measurement range (oscillator level ≤ 1 Vrms)
Figure 1-2. Effective measurement range (oscillator level > 1 V rms)
|Z|, |Y|, L, C, R, X, G, and B accuracy |Z|, |Y|, L, C, R, X, G, and B accuracy Ae is given as Ae = ±(An + Ac) /H11003Kt [%] where: A n = Basic accuracy equation given from the A 1 to A16 shown in Table 1-1. The applicable frequency range and impedance range of equations A 1 to A16 are shown in Figure 1-3 and Figure 1-4. (Refer to Basic Accuracy Equations on page 7.) Ac = Cable length factor (Refer to Cable Length Factor on page 10.) Kt = Temperature factor (Refer to Temperature Factor on page 10.) L, C, X, and B accuracies apply when D x (measured D value) ≤ 0.1. When Dx > 0.1, multiply Ae by 1 + D 2 x for L, C, X, and B accuracies. R and G accuracies apply when Q x (measured Q value) ≤ 0.1. When Qx > 0.1, multiply Ae by 1 + Q 2 x for R and G accuracies. G accuracy given by the equation above applies to the G-B combination only. D accuracy D accuracy D e is given as AeDe = ± 100 where: A e = |Z|, |Y|, L, C, R, X, G, and B accuracy D accuracy applies when Dx (measured D value) ≤ 0.1. When Dx > 0.1, multiply De by (1 + Dx). Q accuracy Q accuracy Qe is given as x /H11003DeQe = ± 1 /H11007Qx /H11003De where: Qx = Measured Q value De = D accuracy Q accuracy applies when Qx /H11003De <1. θ Accuracy θ accuracy θe is given as 180 /H11003Aeθe = ± π /H11003100 [deg] where: Ae = |Z|, |Y|, L, C, R, X, G, and B accuracy G Accuracy G accuracy Ge is given as where: Bx = Measured B value [S] Cx = Measured C value [F] Lx = Measured L value [H] De = D accuracy f = Test frequency [Hz] G accuracy applies when Dx (measured D value) ≤ 0.1. G accuracy given by the equation above applies to the Cp-G and Lp-G combinations only. Ge = ±Bx /H11003 De [S] (Bx = 2 πfCx = 1 2 πfLx )
Figure 1-3. Accuracy equations, Ki factor, and Kosc factor (test signal level ≤ 1 Vrms)
Figure 1-4. Accuracy equations and K i factor (test signal level > 1 V rms )
- From Table 1-1, the actual accuracy equation to be applied is determined as A1. Then, 8. Determine N1 from Table 1-2. From frequency = 25.2 MHz, then, N1 = 0.3. 9. Then, 10. Cable length is 0 m, then Ac = 0. 11. Operating temperature is 28 °C, then Kt = 1 (from Figure 1-5). 12. Therefore, inductance measurement accuracy Ae is: Ae = ±(An + Ac) /H11003Kt = ±2.6 [%] Determine Q measurement accuracy Qe 1. From Q Accuracy (see page 6), Q measurement accuracy Qe is determined as below: Qe = ± Qx 2 /H11003De 1 /H11007Qx /H11003De 2. Determine D accuracy De for calculating Qe. From the previous step Determine inductance measurement accuracy Ae (see page 10), Ae is 2.6 [%], then: De = ± Ae 100 = ± 0.026 3. Therefore Qe is: Qe = ± Qx 2 /H11003De 1 /H11007Qx /H11003De Qe = ± 302 /H110030.026 1 /H1100730 /H110030.026 ≈ +106/–13 Correction Functions Zero open Eliminates measurement errors due to parasitic stray admittance (C, G) of the test fixture. Zero short Eliminates measurement errors due to parasitic residual impedances (L, R) of the test fixture. Load Improves the measurement accuracy by using a device whose value is accurately known (a working standard) as a reference. List Sweep A maximum of ten frequencies or test signal levels can be programmed. Single or sequential tests can be performed. When Option 4285A-001 is installed, DC bias voltages can also be programmed. Comparator Function Ten-bin sorting for the primary measurement parameter, and IN/OUT decision output for the secondary measurement parameter. Sorting modes Sequential mode. Sorting into unnested bins with absolute upper and lower limits. Tolerance mode. Sorting into nested bins with absolute or percent limits. Bin count 0 to 999999 List sweep comparator HIGH/IN/LOW decision output for each point in the list sweep table. An = 0.3% + ( ≈ 2.6 [%] 25.2 |35| f f |Zm|
Ten instrument control settings, including com- parator limits and list sweep programs, can be stored and loaded into and from the internal non- volatile memory. Ten additional settings can also be stored and loaded from each memory card. GPIB All control settings, measured values, comparator limits, and list sweep program can be controlled or monitored. Uses ASCII and 64-bit binary data format. GPIB buffer memory can store measured values for a maximum of 128 measurements and output packed data over the GPIB bus. Complies with IEEE-488.1 and 488.2. The programming language is Test and Measurement Systems Language (TMSL). GPIB interface functions SH1, AH1, T5, L4, SR1, RL1, DC1, DT1, C0, E1 Self test Softkey controllable. Provides a means to confirm proper operation. Option 4285A-001 (Internal DC Bias) Adds the variable DC bias voltage function. DC bias level The following DC bias level accuracy is specified for an ambient temperature range of 23 °C ± 5 °C. Multiply the temperature induced setting error, K t listed in Figure 1-5 for the temperature range of 0 °C to 55 °C. Voltage range Resolution Setting accuracy ±(0.000 to 4.000) V 1 mV ±(0.1% of setting +1 mV) ±(4.002 to 8.000) V 2 mV ±(0.1% of setting +2 mV) ±(8.005 to 20.000) V 5 mV ±(0.1% of setting +5 mV) ±(20.01 to 40.00) V 10 mV ±(0.1% of setting +10 mV) A maximum DC bias current of 100 mA can be applied to the DUT. DC bias monitor terminal DC bias voltage or current can be monitored at the rear panel BNC connector. The following monitor accuracies are applied when the digital volt meter whose input impedance is ≥ 10 MΩ is used.
- DC bias voltage monitor DC bias voltage across the DUT /H11003 1 Output impedance: 11 k Ω Monitor accuracy: ±(0.2% of reading + 2 + 0.8 /H11003I dut) mV where: I dut is current flowing through the DUT in [mA].
- DC bias current monitor DC bias current through the DUT /H11003 10 Ω (1 V at 100 mA) Output impedance: 10 k Ω Monitor accuracy: ±(1% of reading + 0.3) mA Other Options Option 4285A-700: No DC bias Option 4285A-002: Accessory Control Interface Allows the 4285A to control the Agilent 42841A bias current source or the Agilent 42851A preci- sion Q adapter. The voltage ratio meaurement accuracy, when the 4285A is used with the 42851A precision Q adapter, is described in the 42851A’s operation manual. Option 4285A-201: Handler interface Option 4285A-202: Handler interface Option 4285A-301: Scanner interface Option 4285A-710: Blank panel Option 4285A-907: Front handle kit Option 4285A-908: Rack mount kit Option 4285A-909: Rack flange and handle kit Option 4285A-915: Add service manual Option 4285A-ABA: Add English manual Option 4285A-ABD: Add German manual Option 4285A-ABJ: Add Japanese manual
Power cord Depends on the country where the 4285A is being used 100 Ω resistor box Agilent P/N 04285-61001 BNC female-female A gilent P/N 1250-0080 (4 ea.) Adapter Fuse Only for Option 4285A-201 Agilent P/N 2110-0046 (2 ea.) Accessories Available Test fixture/test leads 16034E Test fixture for SMD or chip type DUT, f ≤ 40 MHz Power Requirements Line voltage 100, 120, 220 Vac ±10%, 240 Vac +5% –10% Line frequency 47 to 66 Hz Power consumption 200 VA max. Operating Environment Temperature 0 °C to 55 °C Humidity ≤ 95% R.H. at 40 °C Dimensions 426 (W) by 177 (H) by 498 (D) (mm) Weight Approximately 16 kg (35.3 lb., standard) Display LCD dot-matrix display Capable of displaying Measured values Control settings Comparator limits and decisions List sweep tables Self test message and annunciations Number of display digits 6-digits, maximum display count 999999 16047A Test fixture for axial or radial DUT, f ≤ 13 MHz 16047D Test fixture for axial or radial DUT, f ≤ 40 MHz 16048A Test leads, length 1 m (BNC connector) 16048D Test leads, length 2 m (BNC connector) 16048G Test fixture for SMD or chip type 16048H Test fixture for array-type SMD or GPIB interconnection cables 10833A GPIB cable, 1 m 10833B GPIB cable, 2 m 10833C GPIB cable, 4 m 10833D GPIB cable, 0.5 m 16044A Fou r-terminal test fixture for SMD or chip type DUT, f ≤ 10 MHz 16065A External voltage bias fixture 16334A Tweezer-type test fixture for SMD or chip type DUT, f ≤ 15 MHz 16451B Dielectric test fixture 42842C Bias current test fixture 42851-61100 SMD test fixture (Option 42842C-201) DC bias source 42841A Bias current source Memory card 04278-89001 Memory card, 1 ea. DUT, f ≤ 110 MHz chip type DUT, f ≤ 110 MHz
Supplemental Performance Characteristics The Agilent 4285A supplemental performance characterisics are listed below. These supplemental performance characteristics are not specifications, but are typical characteristics included as supple- mental information for the operator. Stability When the following conditions are satisfied, Integration time: LONG Operating temperature: Constant operating tem- perature of 23 °C ± 5 °C Parameter ≤ 1 MHz 30 MHz |Z|, |Y|, L, C, R < 0.01%/day < 0.05%/day D < 0.0001/day < 0.0005/day Temperature coefficient When the following conditions are satisfied, Integration time: LONG Test signal voltage: ≥ 20 mVrms Operating temperature: 23 °C ± 5 °C Parameter ≤ 1 MHz 30 MHz Settling time Frequency (fm) < 50 msec. Test signal level < 100 msec. Measurement range < 50 msec./range shift Input protection Internal circuit protection, when a charged capaci- tor is connected to the UNKNOWN terminals. The maximum capacitor voltage is: Vmax = 1 [V]C where: V max = ≤ 200 V C = Capacitance value in Farads Measurement time Typical measurement times from the trigger to the output of EOM at the Handler Interface. (EOM: End of Measurement) Integration time Measurement time SHORT 30 ms MEDIUM 65 ms LONG 200 ms In the following condition an additional measure- ment time, approx. 300 ms, is added to the meas- urement time. Test signal voltage: 0.51 V – 2 V rms Measurement range: 0 Ω Range Test signal current: ≥ 22 mA Display time Display time for each display format is given as: MEAS DISPLAY page Approx. 8 ms BIN No. DISPLAY page Approx. 5 ms BIN COUNT DISPLAY page Approx. 0.5 ms GPIB data output time Internal GPIB data, processing time from EOM out- put to measurement data output on GPIB lines (excluding display time):
- Approx. 10 ms
Option 4285A-001 (internal DC bias) Maximum DC bias current when the normal meas- urement can be performed is 100 mA. DC bias settling time When DC bias is set to ON, add 5 ms to the meas- urement time. This settling time does not include the DUT charge time. Sum of DC bias settling time plus DUT (capacitor) charge time is shown in the following figure. Figure 1-6. Sum of the DC bias settling time and DUT (capacitor) charge time
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