33988

33988 FREESCALE | Alldatasheet

Document overview

• Manufacturer or author: Provided By ALLDATASHEET.COM(FREE DATASHEET DOWNLOAD SITE)
• PDF pages: 34

Technical content

Features

• Dual 8.0m Ω max high side switch with parallel input or SPI control
• 6.0V to 27V operating voltage with standby currents < 5.0 μA
• Output current monitoring with two SPI-selectable current ratios
• SPI control of over-current limi t, over-current fault blanking time, output-OFF open load detection, output ON/OFF control, watchdog timeout, slew rates, and fault status reporting
• SPI status reporting of overcu rrent, open and shorted loads, over- temperature, under-voltage and over-voltage shutdown, fail-safe pin status, and program status
• Enhanced -16V reverse polarity V PWR protection

Figure 1. 33988 Simplified Application Diagram

ORDERING INFORMATION

Range (TA) Package MC33988CPNA - 40°C to 125°C 16 PQFN BOTTOM VIEW PNA SUFFIX 98ARL10521D 16-PIN PQFN VDD I/O I/O SO SCLK CS SI I/O I/O I/O A/D VPWR FS WAKE SI SCLK CS SO RST INO IN1 CSNS FSI GND HS1 HS0 GND LOAD LOAD 33988 MCU VDDVDDVDD VPWR

2 Freescale Semiconductor

Figure 2. 33988 Simplified Internal Block Diagram

3.0 MHz

Figure 3. 33988 Pin Connections (Transparent Top View) Table 1. Pin Definitions Functional descriptions of many of these pins can be found in the Functional Pin Description section beginning on page 16.

2 WAKE Input Wake This pin is used to input a Logic [1] signal so as to enable the

3 RST Input Reset (Active Low) This input pin is used to initialize the device configuration and fault

registers, as well as place the device in a low-current Sleep mode. 4 IN0 Input Direct Input 0 This input pin is used to directly control the output HS0. resistor to VDD for fault reporting.

6 FSI Input Fail-Safe Input The value of the resistance connected between this pin and ground

determines the state of the outputs after a watchdog timeout occurs.

7 CS Input Chip Select (Active Low) This input pin is connected to a chip select output of a master

8 SCLK Input Serial Clock This input pin is connected to the MCU providing the required bit shift

clock for SPI communication.

9 SI Input Serial Input This is a command data input pin connected to the SPI Serial Data

10 VDD Input Digital Drain Voltage

4 Freescale Semiconductor

11 SO Output Serial Output This output pin is connected to the SPI Serial Data Input pin of the

MCU or to the SI pin of the next device of a daisy chain of devices. 12 IN1 Input Direct Input 1 This input pin is used to directly control the output HS1. 13 GND Ground Ground This pin is the ground for the logic and analog circuitry of the device. of operational power for the device. 15 HS1 Output High Side Output 1 Protected 8.0mΩ high side power output to the load. 16 HS0 Output High Side Output 0 Protected 8.0mΩ high side power output to the load. Table 1. Pin Definitions (continued) Functional descriptions of many of these pins can be found in the Functional Pin Description section beginning on page 16.

Analog Integrated Circuit Device Data Freescale Semiconductor 5 33988

ELECTRICAL CHARACTERISTICS

Table 2. Maximum Ratings All voltages are with respect to ground unless otherwise noted.

1. Exceeding this voltage limit may c ause permanent damage to the device.
2. Continuous high side output current rating so long as maximum junction temperature is not exceeded. Calculation of maximum output

current using package thermal resistance is required.

1. Active clamp energy using single-pulse method (L = 16mH, R L = 0, VPWR = 12V, TJ = 150°C).
2. ESD1 testing is performed in accordance with the Human Body Model (HBM) (CZAP = 100pF, RZAP = 1500Ω); ESD3 testing is performed

in accordance with the Charge Device Model (CDM), Robotic (Czap=4.0pF).

Analog Integrated Circuit Device Data

6 Freescale Semiconductor

• 40 to 125 - 40 to 150 Storage Temperature TSTG - 55 to 150 °C Thermal Resistance(5) Junction-to-Case Junction-to-Ambient RθJC RθJA <1.0 °C/W Peak Package Reflow Temperature During Reflow(6), (7) TPPRT Note 7 °C Notes 5. Device mounted on a 2s2p test board according to JEDEC JESD51-2. 6. Pin soldering temperature limit is for 10 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may cause malfunction or permanent damage to the device. 7. Freescale’s Package Reflow capability meets Pb-free requirements for JEDEC standard J-STD-020C. For Peak Package Reflow Temperature and Moisture Sensitivity Levels (MSL), Go to www.freescale.com, search by part number [e.g. remove prefixes/suffixes and enter the core ID to view all orderable parts. (i.e. MC33xxxD enter 33xxx), and review parametrics.

All voltages are with respect to ground unless otherwise noted.

Analog Integrated Circuit Device Data Freescale Semiconductor 7 33988 STATIC ELECTRICAL CHARACTERISTICS STATIC ELECTRICAL CHARACTERISTICS Table 3. Static Electrical Characteristics Characteristics noted under conditions 4.5V ≤ VDD ≤ 5.5V, 6.0V ≤ VPWR ≤ 27V, -40°C ≤ TA ≤ 125°C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions, unless otherwise noted.

1. This applies to all intern al device logic supplied by VPWR and assumes the external VDD supply is within specification.
2. This applies when the under-voltage fault is not latched (IN[0 : 1] = 0).

Analog Integrated Circuit Device Data

8 Freescale Semiconductor

STATIC ELECTRICAL CHARACTERISTICS POWER OUTPUT Output Drain-to-Source ON Resistance (IHS[0:1] = 7.5A, TJ = 25°C) VPWR = 6.0V VPWR = 10V VPWR = 13V RDS(ON) 12.0 8.0 8.0 mΩ Output Drain-to-Source ON Resistance (IHS[0:1] = 7.5A, TJ = 150°C) VPWR = 6.0V VPWR = 10V VPWR = 13V RDS(ON) 20.4 13.6 13.6 mΩ Output Source-to-Drain ON Resistance IHS[0:1] = 7.5A, TJ = 25°C(10) VPWR = -12V RDS(ON) – – 16.0 mΩ Output Over-current High Detection Levels (9.0V < VPWR < 16V) SOCH = 0 SOCH = 1 IOCH0 IOCH1 37.5 A Over-current Low Detection Levels (SOCL[2:0]) 000 001 010 011 100 101 110 111 IOCL0 IOCL1 IOCL2 IOCL3 IOCL4 IOCL5 IOCL6 IOCL7 10.5 9.0 8.0 7.0 6.0 5.0 4.0 3.0 12.5 11.25 10.0 8.75 7.5 6.25 5.0 3.75 14.5 13.5 12.0 10.5 9.0 7.5 6.0 4.5 A Current Sense Ratio (9.0V < VPWR < 16V, CSNS < 4.5V) DICR D2 = 0 DICR D2 = 1 CSR0 CSR1 Current Sense Ratio (CSR0) Accuracy Output Current 2.5A 5.0A 6.25A 7.5A 10.0A 12.5A CSR0_ACC - 20 -14 -13 -12 -13 -13 Notes 10. Source-Drain ON Resistance (Reverse Drain-to -Source ON Resistance) with negative polarity VPWR. Table 3. Static Electrical Characteristics (continued) Characteristics noted under conditions 4.5V ≤ VDD ≤ 5.5V, 6.0V ≤ VPWR ≤ 27V, -40°C ≤ TA ≤ 125°C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions, unless otherwise noted.

Analog Integrated Circuit Device Data Freescale Semiconductor 9 33988 STATIC ELECTRICAL CHARACTERISTICS POWER OUTPUT (CONTINUED) Current Sense Ratio (CSR1) Accuracy Output Current 2.5A 5.0A 6.25A 7.5A 10.0A 12.5A CSR1_ACC - 25 -19 -18 -17 -18 -18 Current Sense Clamp Voltage CSNS Open; IHS[0:1] = 15A VCL(CSNS) 4.5 6.0 7.0 V Open Load Detection Current(11) IOLDC 30 – 100 μA Output Fault Detection Threshold Output Programmed OFF VOLD(THRES) 2.0 3.0 4.0 V Output Negative Clamp Voltage 0.5A < IHS[0:1] < 2.0A, Output OFF VCL - 20 – -15 V Over-temperature Shutdown(12) TSD 160 175 190 °C Over-temperature Shutdown Hysteresis(12) TSD(HYS) 5.0 – 20 °C Notes 11. Output OFF Open Load Detection Current is the current requir ed to flow through the load for the purpose of detecting the existence of an open load condition when the specific output is commanded OFF. 12. Guaranteed by process monitoring. Not production tested. Characteristics noted under conditions 4.5V ≤ VDD ≤ 5.5V, 6.0V ≤ VPWR ≤ 27V, -40°C ≤ TA ≤ 125°C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions, unless otherwise noted.

Analog Integrated Circuit Device Data

10 Freescale Semiconductor

STATIC ELECTRICAL CHARACTERISTICS CONTROL INTERFACE Input Logic High-voltage(13) VIH 0.7 VDD – – V Input Logic Low-voltage(13) VIL – – 0.2 VDD V Input Logic Voltage Hysteresis(14) VIN[0:1] (HYS) 100 600 1200 mV Input Logic Pull-down Current (SCLK, IN, SI) IDWN 5.0 – 20 μA RST Input Voltage Range VRST 4.5 5.0 5.5 V SO, FS Tri-state Capacitance(15) CSO – – 20 pF Input Logic Pull-down Resistor (RST) and WAKE RDWN 100 200 400 kΩ Input Capacitance(15) CIN – 4.0 12 pF WAKE Input Clamp Voltage(16) ICL(WAKE) < 2.5 mA VCL(WAKE) 7.0 – 14 V WAKE Input Forward Voltage ICL(WAKE) = - 2.5mA VF(WAKE) - 2.0 – - 0.3 V SO High-state Output Voltage IOH = 1.0mA VSOH

0.8 VDD – –

V FS, SO Low-state Output Voltage IOL = -1.6mA VSOL – 0.2 0.4 V SO Tri-state Leakage Current CS > 0.7 x VDD ISO(LEAK) - 5.0 0 5.0 μA Input Logic Pull-up Current(17) CS, VIN[0:1] > 0.7 x VDD IUP 5.0 – 20 μA FSI Input Pin External Pull-down Resistance FSI Disabled, HS[0:1] Indeterminate FSI Enabled, HS[0:1] OFF FSI Enabled, HS0 ON, HS1 OFF FSI Enabled, HS[0:1] ON RFS RFSDIS RFSOFFOFF RFSONOFF RFSONON 6.0 6.5 Infinite 1.0 7.0 kΩ Notes 13. Upper and lower logic thres hold voltage range applies to SI, CS, SCLK, RST, IN[0:1], and WAKE input signals. The WAKE and RST signals may be supplied by a derived voltage reference to VPWR. 14. No hysteresis on FSI and wake pins. Parameter is guar anteed by processing monitoring but is not production tested. 15. Input capacitance of SI, CS, SCLK, RST, and WAKE. This parameter is guaranteed by process monitoring but is not production tested. 16. The current must be limited by a series resistance when using voltages > 7.0V. 17. Pull-up current is with CS OPEN. CS has an active internal pull-up to VDD. Characteristics noted under conditions 4.5V ≤ VDD ≤ 5.5V, 6.0V ≤ VPWR ≤ 27V, -40°C ≤ TA ≤ 125°C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions, unless otherwise noted.

Analog Integrated Circuit Device Data Freescale Semiconductor 11 33988 DYNAMIC ELECTRICAL CHARACTERISTICS DYNAMIC ELECTRICAL CHARACTERISTICS Table 4. Dynamic Electrical Characteristics Characteristics noted under conditions 4.5V ≤ VDD ≤ 5.5V, 6.0V ≤ VPWR ≤ 27V, -40°C ≤ TA ≤ 125°C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions, unless otherwise noted. guaranteed by process monitoring. are guaranteed by process monitoring.

1. Turn-ON delay time measured from rising edge of IN[0:1] signal that would turn the output ON to VHS[0:1] = 0.5V with RL = 5.0Ω resistive
2. Turn-OFF delay time measured from falli ng edge that would turn the output OFF to VHS[0:1] = VPWR - 0.5V with RL = 5.0Ω resistive load.

Analog Integrated Circuit Device Data

12 Freescale Semiconductor

DYNAMIC ELECTRICAL CHARACTERISTICS POWER OUTPUT TIMING (CONTINUED) Overcurrent Detection Blanking Time (OCLT [1:0]) t OCL0 t OCL1 t OCL2 t OCL3 108 7.0 0.8 0.08 155 1.2 0.15 202 1.6 0.25 ms Overcurrent High Detection Blanking Time t OCH 1.0 10 20 μs CS to CSNS Valid Time(22) t CNSVAL – – 10 μs HS1 Switching Delay Time (OSD[2:0]) 000 001 010 011 100 101 110 111 t OSD0 t OSD1 t OSD2 t OSD3 t OSD4 t OSD5 t OSD6 t OSD7 110 165 220 275 330 385 150 225 300 375 450 525 190 285 380 475 570 665 ms HS0 Switching Delay Time (OSD[2:0]) 000 001 010 011 100 101 110 111 t OSD0 t OSD1 t OSD2 t OSD3 t OSD4 t OSD5 t OSD6 t OSD7 110 110 220 220 330 330 150 150 300 300 450 450 190 190 380 380 570 570 ms Watchdog Timeout (WD [1:0])(23) t WDTO0 t WDTO1 t WDTO2 t WDTO3 434 207 1750 875 620 310 2500 1250 806 403 3250 1625 ms Notes 22. Time necessary for the CSNS to be within ±5% of the targeted value. 23. Watchdog timeout delay measured from the rising edge of WAKE to RST from a sleep state condition to output turn-ON with the output driven OFF and FSI floating. The values shown are for WDR setting of [00]. The accuracy of tWDTO is consistent for all configured watchdog timeouts. Table 4. Dynamic Electrical Characteristics (continued) Characteristics noted under conditions 4.5V ≤ VDD ≤ 5.5V, 6.0V ≤ VPWR ≤ 27V, -40°C ≤ TA ≤ 125°C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions, unless otherwise noted.

Analog Integrated Circuit Device Data Freescale Semiconductor 13 33988 DYNAMIC ELECTRICAL CHARACTERISTICS SPI INTERFACE CHARACTERISTICS Recommended Frequency of SPI Operation f SPI – – 3.0 MHz Required Low State Duration for RST(24) t WRST – 50 350 ns Rising Edge of CS to Falling Edge of CS (Required Setup Time)(25) t CS – – 300 ns Rising Edge of RST to Falling Edge of CS (Required Setup Time)(25) t ENBL – – 5.0 μs Falling Edge of CS to Rising Edge of SCLK (Required Setup Time)(25) t LEAD – 50 167 ns Required High State Duration of SCLK (Required Setup Time)(25) t WSCLKh – – 167 ns Required Low State Duration of SCLK (Required Setup Time)(25) t WSCLKl – – 167 ns Falling Edge of SCLK to Rising Edge of CS (Required Setup Time)(25) t LAG – 50 167 ns SI to Falling Edge of SCLK (Required Setup Time)(26) t SI(SU) – 25 83 ns Falling Edge of SCLK to SI (Required Setup Time)(26) t SI(HOLD) – 25 83 ns SO Rise Time CL = 200pF t RSO – 25 50 ns SO Fall Time CL = 200pF t FSO – 25 50 ns SI, CS, SCLK, Incoming Signal Rise Time(26) t RSI – – 50 ns SI, CS, SCLK, Incoming Signal Fall Time(26) t RSI – – 50 ns Time from Falling Edge of CS to SO Low-impedance(27) t SO(EN) – – 145 ns Time from Rising Edge of CS to SO High-impedance(28) t SO(DIS) – 65 145 ns Time from Rising Edge of SCLK to SO Data Valid(29) 0.2 x VDD ≤ SO ≤ 0.8 x VDD, CL = 200pF t VALID – 65 105 ns Notes 24. RST low duration measured with outputs enabled and going to OFF or disabled condition. 25. Maximum setup time required for the 33988 is the mi nimum guaranteed time needed from the microcontroller. 26. Rise and Fall time of incoming SI, CS, and SCLK signals suggested for design consideration to prevent the occurrence of double pulsing. 27. Time required for output status data to be available for use at SO. 1.0k Ω on pull-up on CS. 28. Time required for output status data to be terminated at SO. 1.0k Ω on pull-up on CS. 29. Time required to obtain valid data out from SO following the rise of SCLK. Characteristics noted under conditions 4.5V ≤ VDD ≤ 5.5V, 6.0V ≤ VPWR ≤ 27V, -40°C ≤ TA ≤ 125°C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25°C under nominal conditions, unless otherwise noted.

Analog Integrated Circuit Device Data

14 Freescale Semiconductor

Figure 4. Output Slew Rate and Time Delays Figure 5. Overcurrent Shutdown Figure 6. Over-current Low and High Detection

Analog Integrated Circuit Device Data Freescale Semiconductor 15 33988 Figure 6 illustrates the over-current detection level (IOCLX, IOCHX) the device can reach for each over-current detection blanking time (tOCHX, tOCLX):

• During t OCHX, the device can reach up to IOCH0 over- current level.
• During t OCL3 or tOCL2 or tOCL1 or tOCL0, the device can be programmed to detect up to IOCL0.

Figure 7. Input Timing Switching Characteristics Figure 8. SCLK Waveform and Valid SO Data Delay Time

0.7 VDD

0.2 VDD

Analog Integrated Circuit Device Data

16 Freescale Semiconductor

FUNCTIONAL PIN DESCRIPTION FUNCTIONAL DESCRIPTION INTRODUCTION The 33988 is a dual self-protected 8.0mΩ silicon switch used to replace electromechanical relays, fuses, and discrete devices in power management applications. The 33988 is designed for harsh environments, and includes self-recovery features. The device is suitable for loads with high inrush current, as well as motors and all types of resistive and inductive loads. Programming, control, and diagnostics are implemented via the Serial Peripheral Interface (SPI). A dedicated parallel input is available for alternate and Pulse Width Modulation (PWM) control of each output. SPI-programmable fault trip thresholds allow the device to be adjusted for optimal performance in the application. The 33988 is packaged in a power-enhanced 12 x 12 nonleaded PQFN package with exposed tabs. FUNCTIONAL PIN DESCRIPTION OUTPUT CURRENT MONITORING (CSNS) This pin is used to output a current proportional to the designated HS0-1 output. That current is fed into a ground- referenced resistor and its voltage is monitored by an MCU's A/D. The channel to be monitored is selected via the SPI. This pin can be tri-stated through the SPI. WAKE (WAKE) This pin is used to input a Logic [1] signal so as to enable the watchdog timer function. An internal clamp protects this pin from high damaging voltages when the output is current limited with an external resistor. This input has a passive internal pull-down. RESET (RST) This input pin is used to initialize the device configuration and fault registers, as well as place the device in a low- current Sleep mode. The pin also starts the watchdog timer when transitioning from Logic LOW to Logic HIGH. This pin should not be allowed to be Logic HIGH until V DD is in regulation. This pin has a passive internal pull-down. DIRECT IN 0 & 1 (INx) This input pin is used to directly control the output HS0 and 1. This input has an active internal pull-down current source and requires CMOS logic levels. This input may be configured via the SPI. FAULT STATUS (FS) This is an open drain configured output requiring an external pull-up resistor to VDD for fault reporting. When a device fault condition is detected, this pin is active LOW. Specific device diagnostic faults are reported via the SPI SO pin. FAIL-SAFE INPUT (FSI) The value of the resistance connected between this pin and ground determines the state of the outputs after a watchdog timeout occurs. Depending on the resistance value, either all outputs are OFF, ON, or the output HS0 only is ON. When the FSI pin is connected to GND, the watchdog circuit and fail-safe operation are disabled. This pin incorporates an active internal pull-up current source. CHIP SELECT (CS) This input pin is connected to a chip select output of a master microcontroller (MCU). The MCU determines which device is addressed (selected) to receive data by pulling the CS pin of the selected device Logic LOW, enabling SPI communication with the device. Other unselected devices on the serial link having their CS pins pulled-up Logic HIGH disregard the SPI communication data sent. This pin incorporates an active internal pull-up current source. SERIAL CLOCK (SCLK) This input pin is connected to the MCU providing the required bit shift clock for SPI communication. It transitions one time per bit transferred at an operating frequency, fSPI, defined by the communication interface. The 50 percent duty cycle CMOS-level serial clock signal is idle between command transfers. The signal is used to shift data into and out of the device. This input has an active internal pull-down current source. SERIAL INPUT (SI) This is a command data input pin connected to the SPI Serial Data Output of the MCU or to the SO pin of the previous device of a daisy chain of devices. The input requires CMOS logic-level signals and incorporates an active internal pull-down current source. Device control is facilitated by the input's receiving the MSB first of a serial 8-bit control command. The MCU ensures data is available upon the falling edge of SCLK. The logic state of SI present upon the rising edge of SCLK loads that bit command into the internal command shift register.

Analog Integrated Circuit Device Data Freescale Semiconductor 17 33988 FUNCTIONAL DESCRIPTION FUNCTIONAL PIN DESCRIPTION DIGITAL DRAIN VOLTAGE (VDD) This is an external voltage input pin used to supply power to the SPI circuit. In the event VDD is lost, an internal supply provides power to a portion of the logic, ensuring limited functionality of the device. All device configuration registers are reset. SERIAL OUTPUT (SO) This output pin is connected to the SPI Serial Data Input pin of the MCU or to the SI pin of the next device of a daisy chain of devices. This output will remain tri-stated (high- impedance OFF condition) so long as the CS pin of the device is Logic HIGH. SO is only active when the CS pin of the device is asserted Logic LOW. The generated SO output signals are CMOS logic levels. SO output data is available on the falling edge of SCLK and transitions immediately on the rising edge of SCLK. POSITIVE POWER SUPPLY (VPWR) This pin connects to the positive power supply and is the source input of operational power for the device. The VPWR pin is a backside surface mount tab of the package. HIGH-SIDE OUTPUT 0 & 1 (HSx) This pin protects 8.0mΩ high-side power output to the load.

18 Freescale Semiconductor

Figure 9. Functional Internal Block Diagram architecture provides a low quiescent current sleep mode. case of failures on the SPI (watchdog timeout). short-circuit), thermal shutdown, and under/over-voltage. parallel input pins. The device is configured in default mode.

and RST inputs as defined in Table 5.

• V PWR is within the normal voltage range.
• RST pin is Logic [1].
• No fault has occurred. FAIL-SAFE AND WATCHDOG If the FSI input is not grounded, the watchdog timeout detection is active when either the WAKE or RST input pin transitions from Logic [0] to Logic [1]. The WAKE input is capable of being pulled up to VPWR with a series of limiting resistance that limits the internal clamp current according to the specification. The watchdog timeout is a multiple of an internal oscillator and is specified in Table 14. As long as the WD bit (D7) of an incoming SPI message is toggled within the minimum watchdog timeout period (WDTO), based on the programmed value of the WDR the device will operate normally. If an internal watchdog timeout occurs before the WD bit, the device will revert to a Fail-safe mode until the device is reinitialized. During the Fail-safe mode, the outputs will be ON or OFF depending upon the resistor RFS connected to the FSI pin, regardless of the state of the various direct inputs and modes (Table 6). In this mode, the SPI register content is retained except for over-current high and low detection levels and timing, which are reset to their default value (SOCL, SOCH, and OCLT). Then the watchdog, over-voltage, over- temperature, and over-current circuitry (with default value) are fully operational. The Fail-safe mode can be detected by monitoring the WDTO bit D2 of the WD register. This bit is Logic [1] when the device is in Fail-safe mode. The device can be brought out of the Fail-safe mode by transitioning the WAKE and RST pins from Logic [1] to Logic [0] or forcing the FSI pin to Logic [0]. Table 5 summarizes the various methods for resetting the device from the latched Fail-safe mode. If the FSI pin is tied to GND, the Watchdog Fail-safe operation is disabled. LOSS OF VDD If the external 5.0V supply is not within specification, or even disconnected, all register content is reset. The two outputs can still be driven by the direct inputs IN 1:IN0. The 33988 uses the battery input to power the output MOSFET- related current sense circuitry and any other internal logic providing Fail-safe device operation with no VDD supplied. In this state, the watchdog, over-voltage, over-temperature, and over-current circuitry are fully operational with default values.

Table 5. Fail-Safe Operation and Transitions to Other

33988 Modes

Sleep x 0 0 x Device is in Sleep mode. Table 6. Output State During Fail-safe Mode

0 Fail-safe mode Disabled

6.0 Both HS0 and HS1 OFF

17 HS0 ON, HS1 OFF

20 Freescale Semiconductor

• Over-temperature fault
• Open load fault
• Over-current fault (high and low)
• Over-voltage and under-voltage fault The FS pin will automatically return to Logic [1] when the fault condition is removed, except for over-current and in some cases under-voltage. Fault information is retained in the fault register and is available (and reset) via the SO pin during the first valid SPI communication (refer to Table 16). PROTECTION AND DIAGNOSIS FEATURES OVER-TEMPERATURE FAULT (NON-LATCHING) The 33988 incorporates over-temperature detection and shutdown circuitry in each output structure. Over- temperature detection is enabled when an output is in the ON state. For the output, an over-temperature fault (OTF) condition results in the faulted output turning OFF until the temperature falls below the TSD(HYS). This cycle will continue indefinitely until action is taken by the MCU to shut OFF the output, or until the offending load is removed. When experiencing this fault, the OTF fault bit will be set in the status register and cleared after either a valid SPI read or a power reset of the device. OVER-VOLTAGE FAULT (NON-LATCHING) The 33988 shuts down the output during an over-voltage fault (OVF) condition on the VPWR pin. The output remains in the OFF state until the over-voltage condition is removed. When experiencing this fault, the OVF fault bit is set in the bit OD1 and cleared after either a valid SPI read or a power reset of the device. The over-voltage protection and diagnostic can be disabled trough SPI (bit OV_dis). UNDER-VOLTAGE SHUTDOWN (LATCHING OR NON-LATCHING) The output(s) will latch off at some battery voltage below 6.0 V. As long as the VDD level stays within the normal specified range, the internal logic states within the device will be sustained. In the case where the battery voltage drops below the under-voltage threshold (VPWRUV) output will turn off, FS will go to Logic [0], and the fault register UVF bit will be set to 1. Two cases need to be considered when the battery level recovers:
• If output(s) command is (are) low, FS will go to Logic [1] but the UVF bit will remain set to 1 until the next read operation.
• If the output command is ON, then FS will remain at Logic [0]. The output must be turned OFF and ON again to re-enable the state of output and release FS . The UVF bit will remain set to 1 until the next read operation. The under-voltage protection can be disabled through the SPI (bit UV_dis = 1). In this case, the FS and UVF bit do not report any under-voltage fault condition and the output state will not be changed as long as the battery voltage does not drop any lower than 2.5V. OPEN LOAD FAULT (NON-LATCHING) The 33988 incorporates open load detection circuitry on each output. Output open load fault (OLF) is detected and reported as a fault condition when that output is disabled (OFF). The open load fault is detected and latched into the status register after the internal gate voltage is pulled low enough to turn OFF the output. The OLF fault bit is set in the status register. If the open load fault is removed, the status register will be cleared after reading the register. The open load protection can be disabled trough SPI (bit OL_dis). It is recommended to disable the open load detection circuitry (OL_dis bit sets to logic [1]) in case of permanent open load fault condition. OVER-CURRENT FAULT (LATCHING) The device has eight programmable over-current low detection levels (IOCL) and two programmable over-current high detection levels (IOCH) for maximum device protection. The two selectable, simultaneously active over-current detection levels, defined by IOCH and IOCL, are illustrated in

Figure 6. The eight different over-current low detect levels (IOCL0 : IOCL7) are likewise illustrated in Figure 6. device will latch the effected output OFF. the output, regardless of the selected tOCL driver. until the device is commanded OFF and then ON again. enhanced to keep the junction temperature less than 150°C.

Table 7. Device Behavior in Case of Under-voltage ∗∗ While VDD remains within specified range. ∗∗∗ = IN is equivalent to IN direct input or IN_spi SPI input.

22 Freescale Semiconductor

impedance). See Figure 10 and Figure 11. Table 8. Register addressing and configuration are described Figure 10. Single 8-Bit Word SPI Communication

1. RSTB is in a logic 1 state during the above operation.
2. D0, D1, D2, ..., and D7 relate to the most recent ordered entry of data into the SPSS
3. OD0, OD1, OD2, ..., and OD7 relate to the first 8 bits of ordered fault and status data out
4. RST is a Logic [1] state during the above operation.
5. D7:D0 relate to the most recent ordered entry of data into the device.
6. OD7:OD0 relate to the first 8 bits of ordered fault and status data out of the device.

Figure 11. Multiple 8-Bit Word SPI Communication with the MSB, D7, and ending with the LSB, D0 (Table 8). control the outputs and their protection features. latch in a message that is not eight bits will be ignored. configure the device and to control the state of the output. addressed via D6 : D4 of the incoming SPI word (Table 8).

1. RSTB i s i n a l ogi c 1 st at e dur i ng t he above oper at i on.
2. O D0, O D1, O D2, . . . , and O D7 r epr esent t he f i r st 8 bi t s of or der ed f aul t and st at us dat a out of t he SPSS
3. RST is a Logic [1] state during the above operation.
4. D7:D0 relate to the most recent ordered entry of data into the device.
5. OD7:OD0 relate to the first 8 bits of ordered fault and status data out of the device.
6. D7*:D0* relate to the previous 8 bits (last command word) of data that was previously shifted into the device.

Table 8. SI Message Bit Assignment MSB D7 Register address bit for output selection. D6 : D4 Register address bits. Table 9. Serial Input Address and Configuration Bit Map

24 Freescale Semiconductor

addresses and their impact on device operation. D2:D0, determine the content of the first eight bits of SO data. feed the watchdog if enabled. level to one of eight possible levels, as shown in Table 10. levels, which is described inTable 11. disables the open load (OL) detection feature. Table 10. Over-current Low Detection Levels Table 11. Over-current High Detection Levels Table 12. Over-current Low Detection Blanking Time

Logic [0] will configure the direct input control for the HS0. corresponds to the low speed slew rate. transitions initiated via SPI (not via direct input). reported in the output fault register. accessible with the SPI during normal operation. Table 13. Switching Delay Table 14. Watchdog Timeout

26 Freescale Semiconductor

able to accept new fault status information.

• The previous SPI communication was determined to be invalid. In this case, the status will be reported as though the invalid SPI communication never occurred.
• Battery transients below 6.0V resulting in an under- voltage shutdown of the outputs may result in incorrect data loaded into the status register. The SO data transmitted to the MCU during the first SPI communication following an under-voltage V PWR condition should be ignored.
• T h e RST pin transition from a Logic [0] to Logic [1] while the WAKE pin is at Logic [0] may result in incorrect data loaded into the status register. The SO data transmitted to the MCU during the first SPI communication following this condition should be ignored. SERIAL OUTPUT BIT ASSIGNMENT The 8 bits of serial output data depend on the previous serial input message, as explained in the following paragraphs. Table 15 summarizes the SO register content. Bit OD7 reflects the state of the watchdog bit (D7) addressed during the prior communication. The value of the previous D7 will determine which output the status information applies to for the Fault (FLTR), SOCHLR, CDTOLR, and DICR registers. SO data will represent information ranging from fault status to register contents, user selected by writing to the STATR bits D2:D0. Note that the SO data will continue to reflect the information for each output (depending on the previous D7 state) that was selected during the most recent STATR write until changed with an updated STATR write. Previous Address SOA[2:0] = 000 If the previous three MSBs are 000, bits OD6 : OD0 will reflect the current state of the Fault register (FLTR) corresponding to the output previously selected with the bit OD7 (Table 16). Previous Address SOA[2:0] = 001 Data in bits OD1:OD0 contain CSNS0 EN and IN0_SPI programmed bits, respectively. Data in bits OD3:OD2 contain CSNS0 EN and IN0_SPI programmed bits, respectively. Previous Address SOA[2:0] = 010 The data in bit OD3 contain the programmed over-current high detection level (refer to Table 11), and the data in bits OD2:OD0 contain the programmed over-current low detection levels (refer to Table 12).

Table 15. Serial Output Bit Map Description s = Selection of output: Logic [0] = HS0, Logic [1] = HS1.

active. OD3 reports if the open load circuitry is active.

• SOA3 = 0. The returned data contain the programmed values in the OSDR. Bit OD3 (FSM_HS0) reflects the state of the output HS0 in the Fail-safe mode after a watchdog timeout occurs.
• SOA3 = 1. The returned data contain the programmed values in the WDR. Bit OD2 (WDTO) reflects the status of the watchdog circuitry. If WDTO bit is Logic [1], the watchdog has timed out and the device is in Fail-safe mode. If WDTO is Logic [0], the device is in Normal mode (assuming the device is powered and not in Sleep mode), with the watchdog either enabled or disabled. Bit OD3 (FSM_HS1) reflects the state of the output HS1 in the Fail-safe mode after a watchdog timeout occurs. Previous Address SOA[2:0] = 110
• SOA3 = 0. OD3:OD0 return t he state of the IN1, IN0, FSI, and WAKE pins, respectively (Table 17).
• SOA3 = 1. The returned data contain the programmed values in the UOVR. Bit OD1 reflects the state of the under-voltage protection and bit OD0 reflects the state of the over-voltage protection. Refer to Table 15). Previous Address SOA[2:0] =111 Null Data. No previous register Read Back command received, so bits OD2:OD0 are null, or 000.

Table 16. Fault Register OD7 (s) = Selection of output: Logic [0] = HS0, Logic [1] = HS1. OD6 (OTF) = Over-temperature Flag. OD3 (OLFs) = Open Load Flag. OD1 (OVF) = Over-voltage Flag. a new Switch ON command (via SPI or direct input IN). Table 17. Pin Register

28 Freescale Semiconductor

The 33988 can be configured in several applications. The figure below shows the 33988 in a typical main switch application. Figure 12. Typical Applications

• propose safe configurations of the eXtreme Switch devices in case of application faults and protect all circuitry with minimum external components (AN 3274),
• provide guidelines for Printed Circuit Board (PCB) design and assembly (AN 2469). Development effort will be required by the end users to optimize the board design and PCB layout in order to reach electromagnetic compatibility standards (emission and immunity). A/D MCU I/O I/O SI SO SCLK I/O CS SI FS VDD FSI CSNS RST CS IN0 SCLK WAKE NC VPWR 33988 100nF 10µF VDD VDD GND HS1 HS0 VPWR VPWR 2.5µF 10nF LOAD RFS1k 2.2k 10k VDD 131 LOAD Voltage Regulator VDD VPWR IN1 I/O SO11 10k 10k 10k 10k 10k 10k

29 Freescale Semiconductor

Figure 13. Maximum Turn-off Current Versus Inductive Load (Single Pulse for RL = 0 and VPWR = 12 V at TJ = 150°C Initial)

Analog Integrated Circuit Device Data

30 Freescale Semiconductor

The 33988 is packaged in a surface mount power package intended to be soldered directly on the printed circuit board. The 33988 was qualified in accordance with JEDEC standards JESD22-A113-B and J-STD-020A. The recommended reflow conditions are as follows:

• Convection: 225°C +5 .0/ -0°C
• Vapor Phase Reflow (VPR): 215°C to 219°C
• Infrared (IR) / Convection: 225°C +5.0 / -0°C The maximum peak temperature during the soldering process should not exceed 230°C. The time at maximum temperature should range from 10s to 40s maximum.

Analog Integrated Circuit Device Data Freescale Semiconductor 31 33988 PACKAGING PACKAGE DIMENSIONS PACKAGE DIMENSIONS For the most current revision of the package, visit www.freescale.com and perform a keyword search on 98ARL10521D. PNA SUFFIX 16-PIN PQFN 98ARL10521D ISSUE C

Analog Integrated Circuit Device Data

32 Freescale Semiconductor

PACKAGE DIMENSIONS (CONTINUED) PACKAGE DIMENSIONS (CONTINUED) PNA SUFFIX 16-PIN PQFN 98ARL10521D ISSUE C

Analog Integrated Circuit Device Data Freescale Semiconductor 33 33988

REVISION HISTORY

REVISION DATE DESCRIPTION OF CHANGES 1.0 1/2007 • Initial release 2.0 5/2007 • Changed typ and max number on Output Turn-ON Delay Time in Fast/Slow Slew Rate(20)

• Changed min on Output Turn-OFF Delay Time in Fast Slew Rate Mode(21)
• Changed labels on HS1 Switching Delay Time (OSD[2:0]) and HS0 Switching Delay Time (OSD[2:0])
• Corrected labels on Figure 12, Typical Applications 3.0 8/2007 • Updated Freescale format and style
• Updated Junction-to-Ambient
• Added Functional Internal Block Description
• Updated Device Behavior in Case of Under-voltage 4.0 11/2009 • Added one paragraph and figure to Typical Applications

How to Reach Us: Home Page: www.freescale.com Web Support: http://www.freescale.com/support USA/Europe or Locations Not Listed: Freescale Semiconductor, Inc. Technical Information Center, EL516

2100 East Elliot Road

Tempe, Arizona 85284 1-800-521-6274 or +1-480-768-2130 www.freescale.com/support Europe, Middle East, and Africa: Freescale Halbleiter Deutschland GmbH Technical Information Center Schatzbogen 7

81829 Muenchen, Germany

+44 1296 380 456 (English) +46 8 52200080 (English) +49 89 92103 559 (German) +33 1 69 35 48 48 (French) www.freescale.com/support Japan: Freescale Semiconductor Japan Ltd. Headquarters ARCO Tower 15F 1-8-1, Shimo-Meguro, Meguro-ku, Tokyo 153-0064 Japan 0120 191014 or +81 3 5437 9125 support.japan@freescale.com Asia/Pacific: Freescale Semiconductor China Ltd. Exchange Building 23F No. 118 Jianguo Road Chaoyang District Beijing 100022 China +86 10 5879 8000 support.asia@freescale.com For Literature Requests Only: Freescale Semiconductor Literature Distribution Center P.O. Box 5405 Denver, Colorado 80217 1-800-441-2447 or +1-303-675-2140 Fax: +1-303-675-2150 LDCForFreescaleSemiconductor@hibbertgroup.com Freescale™ and the Freescale logo are trademarks of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners. © Freescale Semiconductor, Inc. 2007 - 2009. All rights reserved. MC33988 Rev. 4.0 Information in this document is provided solely to enable system and software implementers to use Freescale Semiconductor products. There are no express or implied copyright licenses granted hereunder to design or fabricate any integrated circuits or integrated circuits based on the information in this document. Freescale Semiconductor reserves the right to make changes without further notice to any products herein. Freescale Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does Freescale Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. “Typical” parameters that may be provided in Freescale Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals”, must be validated for each customer application by customer’s technical experts. Freescale Semiconductor does not convey any license under its patent rights nor the rights of others. Freescale Semiconductor products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the Freescale Semiconductor product could create a situation where personal injury or death may occur. Should Buyer purchase or use Freescale Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold Freescale Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that Freescale Semiconductor was negligent regarding the design or manufacture of the part.