X5R AVX | Alldatasheet

Document overview

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Technical content

  • General Purpose Dielectric for Ceramic Capacitors
  • EIA Class II Dielectric
  • Temperature variation of capacitance is within ±15% from -55°C to +85°C
  • Well suited for decoupling and filtering applications
  • Available in High Capacitance values (up to 100µF) 10 5 -10 -15 -20 -60 -40 -20 0 +20 +40 +60 +80 10,000 1,000 100 0 100 12080 6040 20 X5R Dielectric General Specifications PART NUMBER (see page 2 for complete part number explanation) 1210 Size (L” x W”) 0101 0201 0402 0603 0805 1206 1210 1812 EIA 01005 Voltage 4 = 4V 6 = 6.3V Z = 10V Y = 16V 3 = 25V D = 35V 5 = 50V 1 = 100V D Dielectric D = X5R 107 Capacitance Code (In pF) 2 Sig. Digits + Number of Zeros M Capacitance Tolerance K = ±10% M = ±20% NOTE: Contact factory for availability of Tolerance Options for Specific Part Numbers. Contact factory for non-specified capacitance values. TYPICAL ELECTRICAL CHARACTERISTICS Temperature Coefficient % Capacitance Temperature °C A Failure Rate A = N/A Insulation Resistance (Ohm-Farads) T Terminations T = Plated Ni and Sn Packaging 2 = 7” Reel 4 = 13” Reel U = 4mm TR (01005) A Special Code A = Std. Insulation Resistance vs Temperature Temperature °C 042418 2626

Specifications and Test Methods 042418 2727 Parameter/Test X5R Specification Limits Measuring Conditions Operating Temperature Range -55ºC to +85ºC Temperature Cycle Chamber Capacitance Within specified tolerance Freq.: 1.0 kHz ± 10% Voltage: 1.0Vrms ± .2V For Cap > 10 µF, 0.5Vrms @ 120HzDissipation Factor ≤ 2.5% for ≥ 50V DC rating ≤ 12.5% for 25V, 35V DC rating ≤ 12.5% Max. for 16V DC rating and lower Contact Factory for DF by PN Insulation Resistance 10,000MΩ or 500MΩ - µF, whichever is less Charge device with rated voltage for 120 ± 5 secs @ room temp/humidity Dielectric Strength No breakdown or visual defects Charge device with 250% of rated voltage for 1-5 seconds, w/charge and discharge current limited to 50 mA (max) Resistance to Flexure Stresses Appearance No defects Deflection: 2mm Test Time: 30 seconds Capacitance Variation ≤ ±12% Dissipation Factor Meets Initial Values (As Above) Insulation Resistance ≥ Initial Value x 0.3 Solderability ≥ 95% of each terminal should be covered with fresh solder Dip device in eutectic solder at 230 ± 5ºC for 5.0 ± 0.5 seconds Resistance to Solder Heat Appearance No defects, <25% leaching of either end terminal Dip device in eutectic solder at 260ºC for 60sec- onds. Store at room temperature for 24 ± 2hours before measuring electrical properties. Capacitance Variation ≤ ±7.5% Dissipation Factor Meets Initial Values (As Above) Insulation Resistance Meets Initial Values (As Above) Dielectric Strength Meets Initial Values (As Above) Thermal Shock Appearance No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes Capacitance Variation ≤ ±7.5% Step 2: Room Temp ≤ 3 minutes Dissipation Factor Meets Initial Values (As Above) Step 3: +85ºC ± 2º 30 ± 3 minutes Insulation Resistance Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes Dielectric Strength Meets Initial Values (As Above) Repeat for 5 cycles and measure after 24 ± 2 hours at room temperature Load Life Appearance No visual defects Charge device with 1.5X rated voltage in test chamber set at 85ºC ± 2ºC for 1000 hours (+48, -0). Note: Contact factory for *optional specification part numbers that are tested at < 1.5X rated voltage. Remove from test chamber and stabilize at room temperature for 24 ± 2 hours Capacitance Variation ≤ ±12.5% Dissipation Factor ≤ Initial Value x 2.0 (See Above) Insulation Resistance ≥ Initial Value x 0.3 (See Above) Dielectric Strength Meets Initial Values (As Above) Load Humidity Appearance No visual defects Store in a test chamber set at 85ºC ± 2ºC/ 85% ± 5% relative humidity for 1000 hours (+48, -0) with rated voltage applied. Remove from chamber and stabilize at room temperature and humidity for 24 ± 2 hours before measuring. Capacitance Variation ≤ ±12.5% Dissipation Factor ≤ Initial Value x 2.0 (See Above) Insulation Resistance ≥ Initial Value x 0.3 (See Above) Dielectric Strength Meets Initial Values (As Above) 100917 5 C0G (NP0) Dielectric Specifications and Test Methods Parameter/Test NP0 Specification Limits Measuring Conditions Operating Temperature Range -55ºC to +125ºC Temperature Cycle Chamber Capacitance Within specified tolerance Freq.: 1.0 MHz ± 10% for cap ≤ 1000 pF Q <30 pF: Q≥ 400+20 x Cap Value 1.0 kHz ± 10% for cap > 1000 pF ≥30 pF: Q≥ 1000 Voltage: 1.0Vrms ± .2V Insulation Resistance 100,000MΩ or 1000MΩ - µF, Charge device with rated voltage for whichever is less 60 ± 5 secs @ room temp/humidity Charge device with 250% of rated voltage for Dielectric Strength No breakdown or visual defects 1-5 seconds, w/charge and discharge current limited to 50 mA (max) Note: Charge device with 150% of rated voltage for 500V devices. Appearance No defects Deflection: 2mm Capacitance Test Time: 30 seconds Resistance to Variation ±5% or ±.5 pF, whichever is greater Flexure Q Meets Initial Values (As Above)Stresses Insulation ≥ Initial Value x 0.3Resistance Solderability ≥ 95% of each terminal should be covered Dip device in eutectic solder at 230 ± 5ºC with fresh solder for 5.0 ± 0.5 seconds Appearance No defects, <25% leaching of either end terminal Capacitance Variation ≤ ±2.5% or ±.25 pF, whichever is greater Dip device in eutectic solder at 260ºC for 60 Q Meets Initial Values (As Above) seconds. Store at room temperature for 24 ± 2Resistance to hours before measuring electrical properties.Solder Heat Insulation Meets Initial Values (As Above)Resistance Dielectric Meets Initial Values (As Above)Strength Appearance No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes Capacitance Variation ≤ ±2.5% or ±.25 pF, whichever is greater Step 2: Room Temp ≤ 3 minutes Q Meets Initial Values (As Above) Step 3: +125ºC ± 2º 30 ± 3 minutesThermal Shock Insulation Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutesResistance Dielectric Meets Initial Values (As Above) Repeat for 5 cycles and measure after Strength 24 hours at room temperature Appearance No visual defects Capacitance Variation ≤ ±3.0% or ± .3 pF, whichever is greater Charge device with twice rated voltage in ≥ 30 pF: Q≥ 350 test chamber set at 125ºC ± 2ºC Load Life Q ≥10 pF, <30 pF: Q≥ 275 +5C/2 for 1000 hours (+48, -0).(C=Nominal Cap) <10 pF: Q≥ 200 +10C Insulation ≥ Initial Value x 0.3 (See Above) Remove from test chamber and stabilize at Resistance room temperature for 24 hours Dielectric Meets Initial Values (As Above) before measuring. Strength Appearance No visual defects Capacitance Variation ≤ ±5.0% or ± .5 pF, whichever is greater Store in a test chamber set at 85ºC ± 2ºC/ ≥ 30 pF: Q≥ 350 85% ± 5% relative humidity for 1000 hours Load Q ≥10 pF, <30 pF: Q≥ 275 +5C/2 (+48, -0) with rated voltage applied. Humidity <10 pF: Q≥ 200 +10C Insulation ≥ Initial Value x 0.3 (See Above) Remove from chamber and stabilize at Resistance room temperature for 24 ± 2 hours Dielectric Meets Initial Values (As Above) before measuring. Strength

Case Size 0101* 0201 0402 0603 0805 Soldering Reflow Only Reflow Only Reflow/Wave Reflow/Wave Reflow/Wave Packaging Paper/Embossed All Paper All Paper All Paper Paper/Embossed (L) Length mm (in.) 0.40 ± 0.02 (0.016 ± 0.0008) 0.60 ± 0.09 (0.024 ± 0.004) 1.00 ± 0.15 (0.040 ± 0.006) 1.60 ± 0.15 (0.063 ± 0.006) 2.01 ± 0.20 (0.079 ± 0.008) (W) Width mm (in.) 0.20 ± 0.02 (0.008 ± 0.0008) 0.30 ± 0.09 (0.011 ± 0.004) 0.50 ± 0.15 (0.020 ± 0.006) 0.81 ± 0.15 (0.032 ± 0.006) 1.25 ± 0.20 (0.049 ± 0.008) (t) Terminal mm (in.) 0.10 ± 0.04 (0.004 ± 0.0016) 0.15 ± 0.05 (0.006 ± 0.002) 0.25 ± 0.15 (0.010 ± 0.006) 0.35 ± 0.15 (0.014 ± 0.006) 0.50 ± 0.25 (0.020 ± 0.010) Cap(pF) 100 101 B A 150 151 B A 220 221 B A C 330 331 B A C 470 471 B A C 680 681 B A C 1000 102 B A A C 1500 152 B B A A C 2200 222 B B A A A C 3300 332 B B A A A C 4700 472 B B A A A C G 6800 682 B B A A A C G Cap(µF) 0.01 103 B B A A A C G G G 0.015 150 B C G G G 0.022 223 B A A A A C C G G G N 0.033 333 B C G G G N 0.047 473 B A A A A C C G G G N 0.068 689 B C G G N 0.1 104 B A A A A C C C C G G G N N N 0.15 154 G N N 0.22 224 B A A A C C C C C G G N N N 0.33 334 G G N 0.47 474 B A A C C C C C E G J N P P 0.68 684 G N 1.0 105 A A C C C C C C C E G G G G J G G N N P P 1.5 155 2.2 225 C C C C C C C C G G J J J K K N N N P P 3.3 335 J J J N N 4.7 475 A C E E E E J J J G G N N J N N P P 10 106 E E E K J J J P P P P P P P 22 226 E E K K K P P P P P 47 476 K K P P P 100 107 P P Case Size 0101* 0201 0402 0603 0805 Letter A B C E G J K M N P Q X Y Z PAPER EMBOSSED PAPER and EMBOSSED available for 01005 NOTE: Contact factory for non-specified capacitance values *EIA 01005 PREFERRED SIZES ARE SHADED 062618

Letter A B C E G J K M N P Q X Y Z Max. Thickness 0.33 (0.013) 0.22 (0.009) 0.56 (0.022) 0.71 (0.028) 0.90 (0.035) 0.94 (0.037) 1.02 (0.040) 1.27 (0.050) 1.40 (0.055) 1.52 (0.060) 1.78 (0.070) 2.29 (0.090) 2.54 (0.100) 2.79 (0.110) PAPER EMBOSSED How to Order Part Number Explanation PAPER and EMBOSSED available for 01005 NOTE: Contact factory for non-specified capacitance values *EIA 01005 PREFERRED SIZES ARE SHADED 072318 Case Size 1206 1210 1812 Soldering Reflow/Wave Reflow Only Reflow Only Packaging Paper/Embossed Paper/Embossed All Embossed (L) Length mm 3.20 ± 0.20 (0.126 ± 0.008) 3.20 ± 0.20 (0.126 ± 0.008) 4.50 ± 0.30 (W) Width mm 1.60 ± 0.20 (0.063 ± 0.008) 2.50 ± 0.20 (0.098 ± 0.008) 3.20 ± 0.20 (t) Terminal mm 0.50 ± 0.25 (0.020 ± 0.010) 0.50 ± 0.25 (0.020 ± 0.010) 0.61 ± 0.36 Voltage: 4 6.3 10 16 25 35 50 4 6.3 10 16 25 35 50 4 6.3 10 16 25 35 50 Cap(pF) 100 101 150 151 220 221 330 331 470 471 680 681 1000 102 1500 152 2200 222 3300 332 4700 472 6800 682 Cap(µF) 0.01 103 0.015 150 0.022 223 0.033 333 0.047 473 0.068 689 0.1 104 0.15 154 0.22 224 0.33 334 0.47 474 Q Q X X 0.68 684 1.0 105 Q Q Q X X X 1.5 155 2.2 225 Q Q Q Q Q X Z Z 3.3 335 Q Q 4.7 475 X X X X X X X Z Z Z Z Z 10 106 X X X X X X X X X Z Z Z Z Z 22 226 X X X X X Z Z Z Z Z Z Z Z Z Z 47 476 X X X X Z Z Z Z Z 100 107 X X X Z Z Z Z Voltage: 4 6.3 10 16 25 35 50 4 6.3 10 16 25 35 50 4 6.3 10 16 25 35 50 Case Size 1206 1210 1812