01005B100F500CT

01R5N100C160CT WALSIN | Alldatasheet

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Multilayer Ceramic Capacitors Approval Sheet Page 1 of 8 ASC_Ultra Small_(01R5)_026F_AS Dec. 2018 *Contents in this sheet are subject to change without prior notice. MULTILAYER CERAMIC CAPACITORS Ultra-small Series (6.3V to 50V)

01005 Size

NP0, X7R & X5R Dielectrics Halogen Free & RoHS Compliance

Multilayer Ceramic Capacitors Approval Sheet Page 2 of 8 ASC_Ultra Small_(01R5)_026F_AS Dec. 2018 1. INTRODUCTION MLCC consists of a conducting material and electrodes. To manufacture a chip-type SMT and achieve miniaturization, high density and high efficiency, ceramic condensers are used. 01R5 MLCC is performed by high precision technology achieve high capacitance in unit size and ensure the stability and reliability of products. 4. HOW TO ORDER 01R5 N 100 C 160 C T Size Inch (mm) 01R5 = 01005 (0402) Dielectric N =NP0 (C0G) B =X7R X=X5R Capacitance Two significant digits followed by no. of zeros. And R is in place of decimal point. eg.: 0R5=0.5pF 1R0=1.0pF 100=10x10 =10pF Tolerance A=±0.05pF B =±0.1pF C =±0.25pF D =±0.5pF F=±1% G =±2% J=±5% K =±10% M =±20% Rated voltage Two significant digits followed by no. of zeros. And R is in place of decimal point. 6R3 =6.3 VDC 100 =10 VDC 160 =16 VDC 250=25 VDC 500=50 VDC Termination C =Cu/Ni/Sn Packaging T=7” reeled 2. FEATURES a. High capacitance in unit size. b. High precision dimensional tolerances. c. Suitable used in high-accuracy automatic mounting machine. 3. APPLICATIONS a. Miniature microwave module. b. Portable equipments (ex. Mobile phone, PDA). c. High frequency circuits.

Multilayer Ceramic Capacitors Approval Sheet Page 3 of 8 ASC_Ultra Small_(01R5)_026F_AS Dec. 2018 5. EXTERNAL DIMENSIONS 6. GENERAL ELECTRICAL DATA Size 01R5 Dielectric NP0 X7R X5R Capacitance* 0.2pF to 100pF 100pF to 1000pF 1000pF to 0.1µF Capacitance tolerance** Cap ≤5pF: A (±0.05pF), B (±0.1pF), C (±0.25pF) 5pF<Cap<10pF: C (±0.25pF), D (±0.5pF) Cap ≥10pF: K (±10%), M (±20%) Rated voltage (WVDC) 16V, 25V, 50V 10V 6.3V, 10V DF / Q #1 Cap<30pF, Q ≥400+20C Cap ≥30pF, Q ≥1000 ≤5 % ≤10 % Insulation resistance at Ur ≥10G Ω or RxC ≥500 Ω*F whichever is less RxC ≥50Ω*F Operating temperature -55 to +125° C -55 to +125° C -55 to +85° C Capacitance change ±30ppm ±15% Termination Ni/Sn (lead-free termination) * Measured at 30~70% related humidity. NP0: Apply 0.5~5Vrms, 1.0MHz±10% at the condition of 25° C ambient temperature. X7R: Apply 1.0±0.2Vrms, 1.0kHz±10%, at 25° C ambient temperature. ** Preconditioning for Class II MLCC: Perform a heat treatment at 150±10° C for 1 hour, then leave in ambient condition for 24±2 hours before measurement. #1: Please refer to “RELIABILITY TEST CONDITIONS AND REQUIREMENTS” for detail T W L MB MB Fig. 1 The outline of MLCC Size Inch (mm) L (mm) W (mm) T (mm)/Symbol M B (mm) * Reflow soldering only.

Multilayer Ceramic Capacitors Approval Sheet Page 4 of 8 ASC_Ultra Small_(01R5)_026F_AS Dec. 2018 7. CAPACITANCE RANGE 8. PACKAGING DIMENSION AND QUANTITY Size Thickness (mm)/Symbol Paper tape 7” reel 13” reel 01R5 (0402) 0.20±0.02 V 20,000 - Unit: pieces SIZE 01R5 DIELECTRIC X7R RATED VOLTAGE (VDC) 10 Capacitance 100pF (101) V 150pF (151) V 220pF (221) V 330pF (331) V 470pF (471) V 1,000pF (102) V SIZE 01R5 DIELECTRIC X5R RATED VOLTAGE (VDC) 6.3 10 Capacitance 1,000pF (102) V V 1,500pF (152) V 2,20 0pF (222) V 3,300pF (332) V 4,700pF (472) V 6,800pF (682) V 0.010 µF (103) V V 0.015 µF (153) 0.022 µF (223) V 0.033 µF (333) V 0.047 µF (473) V 0.068 µF (683) 0.10 µF (104) V SIZE 01R5 DIELECTRIC NP0 RATED VOLTAGE (VDC) 16 25 50 Capacitance 0. 2pF (0R 2) V V V 0.3 pF ( 0R 3) V V V 0.4 pF ( 0R 4) V V V 0. 5pF (0R 5) V V V 1.0pF (1R0) V V V 1. 5pF (1R 5) V V V 2.0pF ( 2R0) V V V 3.0pF ( 3R0) V V V 4.0pF ( 4R0) V V V 5.0pF ( 5R0) V V V 6.0pF ( 6R0) V V V 7.0pF ( 7R0) V V V 8.0pF ( 8R0) V V V 9.0pF ( 9R0) V V V 10pF (100) V V V 12pF (120) V V V 15pF (150) V V V 18pF (180) V V V 22pF (220) V V V 27pF (270) V V V 33pF (330) V V V 39pF (390) V V V 47pF (470) V V V 56pF (560) V V V 68pF (680) V V V 82pF (820) V V V 100pF (101) V V V 1. The letter in cell is expressed the symbol of product thickness. 2. For more information about products with special capacitance or other data, please contact WTC local representative.

Multilayer Ceramic Capacitors Approval Sheet Page 5 of 8 ASC_Ultra Small_(01R5)_026F_AS Dec. 2018 9. RELIABILITY TEST CONDITIONS AND REQUIREMENTS No. Item Test Condition Requirements 1. Visual and Mechanical --- * No remarkable defect. * Dimensions to conform to individual specification sheet. 2. Capacitance Class I: NP0 Cap ≤1000pF, 0.5~5Vrms, 1MHz±10% Cap>1000pF, 1.0±0.2Vrms, 1KHz±10% Class II: , X7R & X5R(≥10V) 1.0±0.2Vrms, 1KHz±10% Class II: , X5R(≤6.3V) 0.5±0.2Vrms, 1kHz±10% *Before initial measurement (Class II only): To apply de-aging at 150° C for 1hr then set for 24±2 hrs at room temp. * Shall not exceed the limits given in the detailed spec. 3. Q/ D.F. (Dissipation Factor) * NP0: Cap ≥30pF, Q ≥1000; Cap<30pF, Q ≥400+20C X7R: ≤5.0 % X5R: ≤10 % 4. Dielectric Strength * To apply voltage ( ≤100V) 250%. * Duration: 1 to 5 sec. * Charge and discharge current less than 50mA. * No evidence of damage or flash over during test. 5. Insulation Resistance To apply rated voltage for max. 120 sec. * NP0, X7R: ≥10G Ω or RxC ≥500 Ω-F whichever is smaller. X5R: RxC ≥50Ω-F 6. Temperature Coefficient With no electrical load. T.C. Operating Temp NPO -55~125° C at 25° C X7R -55~125° C at 25° C X5R -55~ 85° C at 25° C *Before initial measurement (Class II only): To apply de-aging at 150° C for 1hr then set for 24±2 hrs at room temp. *Measurement voltage for Class II Cap ≤0.01µF: 0.5V Cap>0.01µF: 0.2V T.C. Capacitance Change NPO Within ±30ppm/° C X7R Within ±15% X5R Within ±15% 7. Adhesive Strength of Termination * Pressurizing force ：1N * Test time: 10±1 sec. * No remarkable damage or removal of the terminations. 8. Vibration Resistance * Vibration frequency: 10~55 Hz/min. * Total amplitude: 1.5mm * Test time: 6 hrs. (Two hrs each in three mutually perpendicular directions.) * Before initial measurement (Class II only): To apply de-aging at 150° C for 1hr then set for 24±2 hrs at room temp. * Cap./DF(Q) Measurement to be made after de-aging at 150° C for 1hr then set for 24±2 hrs at room temp. * No remarkable damage. * Cap change and Q/D.F.: To meet initial spec. Solderability * Solder temperature: 235±5° C * Dipping time: 2±0.5 sec. 95% min. coverage of all metalized area. 10. Bending Test * The middle part of substrate shall be pressurized by means of the pressurizing rod at a rate of about 1 mm per second until the deflection becomes 1 mm and then the pressure shall be maintained for 5±1 sec. * Before initial measurement (Class II only): To apply de-aging at 150° C for 1hr then set for 24±2 hrs at room temp. * Measurement to be made after keeping at room temp. for 24±2 hrs. * No remarkable damage. * Cap change: NP0: within ±5.0% or ±0.5pF whichever is larger. X7R: within ±12.5% X5R: within ±25.0% (This capacitance change means the change of capacitance under specified flexure of substrate from the capacitance measured before the test.)

Multilayer Ceramic Capacitors Approval Sheet Page 6 of 8 ASC_Ultra Small_(01R5)_026F_AS Dec. 2018 No. Item Test Condition Requirements 11. Resistance to Soldering Heat * Solder temperature: 260±5° C * Dipping time: 10±1 sec * Preheating: 120 to 150° C for 1 minute before immerse the capacitor in a eutectic solder. * Before initial measurement (Class II only): To apply de-aging at 150° C for 1hr then set for 24±2 hrs at room temp. * Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150° C for 1hr then set for 24±2 hrs at room temp. * No remarkable damage. * Cap change: NP0: within ±2.5% or ±0.25pF whichever is larger. X7R: within ±7.5% X5R: within ±15.0% * 25% max. leaching on each edge. 12. Temperature Cycle * Conduct the five cycles according to the temperatures and time. Step Temp. (° C) Time (min.) 1 Min. operating temp. +0/-3 30±3 2 Room temp. 2~3 3 Max. operating temp. +3/-0 30±3 4 Room temp. 2~3 * Before initial measurement (Class II only): To apply de-aging at 150° C for 1hr then set for 24±2 hrs at room temp. * Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150° C for 1hr then set for 24±2 hrs at room temp. * No remarkable damage. * Cap change: NP0: within ±2.5% or ±0.25pF whichever is larger. X7R: within ±7.5% X5R: within ±15.0% 13. Humidity (Steady State) * Test temp.: 40±2° C * Humidity: 90~95% RH * Test time: 500+24/-0hrs. * Before initial measurement (Class II only): To apply de-aging at 150° C for 1hr then set for 24±2 hrs at room temp. * Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150° C for 1hr then set for 24±2 hrs at room temp. * No remarkable damage. * Cap change: NP0: within ±5.0% or ±0.5pF whichever is larger. X7R: within ±12.5% X5R: within ±25.0% * Q/D.F. value: NP0: Cap ≥30pF, Q ≥350; 10pF ≤Cap<30pF, Q ≥275+2.5C Cap<10pF; Q ≥200+10C X7R: ≤7.5% X5R: ≤20% * I.R.: NP0, X7R: ≥1G Ω or RxC ≥50Ω-F whichever is smaller. X5R: RxC ≥10 Ω-F. 14. Humidity Load (Damp Heat) * Test temp.: 40±2° C * Humidity: 90~95%RH * Test time: 500+24/-0 hrs. * To apply voltage ：rated voltage. * Before initial measurement (Class II only): To apply de-aging at 150° C for 1hr then set for 24±2 hrs at room temp. * Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150° C for 1hr then set for 24±2 hrs at room temp. * No remarkable damage. * Cap change: NP0: within ±7.5% or ±0.75pF whichever is larger. X7R: within ±15.0% X5R: within ±25.0% * Q/D.F. value: NP0: Cap ≥30pF, Q ≥200; Cap<30pF; Q ≥100+10/3C X7R: ≤7.5% X5R: ≤20% * I.R.: NP0, X7R: ≥500M Ω or RxC ≥25 Ω-F whichever is smaller. X5R: RxC ≥5Ω-F. 15. High Temperature Load (Endurance) * Test temp.: NP0, X7R: 125±3° C X5R: 85±3° C * To apply voltage: (1) NP0, X7R : 200% of rated voltage (2) X5R: 10V : 150 % of rated voltage 6.3V : 100 % of rated voltage * Test time: 1000+24/-0 hrs. * Before initial measurement (Class II only): To apply de-aging at 150° C for 1hr then set for 24±2 hrs at room temp. * Cap. / DF(Q) / I.R. Measurement to be made after de-aging at 150° C for 1hr then set for 24±2 hrs at room temp. ** De-rating conditions: * No remarkable damage. * Cap change: NP0: within ±3.0% or ±0.3pF whichever is larger. X7R: within ±12.5% X5R: within ±25.0% * Q/D.F. value: NP0: Cap ≥30pF, Q ≥350; 10pF ≤Cap<30pF, Q ≥275+2.5C Cap<10pF; Q ≥200+10C X7R: ≤7.5% X5R: ≤20% * I.R.: NP0, X7R: ≥1G Ω or RxC ≥50Ω-F whichever is smaller. X5R: RxC ≥10 Ω-F.

Multilayer Ceramic Capacitors Approval Sheet Page 7 of 8 ASC_Ultra Small_(01R5)_026F_AS Dec. 2018 APPENDIXES ◙ Tape & reel dimensions ◙ Example of customer label *Customized label is available upon request Fig. 3 The dimension of reel Fig. 2 The dimension of paper tape Size 01R5 Reel size 7” C 13.0+0.5/-0.2 W 1 8.4+1.5/-0 A 178.0±1.0 N 60.0+1.0/-0 a. Customer name b. WTC order series and item number c. Customer P/O d. Customer P/N e. Description of product f. Quantity g. Bar code including quantity & WTC P/N or customer h. WTC P/N i. Shipping date j. Order bar code including series and item numbers k. Serial number of label Size 01R5 Thickness V A0 0.25 +/-0.05 B 0 0.45 +/-0.05 T ≦0.50 K 0 - W 8.00 +/-0.30 P0 4.00 +/-0.10 10xP 0 40.00 +/-0.10 P1 2.00 +/-0.05 P2 2.00 +/-0.05 D 0 1.50 +0.1/-0 D 1 - E 1.75 +/-0.10 F 3.50 +/-0.05

Multilayer Ceramic Capacitors Approval Sheet Page 8 of 8 ASC_Ultra Small_(01R5)_026F_AS Dec. 2018 ◙ Constructions ◙ Storage and handling conditions (1) To store products at 5 to 40 °C ambient temperature and 20 to 70%. related humidity conditions. (2) The product is recommended to be used within one year after shipment. Check solderability in case of shelf life extension is needed. Cautions: a. The corrosive gas reacts on the terminal electrodes of capacitors, and results in the poor solderability. Do not store the capacitors in the ambience of corrosive gas (e.g., hydrogen sulfide, sulfur dioxide, chlorine, ammonia gas etc.) b. In corrosive atmosphere, solderability might be degraded, and silver migration might occur to cause low reliability. c. Due to the dewing by rapid humidity change, or the photochemical change of the terminal electrode by direct sunlight,the solderability and electrical performance may deteriorate. Do not store capacitors under direct sunlight or dewing condition. To store products on the shelf and avoid exposure to moisture. ◙ Recommended soldering conditions The lead-free termination MLCCs are not only to be used on SMT against lead-free solder paste, but also suitable against lead-containing solder paste. If the optimized solder joint is requested, increasing soldering time, temperature and concentration of N 2 within oven are recommended. Fig. 4 The construction of MLCC No. Name NP0 X7R, X5R

1 Ceramic material CaZrO 3 based BaTiO 3 based

2 Inner electrode Ni

4 Middle layer Ni

5 Outer layer Sn (Matt)

Fig. 5 Recommended reflow soldering profile for SMT process with SnAgCu series solder paste.