RH1028M LINER

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Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However , no responsibility is assumed for its use. Linear Technology Corporation makes no representa- tion that the interconnection of its circuits as described herein will not infringe on existing patent rights. L, L T , L TC and L TM are registered trademarks of Linear Technology Corporation. All other trademarks are the property of their respective owners. PAD FUNCTION V OS TRIM –IN +IN V OVER-COMP OUT V VOS TRIM 114mils × 81mils, Backside (substrate) metal: Alloyed gold layer Backside potential: Connect to V– DIE CROSS REFERENCE L TC Finished Part Number Order Part Number RH1028MW RH1028MW RH1028 DICE RH1028 DWF* RH1128MW RH1128MW RH1128 DICE RH1128 DWF* Please refer to L TC standard product data sheet for other applicable product information. *DWF = DICE in wafer form. Ultralow Noise Precision High Speed Op Amps DICE/DWF ELECTRICAL TEST LIMITS V S = ±15V , TA = 25°C, VCM = 0V , unless otherwise noted. SYMBOL PARAMETER CONDITIONS MIN MAX UNITS VOS Input Offset Voltage (Note 1) 300 μV IOS Input Offset Current V CM = 0V 150 nA IB Input Bias Current V CM = 0V ±400 nA VIN Input Voltage Range ±11 V CMRR Common Mode Rejection Ratio V CM = ±11V VCM = ±10.3V 110 dB PSRR Power Supply Rejection Ratio V S = ±4V to ±16V VS = ±4.5V to ±16V 110 dB AVOL Large Scale Voltage Gain R L ≥ 2k, VO = ±10V RL ≥ 1k, VO = ±10V RL ≥ 600Ω, VO = ±10V 3.5 V/μV V/μV V/μV V OUT Maximum Output Voltage Swing R L ≥ 2k RL ≥ 600Ω ±12 ±10.5 V V 4 5 X = 0 for L T1028B, 1 for L T1128B

Linear Technology Corporation 1630 McCarthy Blvd., Milpitas, CA 95035-7417 (408) 432-1900 ● FAX: (408) 434-0507 ● www.linear.com © LINEAR TECHNOLOGY CORPORATION 2008 LT 0908 • PRINTED IN USA Wafer level testing is performed per the indicated specifi cations for dice. Considerable differences in performance can often be observed for dice versus packaged units due to the infl uences of packaging and assembly on certain devices and/or parameters. Please consult factory for more information on dice performance and lot qualifi cations via lot sampling test procedures. Dice data sheet subject to change. Please consult factory for current revision in production. I.D.No. 66-13-1028 DICE/DWF ELECTRICAL TEST LIMITS V S = ±15V , TA = 25°C, VCM = 0V , unless otherwise noted. Note 1: Input offset voltage measurements are performed by automatic test equipment approximately 0.5 seconds after application of power . SYMBOL PARAMETER CONDITIONS MIN MAX UNITS SR Slew Rate A VCL = –1 (RH1028) AVCL = –1 (RH1128) 4.5 V/μs V/μs IS Supply Current 10.5 mA