P2804BVG ETC2

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Technical content

1 SEP-30-2004

N-Channel Logic Level Enhancement Mode Field Effect Transistor P2804BVG SOP-8 Lead-Free NIKO-SEM ABSOLUTE MAXIMUM RATINGS (TC = 25 °C Unless Otherwise Noted) PARAMETERS/TEST CONDITIONS SYMBOL LIMITS UNITS Drain-Source Voltage V DS 40 V Gate-Source Voltage V GS ±20 V TC = 25 °C 7.5 Continuous Drain Current TC = 100 °C ID 6.5 Pulsed Drain Current1 I DM 20 A TC = 25 °C 2.5 Power Dissipation TC = 100 °C PD 1.3 W Operating Junction & Storage Temperature Range T j, Tstg -55 to 150 Lead Temperature (1/16” from case for 10 sec.) T L 275 THERMAL RESISTANCE RATINGS THERMAL RESISTANCE SYMBOL TYPICAL MAXIMUM UNITS Junction-to-Ambient RθJA 50 °C / W 1Pulse width limited by maximum junction temperature. 2Duty cycle ≤ 1Ĉ ELECTRICAL CHARACTERISTICS (T C = 25 °C, Unless Otherwise Noted) LIMITS PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNIT STATIC Drain-Source Breakdown Voltage V (BR)DSS VGS = 0V, ID = 250µA 40 Gate Threshold Voltage V GS(th) VDS = VGS, ID = 250µA 1 1.5 2.5 V Gate-Body Leakage I GSS V DS = 0V, VGS = ±20V ±250 nA VDS = 32V, VGS = 0V 1 Zero Gate Voltage Drain Current I DSS VDS = 30V, VGS = 0V, TC = 125 °C 10 µA On-State Drain Current1 I D(ON) V DS = 10V, VGS = 10V 20 A VGS = 4.5V, ID = 6.5A 30 42 Drain-Source On-State Resistance1 RDS(ON) VGS = 10V, ID = 7.5A 21 28 mƸ Forward Transconductance1 g fs V DS = 10V, ID = 7.5A 19 S PRODUCT SUMMARY V(BR)DSS R DS(ON) I D 40V 28mƸ 7.5A G D S 4 : G A T E 5,6,7,8 :DRAIN 1,2,3 :SOURCE

2 SEP-30-2004

N-Channel Logic Level Enhancement Mode Field Effect Transistor P2804BVG SOP-8 Lead-Free NIKO-SEM DYNAMIC Input Capacitance C iss 790 Output Capacitance C oss 175 Reverse Transfer Capacitance C rss VGS = 0V, VDS = 10V, f = 1MHz pF Total Gate Charge2 Q g 16 Gate-Source Charge2 Q gs 2.5 Gate-Drain Charge2 Q gd VDS = 0.5V(BR)DSS, VGS = 10V, ID = 7.5A 2.1 nC Turn-On Delay Time2 t d(on) 2.2 4.4 Rise Time2 t r V DS = 20V, 7.5 15 Turn-Off Delay Time2 t d(off) ID ≅ 1A, VGS = 10V, RGEN = 6Ƹ 11.8 21.3 Fall Time2 t f 3.7 7.4 nS SOURCE-DRAIN DIODE RATINGS AND CHARACTERISTICS (TC = 25 °C) Continuous Current I S 1.3 Pulsed Current3 I SM 2.6 A Forward Voltage1 V SD I S = IS, VGS = 0V 1 V Reverse Recovery Time t rr IF = 5 A, dlF/dt = 100A / µS 15.5 nS Reverse Recovery Charge Q rr 7.9 nC 1Pulse test : Pulse Width ≤ 300 µsec, Duty Cycle ≤ 2Ĉ. 2Independent of operating temperature. 3Pulse width limited by maximum junction temperature. REMARK: THE PRODUCT MARKED WITH “P2804BVG”, DATE CODE or LOT # Orders for parts with Lead-Free plating can be placed using the PXXXXXXG parts name.

3 SEP-30-2004

N-Channel Logic Level Enhancement Mode Field Effect Transistor P2804BVG SOP-8 Lead-Free NIKO-SEM TYPICAL PERFORMANCE CHARACTERISTICS Body Diode Forward Voltage Variation with Source Current and Temperature 25° C T = 125° C V - Body Diode Forward Voltage(V) Is - Reverse Drain Current(A) 0.001 0.01 0.1 0.4 SD 0.2 0.6 V = 0V 100 A GS 1.00.8 1.2 -55° C 1.4

4 SEP-30-2004

N-Channel Logic Level Enhancement Mode Field Effect Transistor P2804BVG SOP-8 Lead-Free NIKO-SEM

5 SEP-30-2004

N-Channel Logic Level Enhancement Mode Field Effect Transistor P2804BVG SOP-8 Lead-Free NIKO-SEM SOIC-8(D) MECHANICAL DATA mm mm Dimension Min. Typ. Max. Dimension Min. Typ. Max. C 5.8 6.0 6.2 J 0.22 D 0.38 0.445 0.51 K 0 ° 4 ° 8 ° E 1.27 L F 1.35 1.55 1.75 M G 0.1 0.175 0.25 N H CB A D E F G I J K