ATA6661_09 ATMEL
Document overview
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Technical content
Features
- Operating Range from 5V to 18V Baud Rate from 2.6 Kbaud up to 20 Kbaud Improved Slew Rate Control According to LIN Specification 2.0 Fully Compatible with 3.3V and 5V Devices Dominant Time-out Function at Transmit Data (TXD) Normal and Sleep Mode Wake-up Capability via LIN Bus (90 µs Dominant) External Wake-up via WAKE Pin (130 µs Low Level) Control of External Voltage Regulator via INH Pin Very Low Standby Current During Sleep Mode (10 µA) 60V Load Dump Protection at LIN Pin (42-V Power Net) Wake-up Source Recognition Bus Pin Short-circuit Protected versus GND and Battery LIN Input Current < 3 µA if VBAT Is Disconnected Overtemperature Protection High EMC Level Interference and Damage Protection According to ISO/CD 7637 ESD HBM 6 kV at LIN Bus Pin and Supply VS Pin 1. Description The ATA6661 is a fully integrated LIN transceiver according to the LIN specification 2.0. It interfaces the LIN protocol handler and the physical layer. The device is designed to handle the low-speed data communication in vehicles, e.g., in convenience electronics. Improved slope control at the LIN bus ensures secure data communication up to 20 kBaud with an RC-osc illator for protocol handling. In order to comply with the 42-V power net requirements, the bus output is capable of withstand- ing high voltages. Sleep mode guarantees minimal current consumption. LIN Transceiver ATA6661 4729M–AUTO–02/09
4729M–AUTO–02/09 ATA6661 Figure 1-1. Block Diagram 2. Pin Configuration Figure 2-1. Pinning SO8 3WAKE 4TXD EN 1RXD GND5 Short circuit and overtemperature protection Filter LIN VS7 TXD Time-out timer Slew rate control Wake up bus timer Sleep mode Control unit ATA6661 Receiver VS VS Wake-up timer INH INH LIN VS GND RXD 8 WAKE EN TXD Figure 2-2. Pin Description Pin Symbol Function
1 RXD Receive data output (open drain)
2 EN Enables normal mode, when the input is open or low, the device is in sleep mode
3 WAKE High voltage input for local wake-up request
4 TXD Transmit data input; active low output (strong pull-down) after a local wake-up request
5 GND Ground
6 LIN LIN bus line input/output
7 VS Battery supply
8I N H Battery related inhibit output for controlling an external voltage regulator; active high after a wake-up request
4729M–AUTO–02/09 ATA6661 3. Functional Description
3.1 Supply Pin (V S)
Undervoltage detection is implement ed to disable transmission if V S is falling to a value below 5V to avoid false bus messages. After switching on V S the IC switches to pre-normal mode and INHIBIT is switched on. The supply current in sleep mode is typically 10 µA.
3.2 Ground Pin (GND)
The ATA6661 is neutral on the LIN pin in case of a GND disconnection. It is able to handle a ground shift up to 3V for VS > 9V.
3.3 Bus Pin (LIN)
A low-side driver with internal current limitation and thermal shutdown as well as an internal pull-up resistor according to LIN specification 2.0 are implemented. The voltage range is from –27V to +60V. This pin exhibits no reverse current from the LIN bus to V S, even in case of a GND shift or VBatt disconnection. The LIN receiver thresholds are compatible to the LIN protocol specification.The fall time (from recessive to dominant) and the rise time (from dominant to recessive) are slope controlled. The output has a short circuit limitation. This is a self adapting current limitation; i.e., during current limitation as the chip temperature increases so the current reduces.
3.4 Input Pin (TXD)
This pin is the microcontroller interface to control the state of the LIN output. TXD is low to bring LIN low. If TXD is high, the LIN output transistor is turned off. In this case, the bus is in recessive mode via the internal pull-up resistor. The TXD pin is compatible to a 3.3V and 5V supply.
3.5 TXD Dominant Ti me-out Function
The TXD input has an internal pull-down resistor. An internal timer prevents the bus line from being driven permanently in dominant state. If TXD is forced low longer than tdom > 6 ms, the pin LIN will be switched off to recessive mode. To reset this mode switch TXD to high (>10 µs) before switching LIN to dominant again.
3.6 Output Pin (RXD)
This pin reports to the microcontroller the state of the LIN bus. LIN high (recessive) is reported by a high level at RXD, LIN low (dominant) is reported by a low voltage at RXD. The output is an open drain, therefore, it is compatible to a 3.3V or 5V power supply. The AC characteristics are defined with a pull-up resistor of 5 kΩ to 5V and a load capacitor of 20 pF. The output is short-cur- rent protected. In unpowered mode (V S = 0V), RXD is switched off. For ESD protection a Zener diode is implemented with VZ =6 . 1 V .
4729M–AUTO–02/09 ATA6661
3.7 Enable I nput Pin (EN)
This pin controls the operation mode of the interface. If EN = 1, the interface is in normal mode, with the transmission path from TXD to LIN and from LIN to Rx both active. If EN = 0, the device is switched to sleep mode and no transmission is possible. In sleep mode, the LIN bus pin is connected to V S with a weak pull-up current source. The device can transmit only after being woken up (see next section “Inhibit Output Pin (INH)” ). During sleep mode the device is still supplied from the battery voltage. The supply current is typ- ically 10 µA. The pin EN provides a pull-down resistor in order to force the transceiver into sleep mode in case the pin is disconnected.
3.8 Inhibit Output Pin (INH)
This pin is used to control an external switchable voltage regulator having a wake-up input. The inhibit pin provides an internal switch towards pin V S. If the device is in normal mode, the inhibit high-side switch is turned on and the external voltage regulator is activated. When the device is in sleep mode, the inhibit switch is turned off and disables the voltage regulator. A wake-up event on the LIN bus or at pin WAKE will switch the INH pin to the V S level. After a system power-up (V S rises from zero), the pin INH switches automatically to the V S level. The RDSon of the high-side output is < 1 kΩ.
3.9 Wake-up Input Pin (WAKE)
This pin is a high-voltage input used to wake-up the device from sleep mode. It is usually con- nected to an external switch in the application to generate a local wake-up. If you do not need a local wake-up in your application, connect pin WAKE directly to pin VS. A pull-up current source with typically –10 µA is implemented. The voltage threshold for a wake-up signal is 3V below the VS voltage with an output current of typical –3 µA. Wake-up events from sleep mode: L I N b u s E N p i n WAKE pin Figure 3-1 on page 6, Figure 3-2 and Figure 3-3 on page 7 show details of wake-up operations.
4729M–AUTO–02/09 ATA6661
3.10 Mode of Operation
- Normal mode This is the normal transmitting and receiving mode. All features are available. 2. Sleep mode In this mode the transmission path is disabled and the device is in low power mode. Supply current from V Batt is typically 10 µA. A wake-up signal from the LIN bus or via pin WAKE will be detected and switches the device to pre-normal mode. If EN, then switches to high, normal mode is activated. Input debounce timers at pin WAKE (tWAKE), LIN (tBUS) and EN (tsleep,tnom) prevent unwanted wake-up events due to automotive tran- sients or EMI. In sleep mode the INH pin is floating. The internal termination between pin LIN and pin V S is disabled to minimize the power dissipation in case pin LIN is short-circuited to GND. Only a weak pull-up current (typical 10 µA) between pin LIN and pin V S is present. 3. Pre-normal mode At system power-up, the device automatically switches to pre-normal mode. It switches the INH pin to a high state, to the V S level. The microcontroller of the application will then confirm the normal mode by setting the EN pin to high. 4. Unpowered mode In this mode the LIN transceiver is disabled. Data communication is switched off. If VS is higher than VSth undervoltage threshold, the IC mode change from Unpowered to Pre-normal mode.
3.11 Remote Wake-up via Dominant Bus State
A falling edge at pin LIN, followed by a dominant bus level maintained for a certain time period (tBUS), results in a remote wake-up request. The device switches to pre-normal mode. Pin INH is activated (switches to V S) and the internal termination resistor is switched on. The remote wake-up request is indicated by a low level at pin RXD to inte rrupt the microcontroller (see Fig- ure 3-2 on page 7). The voltage threshold for a wake-up si gnal is 3V below the VS voltage with an output current of typical –3 µA.
3.12 Local Wake-up via Pin WAKE
A falling edge at pin WAKE, followed by a low level maintained for a certain time period (t WAKE), results in a local wake-up reques t. The extra long wake-up time (t WAKE) ensures that no tran- sient, according to ISO7637, creates a wake-up. The device switches to pre-normal mode. Pin INH is activated (switches to V S) and the internal termination resistor is switched on. The local wake-up request is indicated by a low level at pin RXD to interrupt the microcontroller and a strong pull-down at pin TXD (see Figure 3-3 on page 7).
3.13 Wake-up Source Recognition
The device can distinguish between a local wake-up request (pin WAKE) and a remote wake-up request (dominant LIN bus). The wake-up source can be read on pin TXD in pre-normal mode. If an external pull-up resistor (typically 5 kΩ) on pin TXD to the power supply of the microcontroller has been added, a high level indicates a remote wake-up request (weak pull-down at pin TXD) and a low level indicates a local wake-up request (strong pull-down at pin TXD). The wake-up request flag (signalled on pin RXD) as well as the wake-up source flag (signalled on pin TXD) are reset immediately, if the microcontroller sets pin EN to high (see Figure 3-2 on page 7 and Figure 3-3).
4729M–AUTO–02/09 ATA6661 Figure 3-1. Mode of Operation
3.14 Fail-safe Features
There are now reverse currents < 3 µA at pin LIN during loss of V BAT or GND. Optimal behavior for bus systems where some slave nodes supplied from battery or ignition. Pin EN provides pull-down resistor to force the transceiver into sleep mode if EN is disconnected. Pin RXD is set floating if VBAT is disconnected. Pin TXD provides a pull-down resistor to provide a static low if TXD is disconnected. The LIN output driver has a current limitation and if the junction temperature T j exceeds the thermal shut-down temperature Toff the output driver switches off. The implemented hysteresis Thys enables the LIN output again after the temperature has been decreased.
3.15 Physical Layer Compatibility
Since the LIN physical layer is independent from higher LIN layers (e.g. LIN protocol layer), all nodes with a LIN physical layer according to th is revision can be mixed with LIN physical layer restrictions. A higher ratio of nodes according to this LIN physical layer specification or the one of revision 2.0 will result in a higher transmission reliability. a: VS > 5V b: VS < 4V c: Bus wake-up event d: Wake-up from Wake switch EN = 1 EN = 1 EN = 0 Unpowered Mode VBatt = 0V Normal Mode INH: high (INH HS switch ON) Communication: ON Sleep Mode INH: high impedance (INH HS switch OFF) Communication: OFF Pre-normal Mode INH: high (INH internal High Side switch ON) Communication: OFF ab b c d b Local wake-up event Go to sleep command
4729M–AUTO–02/09 ATA6661 4. Absolute Maximum Ratings Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Parameters Symbol Min. Typ. Max. Unit V S - Continuous supply voltage –0.3 +40 V Wake DC and transient voltage (with 33 kΩ serial resistor) - Transient voltage due to ISO7637 (coupling 1 nF) –40 –150 +40 +100 V V Logic pins (RXD, TXD, EN) –0.3 +6 V LIN - DC voltage - Transient voltage due to ISO7637 (coupling 1 nF) –40 –150 +60 +100 V V INH - DC voltage –0.3 +40 V ESD (DIN EN 61000-4-2) According LIN EMC Test Specification V1.3 - Pin VS, LIN - Pin Wake (with 33 kΩ serial resistor) –6000 –5000 +6000 +5000 V V ESD S5.1 - All pins –3000 +3000 V CDM ESD STM 5.3.1-1999 - All pins FCDM ESD STM 5.3.1- All pins MM JEDEC A115A - All pins –500 –1000 –200 +500 +1000 +200 V V V Junction temperature T j –40 +150 °C Storage temperature T stg –55 +150 °C Operating ambient temperature T amb –40 +125 °C Thermal shutdown T off 150 165 180 °C Thermal shutdown hysteresis T hys 5 1 02 0° C 5. Thermal Resistance Parameters Symbol Value Unit Thermal resistance junction ambient R thJA 160 K/W
4729M–AUTO–02/09 ATA6661 6. Electrical Characteristics 5V < VS < 18V, Tamb = –40°C to +125°C No. Parameters Test Conditions Pin Symbol Min. Typ. Max. Unit Type* 1V S Pin 1.1 Nominal DC voltage range 7 V S 5 13.5 18 V A
1.2 Supply current in sleep mode
Vlin > VBatt – 0.5V VBatt < 14V 7I VSstby 10 20 µA A 1.3 Supply current in normal mode Bus recessive 7 I VSrec 1.6 3 mA A
1.4 Bus dominant
Total bus load > 500Ω 7I VSdom 1.6 3 mA A 1.5 V S undervoltage threshold V Sth 44 . 6 5 VA
1.6 VS undervoltage threshold
hysteresis 7V Sth_hys 0.2 V A
2 RXD Output Pin (Open Drain)
2.1 Low level input current Normal mode
VLIN = 0V, VRXD = 0.4V 1I RXDL 25 8 m A A 2.2 RXD saturation voltage 5 k Ω pull-up resistor to 5V 1 Vsat RXD 0.4 V A
2.3 High level leakage current Normal mode
VLIN = VBAT, VRXD = 5V 1I RXDH –3 +3 µA A 2.4 ESD zener diode I RXD = 100 µA 1 VZ RXD 6.1 8.6 V A
3 TXD Input Pin
3.1 Low level voltage input 4 V TXDL –0.3 +0.8 V A
3.2 High level voltage input 4 V TXDH 26 V A
3.3 Pull-down resistor V TXD = 5V 4 R TXD 125 250 600 k Ω A
3.4 Low level leakage current V TXD = 0V 4 I TXD –3 +3 µA A
3.5 Low-level input current at local
VLIN = VBAT; VWAKE = 0V 4I TXDwake 25 8 m A A 4E N I n p u t P i n 4.1 Low level voltage input 2 V ENL –0.3 +0.8 V A
4.2 High level voltage input 2 V ENH 26 V A
4.3 Pull-down resistor V EN = 5V 2 R EN 125 250 600 k Ω A
4.4 Low level input current V EN = 0V 2 I EN –3 +3 µA A
4.5 Enable negative slope for go to
VEN =2 Vt o0 . 8 V 2S l o p e EN 60 µs A
5 INH Output Pin
5.1 High level voltage Normal mode
IINH = –200 µA 8V INHH VS – 0.8 V S VA
5.2 High level leakage current Sleep mode
VINH = 27V, VBatt = 27V 8I INHL –3 +3 µA A
6 WAKE Pin
6.1 High level input voltage 3 V WAKEH
VS – VS + 0.3V VA
6.2 Low level input voltage I WAKE = Typically –3 µA 3 V WAKEL –27V VS –
*) Type means: A = 100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter
4729M–AUTO–02/09 ATA6661
6.3 Wake pull-up current V S < 27V 3 I WAKE –30 –10 µA A
6.4 High level leakage current V S = 27V, VWAKE = 27V 3 I WAKE –5 +5 µA A
7 LIN Bus Driver
7.1 Driver recessive output voltage R LOAD = 500Ω/1 kΩ 6V BUSrec
0.9 × VS VS VA
7.2 Driver dominant voltage
VBUSdom_DRV_LoSUP VVS = 7V, Rload = 500Ω 6V _LoSUP 1.2 V A
7.3 Driver dominant voltage
VBUSdom_DRV_HiSUP VVS = 18V, Rload = 500Ω 6V _HiSUP 2VA
7.4 Driver dominant voltage
VBUSdom_DRV_LoSUP VVS = 7V, Rload = 1000Ω 6V _LoSUP_1k 0.6 V A
7.5 Driver dominant voltage
VBUSdom_DRV_HiSUP VVS = 18V, Rload = 1000Ω 6V _HiSUP_1k_ 0.8 V A
7.6 Pull-up resistor to V S
mandatory 6R LIN 20 30 60 k Ω A
7.7 Self-adapting current limitation
VBUS = VBAT_max Tj = 125°C Tj = 27°C Tj = –40°C 6I BUS_LIM 100 150 110 170 230 mA mA mA A 7.8 Input leakage current at the receiver, inclusive pull-up resistor as specified Input leakage current Driver off V BUS = 0V, VBatt = 12V 6I BUS_PAS_dom –1 mA A
7.9 Leakage current LIN recessive
8V < VBAT < 18V 8V < VBUS < 18V VBUS ≥ VBAT 6I BUS_PAS_rec 15 20 µA A 7.10 Leakage current at ground loss, Control unit disconnected from ground, Loss of local ground must not affect communication in the residual network GND Device = VS VBAT =12V 0V < VBUS < 18V 6I BUS_NO_gnd –10 +0.5 +10 µA A 7.11 Node has to sustain the current that can flow under this condition, bus must remain operational under this condition VBAT disconnected VSUP_Device = GND 0V < VBUS < 18V 6I BUS 0.5 3 µA A
8 LIN Bus Receiver
8.1 Center of receiver threshold VBUS_CNT =
(Vth_dom + Vth_rec)/2 6V BUS_CNT 0.475 × VS 0.5 × VS 0.525 × VS VA 8.2 Receiver dominant state V EN = 5V 6 V BUSdom –27 0.4 × VS VA
8.3 Receiver recessive state V EN = 5V 6 V BUSrec
0.6 × VS
40 V A
8.4 Receiver input hysteresis V HYS = Vth_rec – Vth_dom 6V BUShys
0.028 × VS 0.1 × VS 0.175 × VS VA
8.5 Wake detection LIN
High level input voltage 6V LINH VS – VS + 0.3V VA 6. Electrical Characteristics (Continued) 5V < VS < 18V, Tamb = –40°C to +125°C No. Parameters Test Conditions Pin Symbol Min. Typ. Max. Unit Type* *) Type means: A = 100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter
4729M–AUTO–02/09 ATA6661
8.6 Wake detection LIN
Low level input voltage ILIN = Typically –3 µA 6 V LINL –27V VS – 3V VA
8.7 LIN pull-up current V S < 27V 6 I LIN –30 –10 µA A
9 Internal Timers
9.1 Dominant time for wake-up via
LIN bus VLIN = 0V 6 t BUS 30 90 150 µs A
9.2 Time of low pulse for wake-up
via pin WAKE VWAKE = 0V 3 t WAKE 60 130 200 µs A 9.3 Time delay for mode change from pre-normal mode to normal mode via pin EN V EN = 5V 2 t norm 21 0 1 5 µ s A 9.4 Time delay for mode change from normal mode into sleep mode via pin EN VEN = 0V 2 t sleep 21 0 1 2 µ s A
9.5 TXD dominant time out timer V TXD = 0V 4 t dom 69 2 0 m s A
9.6 Power-up delay between VS = 5V until INH switches to high VVS = 5V t VS 200 µs A LIN Bus Driver (see Figure 6-1 on page 12) Bus load conditions: Load1 small 1 nF 1 kΩ, Load2 big 10 nF 500Ω, RRXD = 5 kΩ, CRXD = 20 pF; The following two rows specifies the timing parameters for proper operation at 20.0 Kbit/s.
10.1 Duty cycle 1
THRec(max) = 0.744 × VS THDom(max) = 0.581 × VS VS = 7.0V to 18V tBit = 50 µs D1 = tbus_rec(min)/(2 × tBit) 6 D1 0.396 A
10.2 Duty cycle 1
THRec(min) = 0.422 × VS THDom(min) = 0.284 × VS VS = 7.0V to 18V tBit = 50 µs D2 = tbus_rec(max)/(2 × tBit) 6 D2 0.581 A
10.3 Slope time falling and rising
VS = 7.3V to 18V 6 tSlope_fall tSlope_rise 3.5 22.5 µs A
10.4 Symmetry of rising and falling
VS = 7.3V tsym = tSlope_fall – tSlope_rise tsym –4 +4 µs A
11 Receiver Electrical AC Parameters of the LIN Physical Layer
LIN receiver, RXD load conditions (CRXD): 20 pF , Rpull-up = 5 kΩ
11.1 Propagation delay of receiver
(see Figure 6-1 on page 12) trec_pd = max(trx_pdr, trx_pdf)t rx_pd 6µ sA 11.2 Symmetry of receiver propagation delay rising edge minus falling edge t rx_sym = trx_pdr – trx_pdf trx_sym –2 +2 µs A 6. Electrical Characteristics (Continued) 5V < VS < 18V, Tamb = –40°C to +125°C No. Parameters Test Conditions Pin Symbol Min. Typ. Max. Unit Type* *) Type means: A = 100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter
4729M–AUTO–02/09 ATA6661 Figure 6-1. Definition of Bus Timing Parameter TXD (Input to transmitting node) VS (Transceiver supply of transmitting node) RXD (Output of receiving node1) RXD (Output of receiving node2) LIN Bus Signal Thresholds of receiving node1 Thresholds of receiving node2 tBus_rec(max) trx_pdr(1) trx_pdf(2)trx_pdr(2) trx_pdf(1) tBus_dom(min) tBus_dom(max) THRec(max) THDom(max) THRec(min) THDom(min) tBus_rec(min) tBit tBittBit
4729M–AUTO–02/09 ATA6661 Figure 6-2. Application Circuit VS VS INH EN RXD 12V VBATTERY SCI 5 kΩ 100 nF 220 pF 22 µF ATA6661 33 kΩ 10 kΩ Short circuit and overtemperature protection Control unit Slew rate control Wake-up bus timer Filter Master node pull-up Wake-up timer TXD Time-out timer Sleep mode Receiver WAKE TXD Microcontroller IO VDD External switch GND VS LIN LIN sub bus
4729M–AUTO–02/09 ATA6661 8. Package Information 7. Ordering Information Extended Type Number Package Remarks ATA6661-TAPY SO8 LIN transceiver, Pb-free, 1k, taped and reeled ATA6661-TAQJ SO8 LIN transceiver, Pb-free, 4k, taped and reeled Package: SO 8 Dimensions in mm specifications according to DIN technical drawings Issue: 1; 15.08.06 Drawing-No.: 6.541-5031.01-4 0.2 5±0.2 3.8±0.1 6±0.2 3.7±0.1 4.9±0.1 3.81 0.4 1.27 0.1+0.15 1.4
4729M–AUTO–02/09 ATA6661 9. Revision History Please note that the following page numbers referred to in this section refer to the specific revision mentioned, not to this document. Revision No. History 4729M-AUTO-02/09 Section 6 “Electrical Characteristics” numbers 3.2 and 4.2 on page 9 changed 4729L-AUTO-04/08 Section 7 “Ordering Information” on page 14 changed 4729K-AUTO-10/07 Section 7 “Ordering Information” on page 14 changed 4729J-AUTO-07/07 Put datasheet in a new template Capital T for time generally changed in a lower case t Figure 1-1 “Block Diagram” on page 2 changed Figure 6-2 “Application Circuit” on page 13 changed 4729I-AUTO-12/06 Put datasheet in a new template Section 3.5 “TXD Dominant Time-out Function” changed Section 7 “Ordering Information” on page 14 changed 4729H-AUTO-10/06 Put datasheet in a new template Pb-free logo on page 1 deleted Features on page 1 changed Section 3-10 “Mode of Operation” on page 5 changed Figure 3-1 “Mode of Operation” on page 6 changed Section 3.15 “Physical Layer Compatibility” on page 6 added Section 6 “Electrical Characteristics” number 4.5 on page 9 added Section 6 “Electrical Characteristics” number 9.5 on page 11 changed Section 6 “Electrical Characteristics” number 10.3 and 10.4 on page 11 added Figure 6-2 “Application Circuit” on page 12 changed 4729G-AUTO-10/05 Pb-free Logo on page 1 added Table “Ordering Information” on page 13 changed 4729F-AUTO-05/05 Section 2.14 “Fail-safe Features” on page 5 changed Figure 2.2 “LIN Wake-up Waveform Diagram” on page 6 changed Table “Absolute Maximum Ratings” on page 7 changed changed 4729E-AUTO-01/05 Put datasheet in a new template Table “Ordering Information” on page 13 changed 4729D-AUTO-10/04 Put datasheet into new template Section “Features” on page 1 changed Figure 1 “Block Diagram” on page 1 changed Section “Bus Pin (LIN)” on page 2 changed Section “TX Dominant Time-out Function” on page 3 changed Section “Output Pin (RXD)” on page 3 changed Section “Inhibit Output Pin (INH)” on page 3 changed Section “Wake-up Input Pin (WAKE)” on page 3 changed Section “Remote Wake-up via Dominant Bus State” on page 4 changed Section “Fail-safe Features” added Table “Absolute Maximum Ratings” on page 7 changed 9.3 changed Table “Electrical Characteristics”: Rows: 2.4, 8.5, 8.6 and 8.7 Figure 7 “Application Circuit” on page 12 changed 4729C-AUTO-06/04 Table “Ordering Information” on page 13 changed
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