AT27C516 ATMEL

Document overview

  • Manufacturer or author: Provided By digicamel.com
  • PDF pages: 8

Technical content

Features

  • Fast Read Access Time - 45 ns
  • Low Power CMOS Operation 100 µA max. Standby 30 mA max. Active at 5 MHz
  • JEDEC Standard Packages 44-Lead PLCC 40-Lead TSOP (10mm x 14mm)
  • 5V ± 10% Power Supply
  • High Reliability CMOS Technology 2000V ESD Protection 200 mA Latchup Immunity
  • Rapid Programming Algorithm - 50 µs/word (typical)
  • CMOS and TTL Compatible Inputs and Outputs
  • Integrated Product Identification Code
  • Commercial and Industrial Temperature Ranges TSOP Top View Type 1 0362C AT27C516 3-145

In read mode, the AT27C516 typically consumes 15 mA. Standby mode supply current is typically less than 10 µA. The AT27C516 is available in industry standard JEDEC-approved one-time programmable (OTP) plastic PLCC and TSOP packages. The device features two-line control ( CE, OE) to eliminate bus contention in high-speed systems. With 32K word storage capability, the AT27C516 allows firmware to be stored reliably and to be accessed by the system without the delays of mass storage media. Atmel’s 27C516 have additional features to ensure high quality and efficient production use. The Rapid  Program- ming Algorithm reduces the time required to program the part and guarantees reliable programming. Programming time is typically only 50 µs/word. The Integrated Product Identification Code electronically identifies the device and manufacturer. This feature is used by industry standard programming equipment to select the proper program- ming algorithms and voltages. Description (Continued) Switching between active and standby conditions via the Chip Enable pin may produce transient voltage excur- sions. Unless accommodated by the system design, these transients may exceed data sheet limits, resulting in de- vice non-conformance. At a minimum, a 0.1 µF high fre- quency, low inherent inductance, ceramic capacitor should be utilized for each device. This capacitor should be connected between the V CC and Ground terminals of the device, as close to the device as possible. Additionally, to stabilize the supply voltage level on printed circuit boards with large EPROM arrays, a 4.7 µF bulk electrolytic capacitor should be utilized, again connected between the V CC and Ground terminals. This capacitor should be posi- tioned as close as possible to the point where the power supply is connected to the array. System Considerations 3-146 AT27C516

(1) VPP Supply Voltage with *NOTICE: Stresses beyond those listed under “Absolute Maxi- mum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions beyond those indi- cated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Note: 1. Minimum voltage is -0.6V dc which may undershoot to - 2.0V for pulses of less than 20 ns. Maximum output pin voltage is V CC + 0.75V dc which may overshoot to +7.0V for pulses of less than 20 ns. Absolute Maximum Ratings* Operating Modes Mode \\ Pin CE OE PGM Ai V PP Outputs Read V IL VIL X (1) Ai X D OUT Output Disable X V IH X X X High Z Standby V IH XX X X (5) High Z Rapid Program (2) VIL VIH VIL Ai V PP D IN PGM Verify V IL VIL VIH Ai V PP D OUT PGM Inhibit V IH XX X V PP High Z Product Identification (4) VIL VIL X A9 = VH (3) A0 = VIH or VIL A1 - A14 = VIL VCC Identification Code Notes: 1. X can be VIL or VIH. 2. Refer to Programming characteristics. 4. Two identifier words may be selected. All Ai inputs are held low (VIL), except A9 which is set to VH and A0 which is tog- gled low (VIL) to select the Manufacturer’s Identification word and high (VIH) to select the Device Code word. 5. Standby VCC current (ISB ) is specified with VPP = VCC . VCC > VPP will cause a slight increase in ISB . AT27C516 3-147

AC Characteristics for Read Operation AT27C516 Symbol Parameter Condition Min Max Min Max Min Max Min Max Min Max Units tACC (3) Address to Output DelayCE = OE = VIL 45 55 70 85 100 ns tCE (2) CE to Output Delay OE = VIL 45 55 70 85 100 ns tOE (2, 3) OE to Output Delay CE = VIL 20 25 25 30 30 ns tDF (4, 5) OE or CE High to Output Float, whichever occurred first 20 25 25 30 30 ns tOH Output Hold from Address, CE or OE, whichever occurred first 7 7 7 0 0 n s Notes: 2, 3, 4, 5. - see AC Waveforms for Read Operation. DC and AC Operating Conditions for Read Operation AT27C516 Operating Temperature (Case) VCC Power Supply 5V ± 10% 5V ± 10% 5V ± 10% 5V ± 10% 5V ± 10% DC and Operating Characteristics for Read Operation Symbol Parameter Condition Min Max Units ILI Input Load Current V IN = 0V to VCC ± 1 µA ILO Output Leakage Current V OUT = 0V to VCC ± 5 µA IPP1 (2) VPP (1) Read/Standby Current VPP = VCC 10 µA ISB VCC (1) Standby Current ISB1 (CMOS), CE = VCC ± 0.3V 100 µA ISB2 (TTL), CE = 2.0 to VCC + 0.5V 1m A ICC VCC Active Current f = 5 MHz, IOUT = 0 mA, CE = VIL 30 mA VIL Input Low Voltage -0.6 0.8 V VIH Input High Voltage 2.0 V CC + 0.5 V VOL Output Low Voltage I OL = 2.1 mA 0.4 V VOH Output High Voltage I OH = -400 µA 2.4 V Notes: 1. VCC must be applied simultaneously or before VPP , and removed simultaneously or after VPP . 2. VPP may be connected directly to VCC , except during pro- gramming. The supply current would then be the sum of ICC and IPP . 3-148 AT27C516

Pin Capacitance (f = 1 MHz T = 25°C) (1) Typ Max Units Conditions C IN 41 0 p F V IN = 0V C OUT 81 2 p F V OUT = 0V Note: 1. Typical values for nominal supply voltage. This parameter is only sampled and is not 100% tested. AC Waveforms for Read Operation (1) Notes: 1. Timing measurement reference level is 1.5V for -45 and -55 devices. Input AC drive levels are VIL = 0.0V and VIH = 3.0V. Timing measurement reference levels for all other speed grades are VOL = 0.8V and VOH = 2.0V. Input AC drive levels are VIL = 0.45V and VIH = 2.4V. 2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE . 3. OE may be delayed up to tACC - tOE after the address is valid without impact on tACC . 4. This parameter is only sampled and is not 100% tested. 5. Output float is defined as the point when data is no longer driven. Input Test Waveforms and Measurement Levels tR , tF < 5 ns (10% to 90%) For -45, -55, and -70 Devices Only: Output Test Load Note: CL = 100 pF including jig capacitance except -45, -55 and -70 devices, where CL = 30 pF. tR , tF < 20 ns (10% to 90%) For -85 and -10 Devices Only: AT27C516 3-149

(1) Notes: 1. The Input Timing Reference is 0.8V for VIL and 2.0V for VIH. 2. tOE and tDFP are characteristics of the device but must be accommodated by the programmer. 3. When programming the AT27C516 a 0.1 µF capacitor is re- quired across VPP and ground to suppress spurious voltage transients. DC Programming Characteristics TA = 25 ± 5°C, VCC = 6.5 ± 0.25V, VPP = 13.0 ± 0.25V Symbol Parameter Test Conditions Limits UnitsMin Max ILI Input Load Current V IN = VIL, VIH ±10 µA VIL Input Low Level -0.6 0.8 V VIH Input High Level 2.0 V CC + 0.1 V VOL Output Low Voltage I OL = 2.1 mA 0.4 V VOH Output High Voltage I OH = -400 µA2 . 4 V ICC2 VCC Supply Current (Program and Verify) 50 mA IPP2 VPP Supply Current CE = PGM = V IL 30 mA VID A9 Product Identification Voltage 11.5 12.5 V 3-150 AT27C516

AC Programming Characteristics TA = 25 ± 5°C, VCC = 6.5 ± 0.25V, VPP = 13.0 ± 0.25V Sym- bol Parameter Test Conditions* (1) Limit UnitsMin Max tAS Address Setup Time 2 µs tCES CE Setup Time 2 µs tOES OE Setup Time 2 µs tDS Data Setup Time 2 µs tAH Address Hold Time 0 µs tDH Data Hold Time 2 µs tDFP OE High to Output Float Delay (2) 01 3 0 n s tVPS VPP Setup Time 2 µs tVCS VCC Setup Time 2 µs tPW PGM Program Pulse Width (3) 47.5 52.5 µs tOE Data Valid from OE 150 ns tPRT VPP Pulse Rise Time During Programming 50 ns *AC Conditions of Test: Notes: 1. V CC must be applied simultaneously or before VPP and removed simultaneously or after VPP . 2. This parameter is only sampled and is not 100% tested. Output Float is defined as the point where data is no longer driven — see timing diagram. 3. Program Pulse width tolerance is 50 µsec ± 5%. Atmel’s 27C516 Integrated Product Identification Code Codes Pins Hex DataA0 015-08 O7 O6 O5 O4 O3 O2 O1 O0 M a n u f a c t u r e r0 0 000111100 0 1 E D e v i c e T y p e 1 0 111100100 0 F 2 Rapid Programming Algorithm A 50 µs PGM pulse width is used to program. The address is set to the first location. VCC is raised to 6.5V and VPP is raised to 13.0V. Each address is first programmed with one 50 µs PGM pulse without verification. Then a verifica- tion / reprogramming loop is executed for each address. In the event a word fails to pass verification, up to 10 suc- cessive 50 µs pulses are applied with a verification after each pulse. If the word fails to verify after 10 pulses have been applied, the part is considered failed. After the word verifies properly, the next address is selected until all have been checked. V PP is then lowered to 5.0V and VCC to 5.0V. All words are read again and compared with the original data to determine if the device passes or fails. AT27C516 3-151

(ns) ICC (mA) Ordering Code Package Operation Range Active Standby 45 30 0.1 AT27C516-45JC 44J Commercial AT27C516-45VC 40V (0 °C to 70°C) 30 0.1 AT27C516-45JI 44J Industrial AT27C516-45VI 40V (-40 °C to 85°C) 55 30 0.1 AT27C516-55JC 44J Commercial AT27C516-55VC 40V (0 °C to 70°C) 30 0.1 AT27C516-55JI 44J Industrial AT27C516-55VI 40V (-40 °C to 85°C) 70 30 0.1 AT27C516-70JC 44J Commercial AT27C516-70VC 40V (0 °C to 70°C) 30 0.1 AT27C516-70JI 44J Industrial AT27C516-70VI 40V (-40 °C to 85°C) 85 30 0.1 AT27C516-85JC 44J Commercial AT27C516-85VC 40V (0 °C to 70°C) 30 0.1 AT27C516-85JI 44J Industrial AT27C516-85VI 40V (-40 °C to 85°C) 100 30 0.1 AT27C516-10JC 44J Commercial AT27C516-10VC 40V (0 °C to 70°C) 30 0.1 AT27C516-10JI 44J Industrial AT27C516-10VI 40V (-40 °C to 85°C)

Ordering Information

44J 44 Lead, Plastic J-Leaded Chip Carrier (PLCC) 40V 40 Lead, Plastic Thin Small Outline Package (TSOP) (10mm x 14mm) 3-152 AT27C516