ACPL-338J

ACPL-334J ABRACON

Document overview

• Manufacturer or author: Provided By digicamel.com
• PDF pages: 23

Technical content

Features

 3A maximum peak output current  135-ns maximum propagation delay  1.7A active Miller clamp  Desaturation detection with soft shutdown and FAULT feedback  Under-voltage lockout (UVLO) with hysteresis  Fault reset by next LED turn-on after mute time (ACPL- 334J)  Automatic fault reset after mute time of 32 µs (ACPL- 338J)  100-kV/µs minimum common mode rejection (CMR) at V CM = 1500V  15V to 30V wide operating VCC2 range  –40°C to 125°C industrial temperature range  SO16 package with 8.3-mm creepage and clearance  Regulatory approvals: – UL1577 5 kV RMS for 1 minute –C S A – IEC 60747-5-5 V IORM = 1414 VPEAK

Applications

 Motor drive for industrial automation and robotics  Power supply and charger  Renewable energy inverter and storage CAUTION! Take normal static precautions in handling and assembly of this component to prevent damage, degradation, or both that may be induced by ESD. The component featured in this data sheet is not to be used in military or aerospace applications or environments. The component is also not AEC-Q100 qualified and not recommended for automotive applications. ACPL-334J/338J 3A IGBT Gate Drive Optocoupler with Integrated (VCE) Desaturation Detection and FAULT Feedback, UVLO, and Active Miller Clamping

Broadcom ACPL-334J-338J-DS102 ACPL-334J/338J Data Sheet 3A IGBT Gate Drive Optocoupler with Integrated (VCE) Desaturation Detection and FAULT Feedback, UVLO, and Active Miller Clamping Functional Diagram SHIELD SHIELD D R I V E R VE DESAT VCC2 VOUT VCLAMP VEE VCC1 VS FAULT ANODE CATHODE VCLAMP VLED 6, 7 5, 8 1, 4 9, 12 DESAT UVLO LED1 LED2

Broadcom ACPL-334J-338J-DS102 ACPL-334J/338J Data Sheet 3A IGBT Gate Drive Optocoupler with Integrated (VCE) Desaturation Detection and FAULT Feedback, UVLO, and Active Miller Clamping Pin Description Pin Symbol Description 1V S Input ground. 2V CC1 Positive input supply voltage (3.3V to 5.5V). 3 FAULT Fault output. FAULT changes from a high impedance state to a logic low output within 0.8 µs of the voltage on the DESAT pin exceeding an internal reference voltage of 6.5V. FAULT is an open collector output that allows the FAULT outputs from all ACPL-334J/338J in the circuit to be wired OR together. This forms a single fault bus for interfacing directly to the microcontroller. 4V S Input ground. 5 CATHODE Input LED cathode. 6 ANODE Input LED anode. 7 ANODE Input LED anode. 8 CATHODE Input LED cathode. EE Negative output power supply. 10 V CLAMP Miller clamp. 11 V OUT Driver output to turn on IGBT or MOSFET gate. 12 V EE Negative output power supply. 13 V CC2 Positive output power supply. 14 DESAT Desaturation voltage input. When the voltage on DESAT exceeds an internal reference voltage of 6.5V while the IGBT/MOSFET is on, the FAULT output is changed from logic high to low state within 0.8 µs. 15 V LED LED anode. This pin must be left unconnected for guaranteed data sheet performance. (For optical coupling testing only.) 16 V E Common (IGBT emitter) output supply voltage. VE VLED DESAT VCC2 VEE VOUT VCLAMP VEE VS VCC1 FAULT V S CATHODE ANODE ANODE CATHODE

Broadcom ACPL-334J-338J-DS102 ACPL-334J/338J Data Sheet 3A IGBT Gate Drive Optocoupler with Integrated (VCE) Desaturation Detection and FAULT Feedback, UVLO, and Active Miller Clamping

Ordering Information

To order, choose a part number from the part number column and combine with the desired option from the option column to form an order entry. Example: ACPL-334J-500E to order product of SO-16 surface-mount package in tape and reel packaging with IEC/EN/DIN EN 60747-5-5 safety approval in RoHS compliant. Option data sheets are available. Contact your Broadcom sales representative or authorized distributor for information. Package Outline Drawing Part Number Option (RoHS Compliant) Package Surface Mount Tape and Reel IEC/EN/DIN EN 60747-5-5 Quantity ACPL-334J/338J -000E SO-16 XX 4 5 p e r t u b e -500E X X X 850 per reel Dimensions in millimeters (inches). Note: Lead coplanarity = 0.10 mm (0.004 inches). Floating lead protrusion = 0.25 mm (0.010 inches) max. Mold Flash on each side = 0.127 mm (0.005 inches) max. A 334J YYWW EE Part Number Date Code Recommended Land Pattern Standoff 8.763 ±0.254 (0.345 ±0.010) 0.635 min. (0.025) 10.363 ±0.254 (0.408 ±0.010) 0.254 typ. (0.010)

1.270 BSC

(0.050) 0.457 typ. (0.018) 11.634 (0.458) 2.160 (0.085) (0 to 8°) 9°(×4) 0.635 (0.025) 9°(×4) RoHS Compliance Indicator 3.505 ±0.127 (0.138 ±0.005) 0.203 ±0.102 (0.008 ±0.004) Extended Datecode for lot tracking 7.493 +0.254 –0.127 (0.295 10.363 (0.408 +0.010) –0.005) +0.254 –0.127 +0.010) –0.005) 1.270 (0.050)

Broadcom ACPL-334J-338J-DS102 ACPL-334J/338J Data Sheet 3A IGBT Gate Drive Optocoupler with Integrated (VCE) Desaturation Detection and FAULT Feedback, UVLO, and Active Miller Clamping Recommended Pb-Free IR Profile Recommended reflow condition as per JEDEC Standard, J-STD-020 (latest revision). Non-halide flux should be used. Regulatory Information The ACPL-334J/338J is approved by the following organizations: IEC/EN/DIN EN60747-5-5 Insulation Characteristics NOTE: Isolation characteristics are guaranteed only within the safety maximum ratings, which must be ensured by protective circuits in application. Surface-mount classification is class A in accordance with CECCOO802. UL Approval under UL 1577, component recognition program up to V ISO = 5000 VRMS expected prior to product release. CSA Approval under CSA Component Acceptance Notice #5, File CA 88324. IEC/EN/DIN EN 60747-5-5 IEC 60747- 5-5, EN 60747-5-5, DIN EN 60747-5-5. Description Symbol Characteristic Unit Insulation Classification per DIN VDE 0110/1.89, Table 1 For Rated Mains Voltage ≤ 600 VRMS For Rated Mains Voltage ≤ 1000 VRMS I – IV I – III Climatic Classification — 40/125/21 — Pollution Degree (DIN VDE 0110/1.89) — 2 — Maximum Working Insulation Voltage V IORM 1414 V PEAK Input to Output Test Voltage, Method b a VIORM × 1.875 = VPR, 100% Production Test with tm = 1 second, Partial Discharge < 5 pC a. Refer to the IEC/EN/DIN EN 60747-5-5 Optoisolator Safety Standard section of the Broadcom Regulatory Guide to Isolation Circuits, AV02- 2041EN, for a detailed description of Method a and Method b partial discharge test profiles. VPR 2652 V PEAK Input to Output Test Voltage, Method a a VIORM × 1.6 = VPR, Type and Sample Test, tm = 10 seconds, Partial Discharge < 5 pC VPR 2262 V PEAK Highest Allowable Overvoltage (Transient Overvoltage tini = 60 seconds) V IOTM 8000 V PEAK Safety-Limiting Values – maximum values allowed in the event of a failure Case Temperature Input Power Output Power T S PS,INPUT PS,OUTPUT 175 400 1200 mW mW Insulation Resistance at TS, VIO = 500V R S > 109 Ω

Broadcom ACPL-334J-338J-DS102 ACPL-334J/338J Data Sheet 3A IGBT Gate Drive Optocoupler with Integrated (VCE) Desaturation Detection and FAULT Feedback, UVLO, and Active Miller Clamping Insulation and Safety Related Specifications NOTE: All Broadcom data sheets report the creepage and clearance inherent to the optocoupler component itself. These dimensions are needed as a starting point for the equipment designer when determining the circuit insulation requirements. However, once mounted on a printed circuit board, minimum creepage and clearance requirements must be met as specified for individual equipment standards. For creepage, the shortest distance path along the surface of a printed circuit board between the solder fillets of the input and output leads must be considered (the recommended land pattern does not necessarily meet the minimum creepage of the device). There are recommended techniques, such as grooves and ribs, that may be used on a printed circuit board to achieve desired creepage and clearances. Creepage and clearance distances will also change depending on factors such as pollution degree and insulation level. Parameter Symbol Value Unit Conditions Minimum External Air Gap (Clearance) L(101) 8.3 mm Measured from input terminals to output terminals, shortest distance through air. Minimum External Tracking (Creepage) L(102) 8.3 mm Measured from input terminals to output terminals, shortest distance path along body. Minimum Internal Plastic Gap (Internal Clearance) — 0.5 mm Through insulation distance conductor to conductor, usually the straight line distance thickness between the emitter and detector. Tracking Resistance (Comparative Tracking Index) CTI >175 V DIN IEC 112/VDE 0303 Part 1 Isolation Group IIIa Material Group (DIN VDE 0110)

Broadcom ACPL-334J-338J-DS102 ACPL-334J/338J Data Sheet 3A IGBT Gate Drive Optocoupler with Integrated (VCE) Desaturation Detection and FAULT Feedback, UVLO, and Active Miller Clamping Absolute Maximum Ratings Recommended Operating Conditions Parameter Symbol Min. Max. Unit Note Storage Temperature T S –55 150 °C Operating Temperature T A –40 125 °C a a. To achieve the absolute maximum power dissipation specified, pins 1, 4, 9, and 12 require ground plane connections and might require airflow. See the Thermal Calculation section for details about how to estimate junction temperature and power dissipation. In most cases, the absolute maximum output IC junction temperature is the limiting factor. The actual power dissipation achievable will depend on the application environment (PCB layout, airflow, part placement, and so on). Output IC power dissipation is derated linearly at 20 mW/°C above 123°C for high conductivity board and at 14 mW/°C above 105°C for low conductivity board. Input IC power dissipation does not require derating. Output IC Junction Temperature T J —1 5 0 ° C a Average Input Current I F(AVG) —2 5 m A b b. Derate linearly above 70°C free-air temperature at a rate of 0.3 mA/°C. Peak Transient Input Current (<1 µs pulse width, 300 pps) I F(TRAN) —1 . 0 A Reverse Input Voltage V R —5 V High Peak Output Current I OH(PEAK) —3 A c c. Maximum pulse width = 10 µs. The output must be limi ted to 3A of peak current by external resistors. Low Peak Output Current I OL(PEAK) —3 A c Positive Input Supply Voltage V CC1 –0.5 7 V FAULT Output Current I FAULT —8 m A FAULT Pin Voltage V FAULT –0.5 V CC1 V Total Output Supply Voltage (V CC2 – VEE)– 0 . 5 3 5 V Negative Output Supply Voltage (V E – VEE)– 0 . 5 1 5 V Positive Output Supply Voltage (V CC2 – VE) –0.5 35 – (V E – VEE)V Gate Drive Output Voltage V O(PEAK) VEE – 0.5 V CC2 + 0.5 V Peak Clamp Sinking Current I CLAMP —1 . 7 A Miller Clamp Pin Voltage V CLAMP VEE – 0.5 V CC2 + 0.5 V DESAT Voltage V DESAT VE – 0.5 V CC2 + 0.5 V Output IC Power Dissipation P O —6 0 0 m W a Input LED Power Dissipation P I —1 5 0 m W a Parameter Symbol Min. Max. Unit Note Operating Temperature T A –40 125 °C Total Output Supply Voltage (V CC2 – VEE)1 5 3 0 V Negative Output Supply Voltage (V E – VEE)0 1 5 V Positive Output Supply Voltage (V CC2 – VE) 15 30 – (V E – VEE)V Input Current (ON) I F(ON) 81 2 m A Input Voltage (OFF) V F(OFF) –3.6 0.8 V

Broadcom ACPL-334J-338J-DS102 ACPL-334J/338J Data Sheet 3A IGBT Gate Drive Optocoupler with Integrated (VCE) Desaturation Detection and FAULT Feedback, UVLO, and Active Miller Clamping Electrical Specifications (DC) All typical values at TA = 25°C, VCC2 – VEE = 30V, VE - VEE = 0V. All minimum and maximum specifications are at recommended operating conditions, unless otherwise noted. Parameter Symbol Min. Typ. Max. Unit Test Conditions Fig. Note FAULT Logic Low Output Voltage V FAULT —0 . 0 6 0 . 4 V I FAULT = 1.1 mA, VCC1 = 5.5V —0 . 0 6 0 . 4 V I FAULT = 1.1 mA, VCC1 = 3.3V FAULT Logic High Output Current I FAULTH —0 . 0 1 0 . 5 µ A V FAULT = 5.5V, VCC1 = 5.5V — 0.004 0.3 µA V FAULT = 3.3V, VCC1 = 3.3V VOUT High Level Peak Output Current I OH 22 . 6 — A V CC2 – VOUT = 15V 4 a VOUT Low Level Peak Output Current I OL 23 — A V OUT – VEE = 15V 5 a VOUT Low Level Output Current During Fault Condition IOLF 90 145 230 mA V OUT – VEE = 14V 6 VOUT High Level Output Voltage V OH VCC2 – 0.60 VCC2 – 0.3 —V I OH = –100 mA, IF = 10 mA 2 b, c VOUT Low Level Output Voltage V OL —V EE + 0.12 VEE + 0.60 VI OL = 100 mA, VF = 0V 3 Clamp Threshold Voltage V TH_CLAMP —1 . 8 5 2 . 2 V Clamp Low Level Sinking Current I CLAMP 0.35 1 — A V CLAMP = VEE + 2.5V 7 Clamp Low Level Peak Sinking Current I CLAMPPK —1 . 6— A V CLAMP = VEE + 10V High Level Output Supply Current (VCC2)I CC2H —5 8 m A I F = 10 mA, No Load 8 Low Level Output Supply Current (VCC2)I CC2L —4 8 m A V F = 0V, No Load 8 Output Supply Current during DESAT FAULT (VCC2) ICC2_FAULT —1 8— m A I F = 10 mA, VDESAT = 7V Blanking Capacitor Charging Current I CHG 0.9 1 1.1 mA V DESAT = 2V 12 c, d Blanking Capacitor Discharge Current I DSCHG 10 30 — mA V DESAT = 7V 13 c, d DESAT Sensing Voltage Threshold V DESAT 66 . 57 V V CC2 – VE > VUVLO+ 11 c UVLO Threshold, VCC2 – VE VUVLO+ 10.5 11.5 12.5 V I F = 10 mA, VOUT – VE > 5V b, c, e VUVLO– 9.5 10.5 11.5 V I F = 10 mA, VOUT – VE < 5V b, c, f UVLO Hysteresis, VCC2 – VE VUVLO+ – VUVLO– 0.5 1 — V Input Threshold Current Low to High I FLH 0.5 2.2 6.5 mA 9, 10 Input Threshold Voltage High to Low V FHL 0.8 — — V Input Forward Voltage V F 1.2 1.6 1.95 V I F = 10 mA Temperature Coefficient of Input Forward Voltage ΔVF/ΔTA —– 1 . 3— m V / ° C I F = 10 mA Input Reverse Breakdown Voltage BV R 5— —V I R = 100 mA Input Capacitance C IN — 70 — pF f = 1 MHz, V F = 0V

Broadcom ACPL-334J-338J-DS102 ACPL-334J/338J Data Sheet 3A IGBT Gate Drive Optocoupler with Integrated (VCE) Desaturation Detection and FAULT Feedback, UVLO, and Active Miller Clamping Switching Specifications (AC) All typical values at TA = 25°C, VCC2 – VE = 30V, VE – VEE = 0V. All minimum and maximum specifications are at recommended operating conditions, unless otherwise noted. a. Output is sourced at 2A with a maximum pulse width = 10 μs. b. 15V is the recommended minimum operating positive supply voltage (V CC2 – VE) to ensure adequate margin in excess of the maximum VUVLO+ threshold of 12.5V. For High Level Output Voltage testing, VOUT is measured with a 50-µs pulse load current. When driving capacitive loads, VOUT will approach VCC2 as IOUT approaches zero units. c. Once the system is out of UVLO (V CC2 – VE > VUVLO+), the DESAT detection feature of the ACPL-334J/338J will be the primary source of IGBT/MOSFET protection. The UVLO must be unlocked to ensure DESAT is functional. Once VCC2 exceeds the VUVLO+ threshold, DESAT will remain functional until VCC2 is below the VUVLO– threshold. The DESAT detection and UVLO features of the ACPL-334J/338J work in conjunction to ensure constant IGBT/MOSFET protection. d. See DESAT Fault Detection Blanking Time for further details. e. This is the increasing (that is, turn-on or positive-going direction) of VCC2 – VE. f. This is the decreasing (that is, turn-off or negative-going direction) of VCC2 – VE. Parameter Symbol Min. Typ. Max. Unit Test Conditions Fig. Note Propagation Delay Time to High VOUT Output Level tPLH 35 60 135 ns R G = 10Ω, CG = 10 nF, f = 10 kHz, Duty Cycle = 50%, V IN = 5V, RIN = 330Ω 1, 14 a Propagation Delay Time to Low VOUT Output Level tPHL 35 67 135 ns b Pulse Width Distortion PWD –30 7.5 30 ns c Propagation Delay Difference Between Any Two Parts PDD (tPLH – tPHL) –25 — 5 ns d Propagation Delay Skew t PSK —— 1 5 n s e 20% to 80% Rise Time on VOUT tR —2 0 n s 80% to 20% Fall Time on VOUT tF —1 0 n s DESAT Sense to 90% VOUT Delay t DESAT(90%) —0 . 2 50 . 5 µ s R G = 10Ω, CG = 10 nF, f = 10 kHz, Duty Cycle = 50%, V IN = 5V, RIN = 330Ω, CF = 330 pF, RF = 2.1 kΩ, CBLANK = 330 pF 15, 20, f DESAT Sense to 10% VOUT Delay t DESAT(10%) — 2 3 µ s 16, 17, 18, 20, g DESAT Sense to Low Level FAULT Signal Delay t DESAT(FAULT) —0 . 4 50 . 8 µ s 20, 21 h DESAT Sense to DESAT Low Propagation Delay tDESAT(LOW) —0 . 3 5 — µ s 20, 21 i DESAT Mute Time t DESAT(MUTE) (ACPL-334J) 4.5 6.5 — µs 20, 21 j tDESAT(MUTE) (ACPL-338J) 22 32 42 k RESET to High Level FAULT Signal Delay t RESET(FAULT) (ACPL-334J) 0.3 1.1 2.2 µs C F = 330 pF, RF = 2.1 kΩ, VCC1 = 5.5V 0.5 1.7 3.2 µs C F = 330 pF, RF = 2.1 kΩ, VCC1 = 3.3V

Broadcom ACPL-334J-338J-DS102 ACPL-334J/338J Data Sheet 3A IGBT Gate Drive Optocoupler with Integrated (VCE) Desaturation Detection and FAULT Feedback, UVLO, and Active Miller Clamping Output High Level Common Mode Transient Immunity |CMH| 100 — — kV/ μsT A = 25°C, VCM = 1500V, VCC1 = 5V, CF = 330 pF, RF = 2.1 kΩ, IF = 10 mA l, m Output Low Level Common Mode Transient Immunity |CML| 100 — — kV/ μsT A = 25°C, VCM = 1500V, VCC1 = 5V, CF = 330 pF, RF = 2.1 kΩ, VF = 0V n, m a. t PLH is defined as propagation delay from 50% of LED input IF to 50% of VOUT high level output. b. t PHL is defined as propagation delay from 50% of LED input IF to 50% of VOUT low level output. c. Pulse Width Distortion (PWD) is defined as |t PHL – tPLH| for any given unit. d. Propagation Delay Difference (PDD) is the difference between t PHL and tPLH between any two units under the same test condition. e. Propagation Delay Skew (t PSK) is the difference in tPHL or tPLH between any two units under the same test condition. f. The amount of time from when DESAT threshold is exceeded to 90% of V OUT at mentioned test conditions. g. The amount of time from when DESAT threshold is exceeded to 10% of V OUT at mentioned test conditions. h. The amount of time from when DESAT threshold is exceeded to FAULT output low. i. The amount of time from when DESAT thres hold is exceeded to 50% of DESAT low voltage. j. The amount of time when DESAT threshold is exceeded, output is muted to LED input. The fault mechanism can be reset by the next LED turn-on after the 4.5-μs (minimum) mute time. See the description of operation topic in the FAULT Reset section. k. The amount of time when DESAT threshold is exceeded, output is muted to LED input. The fault mechanism will automatically reset the FAULT pin after a fixed mute time of 32 µs (typical). See the description of operation topic in the FAULT Reset section. l. Common mode transient immunity in the high state is the maximum tolerable dV CM/dt of the common mode pulse, VCM, to ensure that the output will remain in the high state (that is, VCC2 – VOUT < 1.0V or FAULT > 2V). VDD2 must be higher than VUVLO+. m. Split resistor network in the ratio 2:1 with 226 Ω at the anode and 113Ω at the cathode. n. Common mode transient immunity in the low state is the maximum tolerable dVCM/dt of the common mode pulse, VCM, to ensure that the output will remain in a low state (that is, VOUT – VEE < 1.0V or FAULT > 2V). VCC2 must be higher than VUVLO+. Parameter Symbol Min. Typ. Max. Unit Test Conditions Fig. Note

Broadcom ACPL-334J-338J-DS102 ACPL-334J/338J Data Sheet 3A IGBT Gate Drive Optocoupler with Integrated (VCE) Desaturation Detection and FAULT Feedback, UVLO, and Active Miller Clamping Package Characteristics Parameter Symbol Min. Typ. Max. Unit Test Conditions Notes Input-Output Momentary Withstand Voltage V ISO 5000 — — V RMS RH < 50%, t = 1 min. TA = 25°C a, b, c Resistance (Input-Output) R I-O — 109 — Ω VI-O = 500 VDC c Capacitance (Input-Output) C I-O —1 . 3—p F f = 1 M H z High Conductivity Board Junction to Ambient Thermal Resistance of: °C/W d Input IC Due to Heating of Input IC R 11 —7 9 . 1 5— Input IC Due to Heating of LED1 R 12 — 24.11 — Input IC Due to Heating of Output IC R 13 —1 8 . 8 3— Input IC Due to Heating of LED2 R 14 —2 8 . 7 7— Input LED1 Due to Heating of Input IC R 21 —2 1 . 7 1— Input LED1 Due to Heating of LED1 R 22 — 121.2 — Input LED1 Due to Heating of Output IC R 23 —2 5 . 9 6— Input LED1 Due to Heating of LED2 R 24 —1 9 . 6 2— Output IC Due to Heating of Input IC R 31 —1 3 . 2 1— Output IC Due to Heating of LED1 R 32 —1 9 . 2 2— Output IC Due to Heating of Output IC R 33 —4 3 . 4 2— Output IC Due to Heating of LED2 R 34 —1 6 . 9 4— Input LED2 Due to Heating of Input IC R 41 —3 0 . 7 8— Input LED2 Due to Heating of LED1 R 42 —2 1 . 4 4— Input LED2 Due to Heating of Output IC R 43 —2 3 . 3 5— Input LED2 Due to Heating of LED2 R 44 — 120.7 — Low Conductivity Board Junction to Ambient Thermal Resistance of: °C/W d Input IC Due to Heating of Input IC R 11 — 130.3 — Input IC Due to Heating of LED1 R 12 —5 6 . 0 7— Input IC Due To Heating of Output IC R 13 —5 0 . 8 5— Input IC Due to Heating of LED2 R 14 —6 7 . 3 7— Input LED1 Due to Heating of Input IC R 21 —5 4 . 8 4— Input LED1 Due to Heating of LED1 R 22 — 156.5 — Input LED1 Due to Heating of Output IC R 23 —6 0 . 8 1— Input LED1 Due to Heating of LED2 R 24 —5 1 . 4 6— Output IC Due to Heating of Input IC R 31 —3 5 . 5 4— Output IC Due to Heating of LED1 R 32 —4 2 . 6 4— Output IC Due to Heating of Output IC R 33 —7 1 . 9 1— Output IC Due to Heating of LED2 R 34 —4 0 . 7 3— Input LED2 Due to Heating of Input IC R 41 —6 8 . 4 8— Input LED2 Due to Heating of LED1 R 42 —5 0 . 7 5— Input LED2 Due to Heating of Output IC R 43 —5 6 . 8 6— Input LED2 Due to Heating of LED2 R 44 — 163.9 —

Broadcom ACPL-334J-338J-DS102 ACPL-334J/338J Data Sheet 3A IGBT Gate Drive Optocoupler with Integrated (VCE) Desaturation Detection and FAULT Feedback, UVLO, and Active Miller Clamping Figure 1: VOUT Propagation Delay Waveforms a. In accordance with UL1577, each optocoupler is proof-tested by applying an insulation test voltage ≥ 6000 VRMS for 1 second. This test is performed before the 100% production test for partial discharge (method b) shown in the IEC/EN/DIN EN60747-5-5 Insulation Characteristics table, if applicable. b. The Input-Output Momentary Withstand Voltage is a dielectric voltage rating that should not be interpreted as an input-output continuous voltage rating. For the continuous voltage rating, refer to your equipment level safety specification or the IEC/EN/DIN EN60747-5-5 Insulation Characteristics table. c. The device is considered a two-terminal device: Pins 1 to 8 are shorted together, and pins 9 to 16 are shorted together. d. The device was mounted on thermal conductivity test board per JEDEC 51-7. For further details, see the Thermal Calculation section. 20% 80% 50%

Broadcom ACPL-334J-338J-DS102 ACPL-334J/338J Data Sheet 3A IGBT Gate Drive Optocoupler with Integrated (VCE) Desaturation Detection and FAULT Feedback, UVLO, and Active Miller Clamping Applications Information Recommended Application Circuit Figure 19: Recommended Application Circuit for ACPL-334J/338J The ACPL-334J/338J has an LED input gate control, and an open collector fault output suitable for wired OR applications. The recommended application circuit shown in Figure 19 illustrates a typical gate drive implementation using the ACPL- 334J/338J. The following describes about driving IGBT. However, it is also applicable to MOSFET. The supply bypass capacitors (1 µF) provide the large transient currents necessary during a switching transition. Because of the transient nature of the charging currents, a low current (7 mA to 8 mA) power supply suffices. The blocking diode DDESAT, 100Ω resistor, and Schottky diode DSCHOTTKY are necessary components to protect the DESAT pin 14. DDESAT should be a 600V or 1200V, fast recovery diode with trr below 75 ns (for example, ERA34-10). DSCHOTTKY should be a 40V or 60V, low VF diode (for example, MBR0540). The 330-pF capacitor, CBLANK, is used to adjust the DESAT blanking time to disable the DESAT detection for a short period of time during when the IGBT switch on. The gate resistor RG serves to limit the gate charge current and controls the IGBT collector voltage rise and fall times. The open collector fault output has a 2.1 kΩ pull-up resistor and a 330 pF filtering capacitor, CF. The two resistors, RANODE and RCATHODE, are connected to the input LED’s anode and cathode and are recommended to be split in the ratio of 2:1. They will help to balance the common mode impedances at the LED’s anode and cathode. This helps to equalize the common mode voltage changes at the anode and cathode to give high CMR performance. VE VLED DESAT VCC2 VEE VOUT VCLAMP VEE VS VCC1 FAULT V S CATHODE ANODE ANODE CATHODE +_RG 100 Ω CBLANK DDESAT VCE RF RANODE + HVDC - HVDC 3-PHASE AC VCE 1μF 1μF CF RCATHODE 1μF 1μF DSCHOTTKY

Broadcom ACPL-334J-338J-DS102 ACPL-334J/338J Data Sheet 3A IGBT Gate Drive Optocoupler with Integrated (VCE) Desaturation Detection and FAULT Feedback, UVLO, and Active Miller Clamping ACPL-338J Once a fault is detected, the output will be a soft shutdown to low. All input LED signals will be ignored during the fault period to allow the driver to completely soft shut down the IGBT. The driver will automatically reset the FAULT pin after a fixed mute time of 32 µs (typical). See Figure 21. Figure 21: ACPL-338J FAULT Timing Diagram IF VDESAT VOUT FAULT 6.5V 50% tDESAT(LOW) 10% tDESAT(10%) 90% tDESAT(90%) 50% tDESAT(FAULT) tDESAT(MUTE)) 50% Automatic Reset after Mute Time Output Control The outputs (VOUT and FAULT) of the ACPL-334J/338J are controlled by the combination of IF, UVLO and a detected IGBT DESAT condition. Once UVLO is not active (VCC2 – VE > VUVLO), VOUT is allowed to go high, and the DESAT (pin 14) detection feature of the ACPL-334J/338J will be the primary source of IGBT protection. Once VCC2 is increased from 0V to above VUVLO+, DESAT will remain functional until VCC2 is decreased below VUVLO-. Thus, the DESAT detection and UVLO features of the ACPL-334J/338J work in conjunction to ensure constant IGBT protection. Desaturation Detection and High Current Protection The ACPL-334J/338J satisfies these criteria by combining a high-speed, high output current driver, high-voltage optical isolation between the input and output, local IGBT desaturation detection and shutdown, and an optically isolated fault status feedback signal into a single 16-pin surface-mount package. The fault detection method, which is adopted in the ACPL- 334J/338J, is to monitor the saturation (collector) voltage of the IGBT and to trigger a local fault shutdown sequence if the collector voltage exceeds a predetermined threshold. A small gate discharge device slowly reduces the high short circuit IGBT current to prevent damaging voltage spikes. Before the dissipated energy can reach destructive levels, the IGBT is shut off. During the off state of the IGBT, the fault detect circuitry is simply disabled to prevent false fault signals.

Broadcom ACPL-334J-338J-DS102 ACPL-334J/338J Data Sheet 3A IGBT Gate Drive Optocoupler with Integrated (VCE) Desaturation Detection and FAULT Feedback, UVLO, and Active Miller Clamping The alternative protection scheme of measuring IGBT current to prevent desaturation is effective if the short circuit capability of the power device is known, but this method will fail if the gate drive voltage decreases enough to only partially turn on the IGBT. By directly measuring the collector voltage, the ACPL-334J/338J limits the power dissipation in the IGBT even with insufficient gate drive voltage. Another more subtle advantage of the desaturation detection method is that power dissipation in the IGBT is monitored, while the current sense method relies on a preset current threshold to predict the safe limit of operation. Therefore, an overly conservative overcurrent threshold is not needed to protect the IGBT. Slow IGBT Gate Discharge during Fault Condition When a desaturation fault is detected, a weak pull-down device in the ACPL-334J/338J output drive stage will turn on to softly turn off the IGBT. This device slowly discharges the IGBT gate to prevent fast changes in drain current that could cause damaging voltage spikes due to lead and wire inductance. During the slow turn off, the large output pull- down device remains off until the output voltage falls below V EE + 2V, at which time the large pull-down device clamps the IGBT gate to VEE. DESAT Fault Detection Blanking Time The DESAT fault detection circuitry must remain disabled for a short time period following the turn-on of the IGBT to allow the collector voltage to fall below the DESAT threshold. This time period, called the DESAT blanking time, is controlled by the internal DESAT charge current, the DESAT voltage threshold, and the external DESAT capacitor. The nominal blanking time is calculated in terms of external capacitance (C BLANK), FAULT threshold voltage (VDESAT), and DESAT charge current (ICHG) as tBLANK = CBLANK x VDESAT/ICHG. The nominal blanking time with the recommended 330-pF capacitor is 330 pF × 6.5V/1000 μA = 2.145 μs. The capacitance value can be scaled slightly to adjust the blanking time, though a value smaller than 330 pF is not recommended. This nominal blanking time represents the longest time it will take for the ACPL-334J/338J to respond to a DESAT fault condition. If the IGBT is turned on while the collector and emitter are shorted to the supply rails (switching into a short), the soft shutdown sequence will begin after approximately 2 μs. If the IGBT collector and emitter are shorted to the supply rails after the IGBT is already on, the response time will be much quicker due to the parasitic parallel capacitance of the DESAT diode. The recommended 330-pF capacitor should provide adequate blanking as well as fault response times for most applications. IF UVLO (VCC2 – VE) DESAT Function Pin 3 (FAULT) Output VOUT ON Active Not Active High Low ON Not Active Active (with DESAT fault) Low (FAULT) Low ON Not Active Active (no DESAT fault) High (or no fault) High OFF Active Not Active High Low OFF Not Active Not Active High Low

Broadcom ACPL-334J-338J-DS102 ACPL-334J/338J Data Sheet 3A IGBT Gate Drive Optocoupler with Integrated (VCE) Desaturation Detection and FAULT Feedback, UVLO, and Active Miller Clamping Under-Voltage Lockout The under-voltage lockout (UVLO) feature is designed to prevent the application of insufficient gate voltage to the IGBT by forcing the ACPL-334J/338J output low during power-up. IGBTs typically require gate voltages of 15V to achieve their rated V CE(ON) voltage. At gate voltages below 13V, the VCE(ON) voltage increases dramatically, especially at higher currents. At very low gate voltages below 10V, the IGBT may operate in the linear region and quickly overheat. The UVLO function causes the output to be clamped whenever insufficient operating supply (V CC2) is applied. Once VCC2 exceeds VUVLO+ (the positive-going UVLO threshold), the UVLO clamp is released to allow the device output to turn on in response to input signals. As VCC2 is increased from 0V (at some level below VUVLO+), first the DESAT protection circuitry becomes active. As VCC2 is further increased (above VUVLO+), the UVLO clamp is released. Before the time the UVLO clamp is released, the DESAT protection is already active. Therefore, the UVLO and DESAT fault detection feature work together to provide seamless protection regardless of supply voltage (V CC2). Active Miller Clamp An active Miller clamp allows the control of the Miller current during a high dv/dt situation and can eliminate the use of a negative supply voltage in most of the applications. During turn-off, the gate voltage is monitored and the clamp output is activated when gate voltage goes below 2V (relative to V EE). The clamp voltage is VOL + 2.5V typical for a Miller current up to 1 A. The clamp is disabled when the LED input is triggered again. DESAT Pin Protection Resistor The freewheeling of flyback diodes connected across the IGBTs can have large instantaneous forward voltage transients, which greatly exceed the nominal forward voltage of the diode. This may result in a large negative voltage spike on the DESAT pin, which will draw substantial current out of the driver if protection is not used. To limit this current to levels that will not damage the driver IC, a 100Ω resistor should be inserted in series with the DESAT diode. The added resistance will not alter the DESAT threshold or the DESAT blanking time. But as the I CHG is 1 mA, it is to be noted that there will be a 0.1V contribution to the DESAT sensing path together with DDESAT and VCE(IGBT). False Fault Prevention Diodes One of the situations that may cause the driver to generate a false fault signal is if the substrate diode of the driver becomes forward biased. This can happen if the reverse recovery spikes coming from the IGBT/MOSFET freewheeling diodes bring the DESAT pin below ground. Hence, the DESAT pin voltage will be brought above the threshold voltage. These negative-going voltage spikes are typically generated by inductive loads or reverse recovery spikes of the IGBT/MOSFETs free-wheeling diodes. In order to prevent a false fault signal, it is highly recommended to connect a Zener diode and Schottky diode across the DESAT pin and VE pin. This circuit solution is shown in Figure 22. The Schottky diode will prevent the substrate diode of the gate driver optocoupler from being forward biased while the Zener diode (value around 10V) is used to prevent any positive high transient voltage to affect the DESAT pin. Figure 22: False Fault Prevention Diodes 10V Zener 1N5925A 1SMA5925BT3G (SMD) BZX85C10-TAP (Axial) SchoƩky Diode MBR0540 VLED2 DESAT 100Ω DDESAT VCE 16VE CBLANK

Broadcom ACPL-334J-338J-DS102 ACPL-334J/338J Data Sheet 3A IGBT Gate Drive Optocoupler with Integrated (VCE) Desaturation Detection and FAULT Feedback, UVLO, and Active Miller Clamping Thermal Calculation The temperature at the LED and IC junctions of the optocoupler can be calculated using the equations below. Application and environmental design for ACPL-334J/338J needs to ensure that the junction temperature of the internal ICs and LED do not exceed 150°C. TE1 = R21 × PE1 + R22 × PI + R23 × PO + R24 × PE2 + TA TI = R11 × PE1 + R12 × PI + R13 × PO + R14 × PE2 + TA TO = R31 × PE1 + R32 × PI + R33 × PO + R34 × PE2 + TA TE2 = R41 × PE1 + R42 × PI + R43 × PO + R44 × PE2 + TA  TE1: LED1 junction temperature  TI: Input IC junction temperature  TO: Output IC junction temperature  TE2: LED2 junction temperature  PE1: LED1 power dissipation  PI: Input IC power dissipation  PO: Output IC power dissipation  PE2: LED2 power dissipation  TA: Ambient temperature Table 1: Thermal Resistance Thermal Resistance Symbol Typ. °C/W High Conductivity Board Junction to Ambient Thermal Resistance of: Input IC Due to Heating of Input IC R 11 79.15 Input IC Due to Heating of LED1 R 12 24.11 Input IC Due to Heating of Output IC R 13 18.83 Input IC Due to Heating of LED2 R 14 28.77 Input LED1 Due to Heating of Input IC R 21 21.71 Input LED1 Due to Heating of LED1 R 22 121.2 Input LED1 Due to Heating of Output IC R 23 25.96 Input LED1 Due to Heating of LED2 R 24 19.62 Output IC Due to Heating of Input IC R 31 13.21 Output IC Due to Heating of LED1 R 32 19.22 Output IC Due to Heating of Output IC R 33 43.42 Output IC Due to Heating of LED2 R 34 16.94 Input LED2 Due to Heating of Input IC R 41 30.78 Input LED2 Due to Heating of LED1 R 42 21.44 Input LED2 Due to Heating of Output IC R 43 23.35 Input LED2 Due to Heating of LED2 R 44 120.7

Broadcom ACPL-334J-338J-DS102 ACPL-334J/338J Data Sheet 3A IGBT Gate Drive Optocoupler with Integrated (VCE) Desaturation Detection and FAULT Feedback, UVLO, and Active Miller Clamping Low Conductivity Board Junction to Ambient Thermal Resistance of: Input IC Due to Heating of Input IC R 11 130.3 Input IC Due to Heating of LED1 R 12 56.07 Input IC Due to Heating of Output IC R 13 50.85 Input IC Due to Heating of LED2 R 14 67.37 Input LED1 Due to Heating of Input IC R 21 54.84 Input LED1 Due to Heating of LED1 R 22 156.5 Input LED1 Due to Heating of Output IC R 23 60.81 Input LED1 Due to Heating of LED2 R 24 51.46 Output IC Due to Heating of Input IC R 31 35.54 Output IC Due to Heating of LED1 R 32 42.64 Output IC Due to Heating of Output IC R 33 71.91 Output IC Due to Heating of LED2 R 34 40.73 Input LED2 Due to Heating of Input IC R 41 68.48 Input LED2 Due to Heating of LED1 R 42 50.75 Input LED2 Due to Heating of Output IC R 43 56.86 Input LED2 Due to Heating of LED2 R 44 163.9 Table 1: Thermal Resistance (Continued) Thermal Resistance Symbol Typ. °C/W

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