74HC244 SS

Document overview

  • PDF pages: 6

Technical content

Page 1

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Rev 1.1

Octal 3-State Non-Inverting Buffer / Line Driver / Line Receiver in bare die form

Description

The 74HC244 is fabricated using a 2.5µm 5V CMOS process and has the same high speed performance of LSTTL combined with CMOS low power consumption. The device can be used as two 4-bit buffers or one 8-bit buffer and features non-inverting inputs with two output enables, each controlling four of the 3-state outputs. The device is specifically designed to improve performance and density in clock drivers, 3-state memory address drivers and bus orientated transmitters and receivers. Inputs include clamp diodes that enable the use of current limiting resistors to interface inputs to voltages in excess of VCC

Ordering Information

The following part suffixes apply:

ƒ No suffix - MIL-STD-883 /2010B Visual Inspection

For High Reliability versions of this product please see

54HC244

Supply Formats:

ƒ Default – Die in Waffle Pack (100 per tray capacity)

ƒ Sawn Wafer on Tape – On request

ƒ Unsawn Wafer – On request

ƒ Die Thickness <> 350µm(14 Mils) – On request

ƒ Assembled into Ceramic Package – On request

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01/05/18

Features:

ƒ Output Drive Capability: 15 LSTTL Loads

ƒ Low Input Current: 1µA

ƒ Outputs directly interface CMOS, NMOS and TTL

ƒ Operating Voltage Range: 2V to 6V

ƒ CMOS High Noise Immunity

ƒ Function compatible with 74LS244.

Die Dimensions in µm (mils)

1900 (75)

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Mechanical Specification

Die Size (Unsawn) 1900 x 2050 75 x 81 µm mils
Minimum Bond Pad Size 100 x 100 3.94 x 3.94 µm mils
Die Thickness 350 (±20) 13.78 (±0.79) µm mils
Top Metal Composition Al 1%Si 1.1µm
Back Metal Composition N/A – Bare Si

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Rev 1.1

01/05/18

Pad Layout and Functions

2 1 20 19 18 3 17 4 16 5 DIE ID 15 6 14 7 13 8 9 10 11 12
0,0
PAD FUNCTION
1 ENABLE A
2 A1
3 YB4
4 A2
5 YB3
6 A3
7 YB2
8 A4
9 YB1
10 GND
11 B1
12 YA4
13 B2
14 YA3
15 B3
16 YA2
17 B4
18 YA1
19 ENABLE B
20 V CC
CONNECT CHIP BACK TO V OR FLOAT CC

1900µm (74.80 mils)

Logic Diagram

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Truth Table

INPUTS OUTPUTS
ENABLE A ENABLE B A, B YA, YB
L L H L H X L H Z
H = High level (steady state) L = Low level (steady state) X = Don’t care Z = High impedance

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Page 3

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Rev 1.1

01/05/18

Pad Descriptions

ADDRESS INPUTS A1, A2, A3, A4, B1, B2, B3, B4

(Pads 2, 4, 6, 8, 11, 13, 15, 17) Data input pins. Data on these pins appear in non-inverted form on the corresponding Y outputs, when the outputs are enabled.

CONTROL INPUTS

Enable A, Enable B (Pads 1, 19) Output enables (active–low). When a low level is applied to these pins, the outputs are enabled and the devices function as noninverting buffers. When a high level is applied, the outputs assume the high impedance state.

OUTPUTS YA1, YA2, YA3, YA4, YB1, YB2, YB3, YB4

(Pads 18, 16, 14, 12, 9, 7, 5, 3) Device outputs. Depending upon the state of the output– enable pins, these outputs are either non-inverting outputs or high– impedance outputs.

Absolute Maximum Ratings1

PARAMETER SYMBOL VALUE UNIT
DC Supply Voltage (Referenced to GND) V CC -0.5 to +7.0 V
DC Input Voltage (Referenced to GND) V IN -1.5 to V +1.5 CC V
DC Output Voltage (Referenced to GND) V OUT -0.5 to V +0.5 CC V
DC Input C urrent, per pin I IN ±20 mA
DC Output Current, per pin I OUT ±35 mA
DC V or GND Current, per pin CC I CC ±75 mA
Power Dissipation in Still Air2 P D 750 mW
Storage Temperature Range T STG -65 to 150 °C
  1. Operation above the absolute maximum rating may cause device failure. Operation at the absolute maximum ratings, for extended periods, may reduce device reliability. 2. Measured in plastic DIP package, results in die form are dependent on die attach and assembly method.

Recommended Operating Conditions3 (Voltages referenced to GND)

PARAMETER SYMBOL MIN MAX
DC Supply Voltage V CC 2 6
DC Input or Output Voltage V ,V IN OUT 0 V CC
Operating Temperature Range T A 0 +85
Input Rise and Fall Time V = 2.0V CC t, t r f 0 1000
V = 4.5V CC 0 500
V = 6.0V CC 0 400

UNITS

V V °C

ns

  1. This device contains protection circuitry to guard against damage due to high static voltages or electric fields. However, precautions must be taken to avoid applications of any voltage higher than maximum rated voltages to this high-impedance circuit. For proper operation, VIN and VOUT should be constrained to the range GND ≤ (VIN or VOUT) ≤ VCC. Unused inputs must always be tied to an appropriate logic voltage level (e.g., either GND or VCC). Unused outputs must be left open.

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Page 4

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Rev 1.1

01/05/18

DC Electrical Characteristics (Voltages Referenced to GND)

PARAMETER SYMBOL V CC CONDITIONS LIMITS UNITS
25°C 85°C FULL RANGE4
Minimum High-Level Input Voltage V IH 2.0V V = V -0.1V OUT CC │I │≤ 20µA OUT 1.5 1.5 1.5 V
3.0V 2.1 2.1 2.1
4.5V 3.15 3.15 3.15
6.0V 4.2 4.2 4.2
Maximum Low-Level Input Voltage V IL 2.0V V = 0.1V OUT │I │≤ 20µA OUT 0.5 0.5 0.5 V
3.0V 0.9 0.9 0.9
4.5V 1.35 1.35 1.35
6.0V 1.8 1.8 1.8
Minimum High-Level Output Voltage V OH 2.0V V = V IN IH │I │≤ 20µA OUT 1.9 1.9 1.9 V
4.5V 4.4 4.4 4.4
6.0V 5.9 5.9 5.9
3.0V V = V IN IH │I │≤ 2.4mA OUT 2.48 2.34 2.34 V
4.5V V = V IN IH │I │≤ 6.0mA OUT 3.98 3.84 3.84
6.0V V = V IN IH │I │≤ 7.8mA OUT 5.48 5.34 5.34
Maximum Low-Level Output Voltage V OL 2.0V V = V IN IL │I │≤ 20µA OUT 0.1 0.1 0.1 V
4.5V 0.1 0.1 0.1
6.0V 0.1 0.1 0.1
3.0V V = V IN IL │I │≤ 2.4mA OUT 0.26 0.33 0.33 V
4.5V V = V IN IL │I │≤ 6.0mA OUT 0.26 0.33 0.33
6.0V V = V IN IL │I │≤ 7.8mA OUT 0.26 0.33 0.33
Maximum Input Leakage Current I IN 6.0V V = V or GND IN CC ±0.1 ±1.0 ±1.0 µA
Maximum 3-State leakage current I OZ 6.0V V = V or 0 OUT CC V = V or V IN IL IH ±0.5 ±5.0 ±5.0 µA
Maximum Quiescent Supply Leakage Current I CC 6.0V V = V or GND IN CC I = 0µA OUT 4 40 40 µA
  1. 0˚C ≤ TJ ≤ +85˚C

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Page 5

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Rev 1.1

AC Electrical Characteristics5

01/05/18

PARA METER SYMBOL V CC CONDITIONS LIMITS UNITS
25°C 85°C FULL RANGE4
Maximum Propagation Delay, A to YA or B to YB (Figure 1, 3) t t PLH, PHL 2.0V C = 50pF, L t = t = 6ns r f 96 115 115 ns
3.0V 50 60 60
4.5V 18 23 23
6.0V 15 20 20
Maximum Propagation Delay, Output Enable to YA or YB (Fig ure 2,4) t t PLZ, PHZ 2.0V C = 50pF, L t = t = 6ns r f 110 140 140 ns
3.0V 60 70 70
4.5V 22 28 28
6.0V 19 24 24
Maximum Propagation Delay, Output Enable to Y A or YB (Figure 2,4) t t PZL, PZH 2.0V C = 50pF, L t = t = 6ns r f 110 140 140 ns
3.0 60 70 70
4.5V 22 28 28
6.0V 19 24 24
Maximum Output Rise and F all Time (Figure 1, 3) t t TLH, THL 2.0V C = 50pF, L t = t = 6ns r f 60 75 75 ns
3.0V 23 27 27
4.5V 12 15 15
6.0V 10 13 13
Maximum Input Cap acitance C IN - - 10 10 10 pF
Maximum Three-State Output Capacitance (Output in High- Impedance State) C OUT - - 15 15 15 pF
Power Dissipation Capacitance (Per Buffer)5 C PD - T = 25°C, A V = 5.0V CC TYPICAL pF
34
  1. Not production tested in die form, characterized by chip design and tested in package LAT.

2f + ICC VCC.

  1. Used to determine the no-load dynamic power consumption: PD = CPD VCC

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Page 6

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Rev 1.1

01/05/18

Switching Waveforms

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Figure 1 – Propagation Delay Input A or B to Output YA or YB

Test Circuits

TEST POINT

Figure 2 – Propagation Delay Output Enable to Output YA or YB

TEST POINT

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CONNECT TO VCC WHEN TESTING tPLZ,& tPZL. CONNECT TO GND WHEN TESTING tPHZ,& tPZH

\* Includes all probe and jig capacitance

\* Includes all probe and jig capacitance

Figure 3

Figure 4

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