74HC244 SS
Document overview
- PDF pages: 6
Technical content
Page 1

Rev 1.1
Octal 3-State Non-Inverting Buffer / Line Driver / Line Receiver in bare die form
Description
The 74HC244 is fabricated using a 2.5µm 5V CMOS process and has the same high speed performance of LSTTL combined with CMOS low power consumption. The device can be used as two 4-bit buffers or one 8-bit buffer and features non-inverting inputs with two output enables, each controlling four of the 3-state outputs. The device is specifically designed to improve performance and density in clock drivers, 3-state memory address drivers and bus orientated transmitters and receivers. Inputs include clamp diodes that enable the use of current limiting resistors to interface inputs to voltages in excess of VCC
Ordering Information
The following part suffixes apply:
No suffix - MIL-STD-883 /2010B Visual Inspection
For High Reliability versions of this product please see
54HC244
Supply Formats:
Default – Die in Waffle Pack (100 per tray capacity)
Sawn Wafer on Tape – On request
Unsawn Wafer – On request
Die Thickness <> 350µm(14 Mils) – On request
Assembled into Ceramic Package – On request
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01/05/18
Features:
Output Drive Capability: 15 LSTTL Loads
Low Input Current: 1µA
Outputs directly interface CMOS, NMOS and TTL
Operating Voltage Range: 2V to 6V
CMOS High Noise Immunity
Function compatible with 74LS244.
Die Dimensions in µm (mils)
1900 (75)

Mechanical Specification
| Die Size (Unsawn) | 1900 x 2050 75 x 81 | µm mils |
| Minimum Bond Pad Size | 100 x 100 3.94 x 3.94 | µm mils |
| Die Thickness | 350 (±20) 13.78 (±0.79) | µm mils |
| Top Metal Composition | Al 1%Si 1.1µm | |
| Back Metal Composition | N/A – Bare Si | |
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Rev 1.1
01/05/18
Pad Layout and Functions
| 2 1 20 19 18 3 17 4 16 5 DIE ID 15 6 14 7 13 8 9 10 11 12 | |
| 0,0 |
| PAD FUNCTION | |
| 1 | ENABLE A |
| 2 | A1 |
| 3 | YB4 |
| 4 | A2 |
| 5 | YB3 |
| 6 | A3 |
| 7 | YB2 |
| 8 | A4 |
| 9 | YB1 |
| 10 | GND |
| 11 B1 | |
| 12 | YA4 |
| 13 | B2 |
| 14 | YA3 |
| 15 | B3 |
| 16 | YA2 |
| 17 | B4 |
| 18 | YA1 |
| 19 | ENABLE B |
| 20 | V CC |
| CONNECT CHIP BACK TO V OR FLOAT CC | |
1900µm (74.80 mils)
Logic Diagram

Truth Table
| INPUTS | OUTPUTS | |
| ENABLE A ENABLE B | A, B | YA, YB |
| L L H | L H X | L H Z |
| H = High level (steady state) L = Low level (steady state) X = Don’t care Z = High impedance | ||
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Page 3

Rev 1.1
01/05/18
Pad Descriptions
ADDRESS INPUTS A1, A2, A3, A4, B1, B2, B3, B4
(Pads 2, 4, 6, 8, 11, 13, 15, 17) Data input pins. Data on these pins appear in non-inverted form on the corresponding Y outputs, when the outputs are enabled.
CONTROL INPUTS
Enable A, Enable B (Pads 1, 19) Output enables (active–low). When a low level is applied to these pins, the outputs are enabled and the devices function as noninverting buffers. When a high level is applied, the outputs assume the high impedance state.
OUTPUTS YA1, YA2, YA3, YA4, YB1, YB2, YB3, YB4
(Pads 18, 16, 14, 12, 9, 7, 5, 3) Device outputs. Depending upon the state of the output– enable pins, these outputs are either non-inverting outputs or high– impedance outputs.
Absolute Maximum Ratings1
| PARAMETER | SYMBOL | VALUE | UNIT |
|---|---|---|---|
| DC Supply Voltage (Referenced to GND) | V CC | -0.5 to +7.0 | V |
| DC Input Voltage (Referenced to GND) | V IN | -1.5 to V +1.5 CC | V |
| DC Output Voltage (Referenced to GND) | V OUT | -0.5 to V +0.5 CC | V |
| DC Input C urrent, per pin | I IN | ±20 | mA |
| DC Output Current, per pin | I OUT | ±35 | mA |
| DC V or GND Current, per pin CC | I CC | ±75 | mA |
| Power Dissipation in Still Air2 | P D | 750 | mW |
| Storage Temperature Range | T STG | -65 to 150 | °C |
- Operation above the absolute maximum rating may cause device failure. Operation at the absolute maximum ratings, for extended periods, may reduce device reliability. 2. Measured in plastic DIP package, results in die form are dependent on die attach and assembly method.
Recommended Operating Conditions3 (Voltages referenced to GND)
| PARAMETER | SYMBOL | MIN | MAX | |
|---|---|---|---|---|
| DC Supply Voltage | V CC | 2 | 6 | |
| DC Input or Output Voltage | V ,V IN OUT | 0 | V CC | |
| Operating Temperature Range | T A | 0 | +85 | |
| Input Rise and Fall Time | V = 2.0V CC | t, t r f | 0 | 1000 |
| V = 4.5V CC | 0 | 500 | ||
| V = 6.0V CC | 0 | 400 | ||
UNITS
V V °C
ns
- This device contains protection circuitry to guard against damage due to high static voltages or electric fields. However, precautions must be taken to avoid applications of any voltage higher than maximum rated voltages to this high-impedance circuit. For proper operation, VIN and VOUT should be constrained to the range GND ≤ (VIN or VOUT) ≤ VCC. Unused inputs must always be tied to an appropriate logic voltage level (e.g., either GND or VCC). Unused outputs must be left open.
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Page 4

Rev 1.1
01/05/18
DC Electrical Characteristics (Voltages Referenced to GND)
| PARAMETER | SYMBOL | V CC | CONDITIONS | LIMITS | UNITS | ||
|---|---|---|---|---|---|---|---|
| 25°C | 85°C | FULL RANGE4 | |||||
| Minimum High-Level Input Voltage | V IH | 2.0V | V = V -0.1V OUT CC │I │≤ 20µA OUT | 1.5 | 1.5 | 1.5 | V |
| 3.0V | 2.1 | 2.1 | 2.1 | ||||
| 4.5V | 3.15 | 3.15 | 3.15 | ||||
| 6.0V | 4.2 | 4.2 | 4.2 | ||||
| Maximum Low-Level Input Voltage | V IL | 2.0V | V = 0.1V OUT │I │≤ 20µA OUT | 0.5 | 0.5 | 0.5 | V |
| 3.0V | 0.9 | 0.9 | 0.9 | ||||
| 4.5V | 1.35 | 1.35 | 1.35 | ||||
| 6.0V | 1.8 | 1.8 | 1.8 | ||||
| Minimum High-Level Output Voltage | V OH | 2.0V | V = V IN IH │I │≤ 20µA OUT | 1.9 | 1.9 | 1.9 | V |
| 4.5V | 4.4 | 4.4 | 4.4 | ||||
| 6.0V | 5.9 | 5.9 | 5.9 | ||||
| 3.0V | V = V IN IH │I │≤ 2.4mA OUT | 2.48 | 2.34 | 2.34 | V | ||
| 4.5V | V = V IN IH │I │≤ 6.0mA OUT | 3.98 | 3.84 | 3.84 | |||
| 6.0V | V = V IN IH │I │≤ 7.8mA OUT | 5.48 | 5.34 | 5.34 | |||
| Maximum Low-Level Output Voltage | V OL | 2.0V | V = V IN IL │I │≤ 20µA OUT | 0.1 | 0.1 | 0.1 | V |
| 4.5V | 0.1 | 0.1 | 0.1 | ||||
| 6.0V | 0.1 | 0.1 | 0.1 | ||||
| 3.0V | V = V IN IL │I │≤ 2.4mA OUT | 0.26 | 0.33 | 0.33 | V | ||
| 4.5V | V = V IN IL │I │≤ 6.0mA OUT | 0.26 | 0.33 | 0.33 | |||
| 6.0V | V = V IN IL │I │≤ 7.8mA OUT | 0.26 | 0.33 | 0.33 | |||
| Maximum Input Leakage Current | I IN | 6.0V | V = V or GND IN CC | ±0.1 | ±1.0 | ±1.0 | µA |
| Maximum 3-State leakage current | I OZ | 6.0V | V = V or 0 OUT CC V = V or V IN IL IH | ±0.5 | ±5.0 | ±5.0 | µA |
| Maximum Quiescent Supply Leakage Current | I CC | 6.0V | V = V or GND IN CC I = 0µA OUT | 4 | 40 | 40 | µA |
- 0˚C ≤ TJ ≤ +85˚C
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Page 5

Rev 1.1
AC Electrical Characteristics5
01/05/18
| PARA METER | SYMBOL | V CC | CONDITIONS | LIMITS | UNITS | ||
|---|---|---|---|---|---|---|---|
| 25°C | 85°C | FULL RANGE4 | |||||
| Maximum Propagation Delay, A to YA or B to YB (Figure 1, 3) | t t PLH, PHL | 2.0V | C = 50pF, L t = t = 6ns r f | 96 | 115 | 115 | ns |
| 3.0V | 50 | 60 | 60 | ||||
| 4.5V | 18 | 23 | 23 | ||||
| 6.0V | 15 | 20 | 20 | ||||
| Maximum Propagation Delay, Output Enable to YA or YB (Fig ure 2,4) | t t PLZ, PHZ | 2.0V | C = 50pF, L t = t = 6ns r f | 110 | 140 | 140 | ns |
| 3.0V | 60 | 70 | 70 | ||||
| 4.5V | 22 | 28 | 28 | ||||
| 6.0V | 19 | 24 | 24 | ||||
| Maximum Propagation Delay, Output Enable to Y A or YB (Figure 2,4) | t t PZL, PZH | 2.0V | C = 50pF, L t = t = 6ns r f | 110 | 140 | 140 | ns |
| 3.0 | 60 | 70 | 70 | ||||
| 4.5V | 22 | 28 | 28 | ||||
| 6.0V | 19 | 24 | 24 | ||||
| Maximum Output Rise and F all Time (Figure 1, 3) | t t TLH, THL | 2.0V | C = 50pF, L t = t = 6ns r f | 60 | 75 | 75 | ns |
| 3.0V | 23 | 27 | 27 | ||||
| 4.5V | 12 | 15 | 15 | ||||
| 6.0V | 10 | 13 | 13 | ||||
| Maximum Input Cap acitance | C IN | - | - | 10 | 10 | 10 | pF |
| Maximum Three-State Output Capacitance (Output in High- Impedance State) | C OUT | - | - | 15 | 15 | 15 | pF |
| Power Dissipation Capacitance (Per Buffer)5 | C PD | - | T = 25°C, A V = 5.0V CC | TYPICAL | pF | ||
| 34 | |||||||
- Not production tested in die form, characterized by chip design and tested in package LAT.
2f + ICC VCC.
- Used to determine the no-load dynamic power consumption: PD = CPD VCC
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Page 6

Rev 1.1
01/05/18
Switching Waveforms


Figure 1 – Propagation Delay Input A or B to Output YA or YB
Test Circuits
TEST POINT
Figure 2 – Propagation Delay Output Enable to Output YA or YB
TEST POINT


CONNECT TO VCC WHEN TESTING tPLZ,& tPZL. CONNECT TO GND WHEN TESTING tPHZ,& tPZH
\* Includes all probe and jig capacitance
\* Includes all probe and jig capacitance
Figure 3
Figure 4

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