100325D

100325 NSC

Document overview

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Technical content

Features

n Pin/function compatible with 100125 n Meets 100125 AC specifications n 50% power reduction of the 100125 n Differential inputs with built in offset n Standard FAST® outputs n 2000V ESD protection n −4.2V to −5.7V operating range n Available to Microcircuit Drawing (SMD) 5962-9153101 Logic Diagram Pin Names Description D 0–D 5 Data Inputs D 0–D 5 Inverting Data Inputs Q 0–Q 5 Data Outputs FAST ® is a registered trademark of Fairchild Semiconductor. DS100314-4 August 1998

100325 Low Power Hex ECL-to-TTL Translator

© 1998 National Semiconductor Corporation DS100314 www.national.com

Connection Diagrams Truth Table Inputs Outputs D n D n Q n LH L HL H LL L HH L Open Open L VEE VEE L LV BB L HV BB H VBB LH VBB HL H = HIGH Voltage Level L = LOW Voltage Level 24-Pin DIP DS100314-1 24-Pin Quad Cerpak DS100314-2 www.national.com 2

Absolute Maximum Ratings(Note 1) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Above which the useful life may be impaired. Storage Temperature (T STG ) −65˚C to +150˚C Maximum Junction Temperature (TJ) Ceramic +175˚C VEE Pin Potential to Ground Pin −7.0V to +0.5V VTTL Pin Potential to Ground Pin −0.5V to +6.0V Input Voltage (DC) V EE to +0.5V Voltage Applied to Output in HIGH State (with VCC = 0V) −0.5V to V CC Current Applied to Output in LOW State (Max) twice the rated I OL (mA) ESD (Note 2) ≥2000V Recommended Operating Conditions Case Temperature (TC ) Military −55˚C to +125˚C Supply Voltage (VEE ) −5.7V to −4.2V Note 1: Absolute maximum ratings are those values beyond which the de- vice may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: ESD testing conforms to MIL-STD-883, Method 3015. Military Version VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = −55˚C to +125˚C, CL = 50 pF, VTTL = +4.5V to +5.5V Symbol Parameter Min Max Units T C Conditions Notes VBB Output Reference Voltage −1380 −1260 0˚C to +125˚C I VBB = −3 µA, VEE = −4.2V (Notes 3, 4, 5)mV I VBB = −2.1 mA V EE = −5.7V −1396 −1260 −55˚C I VBB = −3 mA VIH Input HIGH Voltage −1165 −870 mV −55˚C to +125˚C Guaranteed HIGH Signal for All Inputs (Notes 3, 4, 5, 6)(with One Input Tied to VBB ) VIL Input LOW Voltage −1830 −1475 mV −55˚C to +125˚C Guaranteed LOW Signal for All Inputs (Notes 3, 4, 5, 6)(with One Input Tied to VBB ) VOH Output HIGH Voltage 2.5 mV 0˚C to +125˚C I OH = −2.0 mA V IN = VIH (Max) (Notes 3, 4, 5)2.4 −55˚C or V IL (Min) VOL Output LOW Voltage 0.5 mV −55˚C to +125˚C I OL = 20 mA VDIFF Input Voltage Differential 150 mV −55˚C to +125˚C Required for Full Output Swing (Notes 3, 4, 5) VCM Common Mode Voltage −2000 −500 mV −55˚C to +125˚C (Notes 3, 4, 5, 6) IIH Input HIGH Current 350 µA 0˚C to +125˚C V IN = VIH (Max),D 0–D 5 = VBB , (Notes 3, 4, 5)500 −55˚C D 0–D 5 = VIL (Min) IIL Input LOW Current 0.50 µA −55˚C to +125˚C V IN = VIL (Min),D 0–D 5 = VBB (Notes 3, 4, 5) IOS Output Short Circuit −150 −60 mA −55˚C to +125˚C V OUT = GND (Notes 3, 4, 5)Current Test One Output at a Time ICEX Output HIGH 250 µA −55˚C to +125˚C V OUT = 5.5V (Notes 3, 4, 5)Leakage Current IEE VEE Power Supply Current −35 −12 mA −55˚C to +125˚C D 0–D 5 = VBB (Notes 3, 4, 5) ITTL VTTL Power Supply Current 65 mA −55˚C to +125˚C D 0–D 5 = VBB (Notes 3, 4, 5) Note 3:F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures. Note 4: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8. Note 5:Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, + 25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8. Note 6:Guaranteed by applying specified input condition and testing VOH /VOL . 3 www.national.com

after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures. Note 8: Screen tested 100% on each device at +25˚C, temperature only, Subgroup A9. Note 9:Sample tested (Method 5005, Table I) on each manufactured lot at +25˚C, Subgroup A9, and at +125˚C and −55˚C temperatures, Subgroups A10 and A11. Note 10:Not tested at +25˚C, +125˚C, and −55˚C temperature (design characterization data). FIGURE 1. Propagation Delay

FIGURE 2. AC Test Circuit for 15 pF Loading

FIGURE 3. AC Test Circuit for 50 pF Loading

Physical Dimensionsinches (millimeters) unless otherwise noted 24 Lead Ceramic Dual-In-Line Package (0.400" Wide) (D)

24 Lead Quad Cerpak (F)

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NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DE- VICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMI- CONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or sys- tems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose fail- ure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 2. A critical component in any component of a life support device or system whose failure to perform can be rea- sonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. National Semiconductor Corporation Americas Tel: 1-800-272-9959 Fax: 1-800-737-7018 Email: support@nsc.com www.national.com National Semiconductor Europe Fax: +49 (0) 1 80-530 85 86 Email: europe.support@nsc.com Deutsch Tel: +49 (0) 1 80-530 85 85 English Tel: +49 (0) 1 80-532 78 32 Français Tel: +49 (0) 1 80-532 93 58 Italiano Tel: +49 (0) 1 80-534 16 80 National Semiconductor Asia Pacific Customer Response Group Tel: 65-2544466 Fax: 65-2504466 Email: sea.support@nsc.com National Semiconductor Japan Ltd. Tel: 81-3-5620-6175 Fax: 81-3-5620-6179 National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.